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Institution Date Title Author
東海大學 2011 Trap barricading and decorating by a well-armored sit-and-wait predator: Extra protection or prey attraction? Tseng, H.-J., Cheng, R.-C., Wu, S.-H., Blamires, S.J., Tso, I.-M.
東海大學 2011 Trap barricading and decorating by a well-armored sit-and-wait predator: Extra protection or prey attraction? Tseng, H.-J.a, Cheng, R.-C.b, Wu, S.-H.a, Blamires, S.J.b , Tso, I.-M.a
東海大學 2011 Trap barricading and decorating by a well-armored sit-and-wait predator: Extra protection or prey attraction? Tseng, H.-J.a, Cheng, R.-C.b, Wu, S.-H.a, Blamires, S.J.b , Tso, I.-M.a
國立成功大學 2001-03 Trap concentration dependence on the electrical properties of annealed ultrathin fluorinated silicon oxides Chang, Wai-Jyh; Houng, Mau-Phon; Wang, Yeong-Her
元智大學 2002-09 Trap Impactor: A CFD Study 張幼珍; W.H. Wang
中華大學 2009 Trap Profile and Bias Temperature Instability of ALD-HfSiON Gate Stacks in Advanced MOSFETs 吳建宏; rossiwu
國立成功大學 2014-04 Trap properties of high-k/metal gate pMOSFETs with aluminum ion implantation by random telegraph noise and 1/f noise measurements Kao, Tsung-Hsien; Wu, San-Lein; Tsai, Kai-Shiang; Fang, Yean-Kuen; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Chang, Shoou-Jinn
國立成功大學 2016-04-25 Trap state passivation improved hot-carrier instability by zirconium-doping in hafnium oxide in a nanoscale n-metal-oxide semiconductor-field effect transistors with high-k/metal gate Liu, Hsi-Wen; Chang, Ting-Chang; Tsai, Jyun-Yu; Chen, Ching-En; Liu, Kuan-Ju; Lu, Ying-Hsin; Lin, Chien-Yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Ye, Yi-Han
國立交通大學 2017-04-21T06:55:22Z Trap state passivation improved hot-carrier instability by zirconium-doping in hafnium oxide in a nanoscale n-metal-oxide semiconductor-field effect transistors with high-k/metal gate Liu, Hsi-Wen; Chang, Ting-Chang; Tsai, Jyun-Yu; Chen, Ching-En; Liu, Kuan-Ju; Lu, Ying-Hsin; Lin, Chien-Yu; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Ye, Yi-Han
國立臺灣科技大學 2013 Trap state spectroscopy of LiMyMn2-yO4 (M = Mn, Ni, Co): Guiding principles for electrochemical performance Ragavendran, K.R.;Lu, L.;Hwang, B.J.;Barner, K.;Veluchamy, A.

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