| 國立臺灣大學 |
1979 |
Test of Fundamental Symmetries in the A=12 Nuclei
|
黃偉彥; Hwang, Woei-Yann Pauchy |
| 臺大學術典藏 |
2022-04-25T06:33:31Z |
Test of lepton flavor universality and search for lepton flavor violation in B → K?? decays
|
Choudhury S;Sandilya S;Trabelsi K;Giri A;Aihara H;Al Said S;Asner D.M;Atmacan H;Aulchenko V;Aushev T;Ayad R;Babu V;Bahinipati S;Behera P;Bele?o C;Belous K;Bennett J;Bernlochner F;Bessner M;Bhardwaj V;Bilka T;Biswal J;Bonvicini G;Bozek A;Bra?ko M;Browder T.E;Campajola M;?ervenkov D;Chang M.-C;Chang P;Chekelian V;Chen A;Cheon B.G;Chilikin K;Cho K;Choi S.-K;Choi Y;Cinabro D;Cunliffe S;Dash N;De Nardo G;Dhamija R;Di Capua F;Dingfelder J;Dole?al Z;Dong T.V;Dossett D;Dubey S;Eidelman S;Epifanov D;Ferber T;Ferlewicz D;Fulsom B.G;Garg R;Gaur V;Gabyshev N;Garmash A;Goldenzweig P;Golob B;Greenwald D;Hadjivasiliou C;Hartbrich O;Hayashii H;Hedges M.T;Hernandez Villanueva M;Higuchi T;Hou W.-S;Hsu C.-L;Iijima T;Inami K;Ishikawa A;Itoh R;Iwasaki M;Iwasaki Y;Jacobs W.W;Jang E.-J;Jeon H.B;Jia S;Jin Y;Joo C.W;Joo K.K;Kahn J;Kaliyar A.B;Kang K.H;Karyan G;Kichimi H;Kiesling C;Kim B.H;Kim D.Y;Kim K.-H;Kim K.T;Kim S.H;Kim Y.-K;Kinoshita K;Kody? P;Korpar S;Kotchetkov D;Kri?an P;Kroeger R;Krokovny P;Kuhr T;Kulasiri R;Kumar R;Kumara K;Kuzmin A;Kwon Y.-J;Lalwani K;Lee S.C;Lewis P;Li C.H;Li L.K;Li Y.B;Li Gioi L;Libby J;Lieret K;Liptak Z;Liventsev D;Luo T;Masuda M;Matsuda T;Matvienko D;Merola M;Miyabayashi K;Mizuk R;Mohanty G.B;Mohanty S;Moon T.J;Mori T;Nakamura I;Nakamura K.R;Nakao M;Natkaniec Z;Natochii A;Nayak L;Nayak M;Niiyama M;Nisar N.K;Nishida S;Ogawa K;Ono H;Onuki Y;Oskin P;Pakhlov P;Pakhlova G;Pardi S;Park H;Park S.-H;Patra S;Paul S;Pedlar T.K;Pestotnik R;Piilonen L.E;Podobnik T;Popov V;Prencipe E;Prim M.T;Rabusov A;Rostomyan A;Rout N;Rozanska M;Russo G;Sahoo D;Sakai Y;Santelj L;Sanuki T;Savinov V;Schnell G;Schueler J;Schwanda C;Schwartz A.J;Seino Y;Senyo K;Sevior M.E;Shapkin M;Shebalin V;Shiu J.-G;Shwartz B;Simon F;Sokolov A;Solovieva E;Stani? S;Stari? M;Stottler Z.S;Sumiyoshi T;Sutcliffe W;Takizawa M;Tamponi U;Tanida K;Tenchini F;Uchida M;Uehara S;Uglov T;Unno Y;Uno S;Urquijo P;Ushiroda Y;Van Tonder R;Varner G;Varvell K.E;Vinokurova A;Vorobyev V;Waheed E;Wang C.H;Wang E;Wang M.-Z;Wang P;Watanabe M;Watanuki S;Wehle S;Wiechczynski J;Won E;Xu X;Yabsley B.D;Yan W;Yang S.B;Ye H;Yelton J;Yin J.H;Yuan C.Z;Yusa Y;Zhang Z.P;Zhilich V;Zhukova V;The BELLE collaboration; Choudhury S; WEI-SHU HOU et al. |
| 臺大學術典藏 |
2022-04-25T06:31:27Z |
Test of lepton flavor universality and search for lepton flavor violation in B → K?? decays
|
Choudhury S;Sandilya S;Trabelsi K;Giri A;Aihara H;Al Said S;Asner D.M;Atmacan H;Aulchenko V;Aushev T;Ayad R;Babu V;Bahinipati S;Behera P;Bele?o C;Belous K;Bennett J;Bernlochner F;Bessner M;Bhardwaj V;Bilka T;Biswal J;Bonvicini G;Bozek A;Bra?ko M;Browder T.E;Campajola M;?ervenkov D;Chang M.-C;Chang P;Chekelian V;Chen A;Cheon B.G;Chilikin K;Cho K;Choi S.-K;Choi Y;Cinabro D;Cunliffe S;Dash N;De Nardo G;Dhamija R;Di Capua F;Dingfelder J;Dole?al Z;Dong T.V;Dossett D;Dubey S;Eidelman S;Epifanov D;Ferber T;Ferlewicz D;Fulsom B.G;Garg R;Gaur V;Gabyshev N;Garmash A;Goldenzweig P;Golob B;Greenwald D;Hadjivasiliou C;Hartbrich O;Hayashii H;Hedges M.T;Hernandez Villanueva M;Higuchi T;Hou W.-S;Hsu C.-L;Iijima T;Inami K;Ishikawa A;Itoh R;Iwasaki M;Iwasaki Y;Jacobs W.W;Jang E.-J;Jeon H.B;Jia S;Jin Y;Joo C.W;Joo K.K;Kahn J;Kaliyar A.B;Kang K.H;Karyan G;Kichimi H;Kiesling C;Kim B.H;Kim D.Y;Kim K.-H;Kim K.T;Kim S.H;Kim Y.-K;Kinoshita K;Kody? P;Korpar S;Kotchetkov D;Kri?an P;Kroeger R;Krokovny P;Kuhr T;Kulasiri R;Kumar R;Kumara K;Kuzmin A;Kwon Y.-J;Lalwani K;Lee S.C;Lewis P;Li C.H;Li L.K;Li Y.B;Li Gioi L;Libby J;Lieret K;Liptak Z;Liventsev D;Luo T;Masuda M;Matsuda T;Matvienko D;Merola M;Miyabayashi K;Mizuk R;Mohanty G.B;Mohanty S;Moon T.J;Mori T;Nakamura I;Nakamura K.R;Nakao M;Natkaniec Z;Natochii A;Nayak L;Nayak M;Niiyama M;Nisar N.K;Nishida S;Ogawa K;Ono H;Onuki Y;Oskin P;Pakhlov P;Pakhlova G;Pardi S;Park H;Park S.-H;Patra S;Paul S;Pedlar T.K;Pestotnik R;Piilonen L.E;Podobnik T;Popov V;Prencipe E;Prim M.T;Rabusov A;Rostomyan A;Rout N;Rozanska M;Russo G;Sahoo D;Sakai Y;Santelj L;Sanuki T;Savinov V;Schnell G;Schueler J;Schwanda C;Schwartz A.J;Seino Y;Senyo K;Sevior M.E;Shapkin M;Shebalin V;Shiu J.-G;Shwartz B;Simon F;Sokolov A;Solovieva E;Stani? S;Stari? M;Stottler Z.S;Sumiyoshi T;Sutcliffe W;Takizawa M;Tamponi U;Tanida K;Tenchini F;Uchida M;Uehara S;Uglov T;Unno Y;Uno S;Urquijo P;Ushiroda Y;Van Tonder R;Varner G;Varvell K.E;Vinokurova A;Vorobyev V;Waheed E;Wang C.H;Wang E;Wang M.-Z;Wang P;Watanabe M;Watanuki S;Wehle S;Wiechczynski J;Won E;Xu X;Yabsley B.D;Yan W;Yang S.B;Ye H;Yelton J;Yin J.H;Yuan C.Z;Yusa Y;Zhang Z.P;Zhilich V;Zhukova V;The BELLE collaboration; Choudhury S; PAO-TI CHANG et al. |
| 臺大學術典藏 |
2022-04-25T06:33:19Z |
Test of Lepton-Flavor Universality in B →k??+?- Decays at Belle
|
Wehle S;Adachi I;Adamczyk K;Aihara H;Asner D.M;Atmacan H;Aulchenko V;Aushev T;Ayad R;Babu V;Behera P;Berger M;Bhardwaj V;Biswal J;Bozek A;Bra?ko M;Browder T.E;Campajola M;Cao L;Chang M.-C;Chen A;Cheon B.G;Chilikin K;Cho K;Choi Y;Choudhury S;Cinabro D;Cunliffe S;Dash N;De Nardo G;Di Capua F;Dubey S;Eidelman S;Epifanov D;Ferber T;Fulsom B.G;Garg R;Gaur V;Gabyshev N;Garmash A;Giri A;Goldenzweig P;Greenwald D;Guan Y;Haba J;Hartbrich O;Hayasaka K;Hayashii H;Hedges M.T;Higuchi T;Hou W.-S;Hsu C.-L;Iijima T;Inami K;Inguglia G;Ishikawa A;Itoh R;Iwasaki M;Iwasaki Y;Jacobs W.W;Jia S;Jin Y;Joffe D;Kahn J;Kaliyar A.B;Karyan G;Kichimi H;Kim D.Y;Kim K.T;Kim S.H;Kim Y.-K;Kinoshita K;Komarov I;Korpar S;Kotchetkov D;Kroeger R;Krokovny P;Kuhr T;Kulasiri R;Kumar R;Kumara K;Kuzmin A;Kwon Y.-J;Lange J.S;Lee J.Y;Lee S.C;Li Y.B;Libby J;Liptak Z;Liventsev D;Luo T;Macnaughton J;Masuda M;Matsuda T;McNeil J.T;Merola M;Metzner F;Miyata H;Mizuk R;Mohanty G.B;Moon T.J;Mussa R;Nakao M;Natochii A;Nayak M;Niebuhr C;Niiyama M;Nisar N.K;Nishida S;Ogawa K;Ogawa S;Ono H;Onuki Y;Pakhlov P;Pakhlova G;Park H;Park S.-H;Pedlar T.K;Pestotnik R;Piilonen L.E;Podobnik T;Popov V;Prencipe E;Prim M.T;Resmi P.K;Ritter M;Rostomyan A;Rout N;Russo G;Sahoo D;Sakai Y;Sandilya S;Sangal A;Santelj L;Savinov V;Schneider O;Schnell G;Schueler J;Schwanda C;Schwartz A.J;Seino Y;Senyo K;Sevior M.E;Shapkin M;Shiu J.-G;Shwartz B;Solovieva E;Stari? M;Strube J.F;Sumiyoshi T;Sutcliffe W;Takizawa M;Tamponi U;Tanida K;Tao Y;Tenchini F;Trabelsi K;Uchida M;Uglov T;Unno Y;Uno S;Ushiroda Y;Vahsen S.E;Van Tonder R;Varner G;Varvell K.E;Vorobyev V;Wang C.H;Wang M.-Z;Wang P;Wang X.L;Won E;Xu X;Yang S.B;Ye H;Yin J.H;Yuan C.Z;Zhang Z.P;Zhilich V;Zhukova V;Zhulanov V;(Belle Collaboration); Wehle S; WEI-SHU HOU et al. |
| 中原大學 |
2008-11 |
Test of Proficiency---Huayu : A Language Proficiency Test Based on the ACTFL Proficiency Guidelines and the CEFR
|
Huang, Li-Yi |
| 中原大學 |
2008-11 |
Test of Proficiency---Huayu : A Language Proficiency Test Based on the ACTFL Proficiency Guidelines and the CEFR
|
Huang, Li-Yi |
| 嘉南藥理大學 |
2009-05-22 |
Test of reducing power of nano zero-valent iron particles using nitrate as a chemical probe
|
Visanu Tanboonchuy; Jia-Chin Hsu; Nurak Grisdanurak; Chih-Hsiang Liao; Yu-Lun Wei |
| 臺北醫學大學 |
1994 |
Test of Rice Varieties and Selections for Resistance to Blast in Uniform Blast Nurseries
|
黃杉？;陳隆澤;黃振增;張義璋;邱明德;莊商路;鄭明欽;鄭清煥;林芳洲;江瑞拱;張素貞;吳文政;林金樹;劉瑋婷;陳一心 |
| 育達商業科技大學 |
2008 |
Test of Simulated Pseudolite Measurements Applied to GPS and Multi-pseudolite Integrated Positioning
|
樓,壁卿;張,嘉強 |
| 實踐大學 |
2006 |
Test of the contrarian investment strategy-evidence from the Taiwan stock markets
|
Yang, H.L.;Yang, G.G.L.;Su, S.H. |
| 國立臺灣海洋大學 |
2007 |
Test of the performance of age-structured model for striped marlin in the North Pacific
|
Wang S. P.;C. L. Sun;S. Z. Yeh;G. DiNardo;W. C. Chiang;S. K. Chang |
| 國立交通大學 |
2019-04-03T06:37:13Z |
Test of the Practicality and Feasibility of EDoF-Empowered Image Sensors for Long-Range Biometrics
|
Hsieh, Sheng-Hsun; Li, Yung-Hui; Tien, Chung-Hao |
| 國立成功大學 |
1993 |
Test of tokamak low-mode-high-mode transition theory in stellarators
|
Shaing, Ker-Chung |
| 臺大學術典藏 |
2009-01-21T09:51:58Z |
Test of Watershed Acidification Model Responses to Rainfall Intensity
|
Chang, Fi-John; Chang, Fi-John; 張斐章 |
| 國立臺灣大學 |
1996 |
Test of Watershed Acidification Model Responses to Rainfall Intensity
|
張斐章; Chang, Fi-John |
| 國立臺灣大學 |
1982-04 |
Test on Non-shrinking Grout for Bedding Seam Treatment
|
高健章; Kao, C. C. |
| 國立臺灣大學 |
1986-12 |
Test Particle Modeling of Wave-Induced Energetic Electron Precipitation
|
張宏鈞; Inan, U. S.; Chang, Hung-Chun; Inan, U. S. |
| 臺大學術典藏 |
2020-06-29T01:20:11Z |
Test Pattern Compression for Probabilistic Circuits.
|
Chang, Chih-Ming;Yang, Kai-Jie;Li, James Chien-Mo;Chen, Hung; Chang, Chih-Ming; Yang, Kai-Jie; Li, James Chien-Mo; Chen, Hung; CHIEN-MO LI |
| 國立成功大學 |
2003-03 |
Test pattern generation and clock disabling for simultaneous test time and power reduction
|
Chen, Jih-Jeen; Yang, Chia-Kai; Lee, Kuen-Jong |
| 臺大學術典藏 |
2018-09-10T09:50:54Z |
Test Pattern Modification for Average IR-drop Reduction
|
WS Ding;HY Hsieh;JCM Li; WS Ding; HY Hsieh; JCM Li; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:14Z |
Test Pattern Modification for Average IR-Drop Reduction
|
Ding, W.-S.;Hsieh, H.-Y.;Han, C.-Y.;Li, J.C.-M.;Wen, X.; Ding, W.-S.; Hsieh, H.-Y.; Han, C.-Y.; Li, J.C.-M.; Wen, X.; CHIEN-MO LI |
| 東海大學 |
2003-06-23 |
Test Plan Design for Software Configuration Testing
|
Xu, B., Nie, C., Shi, L., Chu, W.C., Yang, H., Chen, H. |
| 臺大學術典藏 |
2020-06-04T07:48:51Z |
Test Plan Generation for Concurrent Real-Time Systems Based on Zone Coverage Analysis.
|
Wang, Farn;Huang, Geng-Dian; Wang, Farn; Huang, Geng-Dian; FARN WANG |
| 元智大學 |
2020/8/4 |
Test Power Reduction by Partially Specified Dual-LFSR Reseeding
|
陳勇志; Yi-An Chen; Wang-Dauh Tseng |
| 中國文化大學 |
1989-07 |
Test Praticle in a 2D Magnetized Plasma--Theory and Simulation
|
黃信健 |
| 臺大學術典藏 |
2022-03-22T15:04:55Z |
Test Problem in Which Bits Used for Fitness Calculation Depend on Bit Pattern
|
Ohnishi, Kei; Koga, Daiki; TIAN-LI YU |
| 國立臺灣大學 |
1984 |
Test Procedure Validation for the TLC Assay of a Degredation Product in a Pharmaceutical Formulation
|
孫紹文; Maillols, H.; Sun, Shao-Wen; Maillols, H. |
| 元智大學 |
2006 |
test proceeding
|
Hoder Lee |
| 國立高雄應用科技大學 |
1996-12 |
Test Process with Recommended Minimum Value of Cpm
|
Lu, Kuen-Horng |
| 國立臺灣大學 |
1992-11 |
Test Reduction in Scan-Designed Circuits
|
Lai, W.; Kung, C.; 林呈祥; Lai, W.; Kung, C.; Lin, Chen-Shang |
| 臺大學術典藏 |
2009-01 |
Test Response Compaction in the Presence of Many Unknowns
|
Laung-Terng Wang; CHIEN-MO LI; Amy Rao; Yi-Chih Sung; James C.-M. Lim; Wei-Che Wang; Wei-Che Wang;James C.-M. Lim;Yi-Chih Sung;Amy Rao;Laung-Terng Wang |
| 國立成功大學 |
2011-10 |
Test Response Compaction via Output Bit Selection
|
Lee, Kuen-Jong; Lien, Wei-Cheng; Hsieh, Tong-Yu |
| 國立臺灣科技大學 |
2004 |
Test results of three excitation systems for generators suffering continuous voltage flicker disturbance
|
Cheng-Ping Huang;Chi-Jui Wu;Yung-Sung Chuang |
| 國立臺灣大學 |
2004-11 |
Test results of three excitation systems for generators suffering continuous voltage flicker disturbance
|
Huang, Cheng-Ping; Wu, Chi-Jui; Chuang, Yung-Sung |
| 臺大學術典藏 |
2019-07-09T03:52:45Z |
Test sensitivity of mammography and mean sojourn time over 40 years of breast cancer screening in Nijmegen (The Netherlands)
|
Aarts A.M.W.M.; Duffy S.W.; Geurts S.M.E.; Vulkan D.P.; Otten J.D.M.; Hsu C.-Y.; HSIU-HSI CHEN; Verbeek A.L.M.; Broeders M.J.M.; Aarts A.M.W.M.;Duffy S.W.;Geurts S.M.E.;Vulkan D.P.;Otten J.D.M.;Hsu C.-Y.;Hsiu-Hsi Chen;Verbeek A.L.M.;Broeders M.J.M. |
| 臺大學術典藏 |
2022-04-21T06:50:25Z |
Test sensitivity of mammography and mean sojourn time over 40 years of breast cancer screening in Nijmegen (The Netherlands)
|
Aarts A.M.W.M.; Duffy S.W.; Geurts S.M.E.; Vulkan D.P.; Otten J.D.M.; Hsu C.-Y.; Chen, Tony Hsiu Hsi; Verbeek A.L.M.; Broeders M.J.M. |
| 淡江大學 |
1986-08 |
Test sequence generator
|
Ou, Hsien-chang ; Fang, Wu-shiung ; 廖賀田; Liaw, Heh-tyan |
| 國立臺灣大學 |
1986-08 |
Test Sequence Generator
|
Ou, H. C.; 馮武雄; Liaw, H. T.; Ou, H. C.; Feng, Wu-Shiung; Liaw, H. T. |
| 淡江大學 |
1995-11-01 |
Test set compaction for combinational circuits
|
張昭憲; Chang, Jau-shien; Lin, Chen-shang |
| 淡江大學 |
1992-11-26 |
Test set compaction for combinational circuits
|
張昭憲; Chang, Jau-shien; 林呈祥; Lin, Chen-shang |
| 國立臺灣大學 |
1992-11 |
Test set compaction for combinational circuits
|
Chang, Jau-Shien; Lin, Chen-Shang |
| 國立臺灣大學 |
1992-11 |
Test Set Compaction for Combinational Circuits
|
Chang, J.; 林呈祥; Chang, J.; Lin, Chen-Shang |
| 淡江大學 |
2008-11-19 |
Test Slice Difference Technique for Low Power Testing
|
饒建奇 |
| 淡江大學 |
2012-06 |
Test Slice Difference Technique for Low-Transition Test Data Compression
|
饒建奇; 吳柏翰; 李威霖 |
| 淡江大學 |
2012-06 |
Test Slice Difference Technique for Low-Transition Test Data Compression
|
Rau, Jiann-Chyi; Wu, Po-Han; Li, Wei-Lin |
| 國立成功大學 |
2017-01 |
Test Stimulus Compression Based on Broadcast Scan With One Single Input
|
Chen;Jhen-Zong;Lee;Kuen-Jong |
| 國立交通大學 |
2014-12-08T15:26:13Z |
Test structure and verification on the MOSFET under bond pad for area-efficient I/O layout in high-pin-count SOCIC's
|
Ker, MD; Peng, JJ; Jiang, HC |
| 國立交通大學 |
2014-12-08T15:09:20Z |
Test structure on SCR device in waffle layout for RE ESD protection
|
Ker, Ming-Dou; Lin, Chun-Yu |
| 國立交通大學 |
2014-12-08T15:25:49Z |
Test structures to verify ESD robustness of on-glass devices in UPS technology
|
Ker, MD; Deng, CK; Yang, SC; Tasi, YM |
| 國立臺灣科技大學 |
1997 |
Test Taiwan's High Home Ownership Rates in the 1980's
|
Wu, Couchen;Hsiu-Li Chen |
