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教育部委托研究计画 计画执行:国立台湾大学图书馆
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显示项目 306641-306650 / 2348971 (共234898页) << < 30660 30661 30662 30663 30664 30665 30666 30667 30668 30669 > >> 每页显示[10|25|50]项目
| 國立臺灣大學 |
2000-03 |
Defect Inspection and Analysis of Color Filter Panel
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Wu, M. H.; Chen, C. S.; Fuh, H. Y. |
| 元智大學 |
2009-12 |
Defect inspection in low-contrast LCD images using Hough transform-based non-stationary line detection
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李韋辰; 蔡篤銘 |
| 元智大學 |
2011-02 |
Defect inspection in low-contrast LCD images using Hough transform-based nonstationary line detection
|
Wei-Chen Li; Du-Ming Tsai |
| 元智大學 |
2018-05-20 |
Defect inspection of liquid-crystal-display (LCD) panels in repetitive pattern images using 2D Fourier image reconstruction
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Du-Ming Tsai; Morris Fan; Yan Hsin Tseng |
| 元智大學 |
2018-05-20 |
Defect Inspection of Liquid-Crystal-Display (LCD) Panels in Repetitive Pattern Images Using 2D Fourier Image Reconstruction
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Du-Ming Tsai; Yan-Hsin Tseng; S. K. Morris Fan |
| 元智大學 |
2004-12 |
Defect Inspection of Patterned TFT-LCD Panels Usinga Fast Sub-image Based SVD
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C.-J. Lu (呂奇傑); 蔡篤銘 |
| 元智大學 |
2004-10 |
Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
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C.-J. Lu(呂奇傑); 蔡篤銘 |
| 亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
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劉曉薇;Hsiao-Wei,Liu;陳思翰;Ssu-Han,Chen*;彭德保;Der-Baau,Perng; |
| 亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
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劉曉薇;Liu, Hsiao-Wei;陳思翰;Chen, Ssu-Han;*;彭德保;Perng, Der-Baau |
| 亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
|
Perng;, 劉曉薇;Hsiao-Wei Liu;陳思翰;Ssu-Han Chen;*;彭德保;Der-Baau |
Showing items 306641-306650 of 2348971 (234898 Page(s) Totally) << < 30660 30661 30662 30663 30664 30665 30666 30667 30668 30669 > >> View [10|25|50] records per page
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