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显示项目 470156-470165 / 2348971 (共234898页)
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| 臺大學術典藏 |
2020-03-06T08:25:37Z |
High α-fetoprotein level correlates with high stage, early recurrence and poor prognosis of hepatocellular carcinoma: Significance of hepatitis virus infection, age, p53 and β-catenin mutations
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Hsu H.-C.; Lai P.-L.; YUNG-MING JENG; Sheu J.-C.; Chen W.J.; Peng S.-Y.; Peng S.-Y.;Chen W.J.;Lai P.-L.;Yung-Ming Jeng;Sheu J.-C.;Hsu H.-C. |
| 臺大學術典藏 |
2022-05-05T05:16:29Z |
High α-fetoprotein level correlates with high stage, early recurrence and poor prognosis of hepatocellular carcinoma: Significance of hepatitis virus infection, age, p53 and β-catenin mutations
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Peng S.-Y.; WEI J. CHEN; Lai P.-L.; Jeng Y.-M.; Sheu J.-C.; Hsu H.-C. |
| 國立成功大學 |
2024-12 |
High κ and large positive τf in the low temperature sintering BaNb2V2O11 ceramics
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Wu;Chia-Chien;Huang;Cheng-Liang |
| 臺大學術典藏 |
2021-04-21T23:30:16Z |
High κ Gate Dielectrics for Compound Semiconductors
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Kwo, J.; Hong, M. |
| 臺大學術典藏 |
2019-03-11T08:01:10Z |
High κ/InGaAs for ultimate CMOS - Interfacial passivation, low ohmic contacts, and device performance (Invited)
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Hong, M.;Kwo, J.;Pi, T.W.;Lin, T.D.;Chang, W.H.;Liao, M.H.; Chang, W.H.; Lin, T.D.; Liao, M.H.; Pi, T.W.; Kwo, J.; Hong, M. |
| 真理大學 |
2003-11 |
High – Density Burst Error Correcting Linear Codes
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Luigia Berardi; Bal Kishan Dass; Gangmei Sobha |
| 臺大學術典藏 |
2019-12-27T07:49:38Z |
High 庥 dielectric single-crystal monoclinic Gd2O3 on GaN with excellent thermal, structural, and electrical properties
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Chang, W.H.;Lee, C.H.;Chang, P.;Chang, Y.C.;Lee, Y.J.;Kwo, J.;Tsai, C.C.;Hong, J.M.;Hsu, C.-H.;Hong, M.; Chang, W.H.; Lee, C.H.; Chang, P.; Chang, Y.C.; Lee, Y.J.; Kwo, J.; Tsai, C.C.; Hong, J.M.; Hsu, C.-H.; Hong, M.; MINGHWEI HONG |
| 臺大學術典藏 |
2019-12-27T07:49:20Z |
High 庥/InGaAs for ultimate CMOS - Interfacial passivation, low ohmic contacts, and device performance (Invited)
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Chang, W.H.;Lin, T.D.;Liao, M.H.;Pi, T.W.;Kwo, J.;Hong, M.; Chang, W.H.; Lin, T.D.; Liao, M.H.; Pi, T.W.; Kwo, J.; Hong, M.; MINGHWEI HONG |
| 臺大學術典藏 |
2021-08-05T02:40:55Z |
High- K Gate Dielectrics Treated with in Situ Atomic Layer Bombardment
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Chang T.-J;Lee W.-H;Wang C.-I;Yi S.-H;Yin Y.-T;Lin H.-C;Chen M.-J.; Chang T.-J; Lee W.-H; Wang C.-I; Yi S.-H; Yin Y.-T; Lin H.-C; Chen M.-J.; HSIN-CHIH LIN |
| 臺大學術典藏 |
2021-08-05T02:41:02Z |
High- K Gate Dielectrics Treated with in Situ Atomic Layer Bombardment
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Chang T.-J;Lee W.-H;Wang C.-I;Yi S.-H;Yin Y.-T;Lin H.-C;Chen M.-J.; Chang T.-J; Lee W.-H; Wang C.-I; Yi S.-H; Yin Y.-T; Lin H.-C; Chen M.-J.; MIIN-JANG CHEN |
显示项目 470156-470165 / 2348971 (共234898页)
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每页显示[10|25|50]项目
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