| 臺大學術典藏 |
2018-09-10T09:50:54Z |
Test Pattern Modification for Average IR-drop Reduction
|
WS Ding;HY Hsieh;JCM Li; WS Ding; HY Hsieh; JCM Li; CHIEN-MO LI |
| 東海大學 |
2003-06-23 |
Test Plan Design for Software Configuration Testing
|
Xu, B., Nie, C., Shi, L., Chu, W.C., Yang, H., Chen, H. |
| 臺大學術典藏 |
2020-06-04T07:48:51Z |
Test Plan Generation for Concurrent Real-Time Systems Based on Zone Coverage Analysis.
|
Wang, Farn;Huang, Geng-Dian; Wang, Farn; Huang, Geng-Dian; FARN WANG |
| 元智大學 |
2020/8/4 |
Test Power Reduction by Partially Specified Dual-LFSR Reseeding
|
陳勇志; Yi-An Chen; Wang-Dauh Tseng |
| 中國文化大學 |
1989-07 |
Test Praticle in a 2D Magnetized Plasma--Theory and Simulation
|
黃信健 |
| 臺大學術典藏 |
2022-03-22T15:04:55Z |
Test Problem in Which Bits Used for Fitness Calculation Depend on Bit Pattern
|
Ohnishi, Kei; Koga, Daiki; TIAN-LI YU |
| 國立臺灣大學 |
1984 |
Test Procedure Validation for the TLC Assay of a Degredation Product in a Pharmaceutical Formulation
|
孫紹文; Maillols, H.; Sun, Shao-Wen; Maillols, H. |
| 元智大學 |
2006 |
test proceeding
|
Hoder Lee |
| 國立高雄應用科技大學 |
1996-12 |
Test Process with Recommended Minimum Value of Cpm
|
Lu, Kuen-Horng |
| 國立臺灣大學 |
1992-11 |
Test Reduction in Scan-Designed Circuits
|
Lai, W.; Kung, C.; 林呈祥; Lai, W.; Kung, C.; Lin, Chen-Shang |
| 臺大學術典藏 |
2009-01 |
Test Response Compaction in the Presence of Many Unknowns
|
Laung-Terng Wang; CHIEN-MO LI; Amy Rao; Yi-Chih Sung; James C.-M. Lim; Wei-Che Wang; Wei-Che Wang;James C.-M. Lim;Yi-Chih Sung;Amy Rao;Laung-Terng Wang |
| 國立成功大學 |
2011-10 |
Test Response Compaction via Output Bit Selection
|
Lee, Kuen-Jong; Lien, Wei-Cheng; Hsieh, Tong-Yu |
| 國立臺灣科技大學 |
2004 |
Test results of three excitation systems for generators suffering continuous voltage flicker disturbance
|
Cheng-Ping Huang;Chi-Jui Wu;Yung-Sung Chuang |
| 國立臺灣大學 |
2004-11 |
Test results of three excitation systems for generators suffering continuous voltage flicker disturbance
|
Huang, Cheng-Ping; Wu, Chi-Jui; Chuang, Yung-Sung |
| 臺大學術典藏 |
2019-07-09T03:52:45Z |
Test sensitivity of mammography and mean sojourn time over 40 years of breast cancer screening in Nijmegen (The Netherlands)
|
Aarts A.M.W.M.; Duffy S.W.; Geurts S.M.E.; Vulkan D.P.; Otten J.D.M.; Hsu C.-Y.; HSIU-HSI CHEN; Verbeek A.L.M.; Broeders M.J.M.; Aarts A.M.W.M.;Duffy S.W.;Geurts S.M.E.;Vulkan D.P.;Otten J.D.M.;Hsu C.-Y.;Hsiu-Hsi Chen;Verbeek A.L.M.;Broeders M.J.M. |
| 臺大學術典藏 |
2022-04-21T06:50:25Z |
Test sensitivity of mammography and mean sojourn time over 40 years of breast cancer screening in Nijmegen (The Netherlands)
|
Aarts A.M.W.M.; Duffy S.W.; Geurts S.M.E.; Vulkan D.P.; Otten J.D.M.; Hsu C.-Y.; Chen, Tony Hsiu Hsi; Verbeek A.L.M.; Broeders M.J.M. |
| 淡江大學 |
1986-08 |
Test sequence generator
|
Ou, Hsien-chang ; Fang, Wu-shiung ; 廖賀田; Liaw, Heh-tyan |
| 國立臺灣大學 |
1986-08 |
Test Sequence Generator
|
Ou, H. C.; 馮武雄; Liaw, H. T.; Ou, H. C.; Feng, Wu-Shiung; Liaw, H. T. |
| 淡江大學 |
1995-11-01 |
Test set compaction for combinational circuits
|
張昭憲; Chang, Jau-shien; Lin, Chen-shang |
| 淡江大學 |
1992-11-26 |
Test set compaction for combinational circuits
|
張昭憲; Chang, Jau-shien; 林呈祥; Lin, Chen-shang |
| 國立臺灣大學 |
1992-11 |
Test set compaction for combinational circuits
|
Chang, Jau-Shien; Lin, Chen-Shang |
| 國立臺灣大學 |
1992-11 |
Test Set Compaction for Combinational Circuits
|
Chang, J.; 林呈祥; Chang, J.; Lin, Chen-Shang |
| 淡江大學 |
2008-11-19 |
Test Slice Difference Technique for Low Power Testing
|
饒建奇 |
| 淡江大學 |
2012-06 |
Test Slice Difference Technique for Low-Transition Test Data Compression
|
饒建奇; 吳柏翰; 李威霖 |
| 淡江大學 |
2012-06 |
Test Slice Difference Technique for Low-Transition Test Data Compression
|
Rau, Jiann-Chyi; Wu, Po-Han; Li, Wei-Lin |
| 國立成功大學 |
2017-01 |
Test Stimulus Compression Based on Broadcast Scan With One Single Input
|
Chen;Jhen-Zong;Lee;Kuen-Jong |
| 國立交通大學 |
2014-12-08T15:26:13Z |
Test structure and verification on the MOSFET under bond pad for area-efficient I/O layout in high-pin-count SOCIC's
|
Ker, MD; Peng, JJ; Jiang, HC |
| 國立交通大學 |
2014-12-08T15:09:20Z |
Test structure on SCR device in waffle layout for RE ESD protection
|
Ker, Ming-Dou; Lin, Chun-Yu |
| 國立交通大學 |
2014-12-08T15:25:49Z |
Test structures to verify ESD robustness of on-glass devices in UPS technology
|
Ker, MD; Deng, CK; Yang, SC; Tasi, YM |
| 國立臺灣科技大學 |
1997 |
Test Taiwan's High Home Ownership Rates in the 1980's
|
Wu, Couchen;Hsiu-Li Chen |
| 臺大學術典藏 |
2019-12-10T03:24:45Z |
test test test
|
CHIEN-JU CHIANG |
| 臺北醫學大學 |
2007 |
Test the different surrounding situation of post by resonance frequency.
|
黃豪銘; Chang KZ; Lin CT; Chang WJ; Huang HM |
| 淡江大學 |
1995-01-01 |
Test time reduction for scan-designed circuits by sliding compatibility
|
張昭憲; Chang, Jau-shien; Lin, Chen-shang |
| 淡江大學 |
1994-11-16 |
Test time reduction for scan-designed circuits by sliding compatibility
|
張昭憲; Chang, Jau-shien; 林呈祥; Lin, Chen-shang |
| 國立臺灣大學 |
1994-11 |
Test time reduction for scan-designed circuits by sliding compatibility
|
Chang, Jau-Shien; Lin, Chen-Shang |
| 國立臺灣大學 |
1995-01 |
Test time reduction for scan-designed circuits by sliding compatibility
|
Chang, J.-S.; Lin, C.-S. |
| 國立臺灣大學 |
1994 |
Test Time Reduction for Scan-Designed Circuits by Sliding Compatibility
|
Chang, J. S.; 林呈祥; Chang, J. S.; Lin, Chen-Shang |
| 國立臺灣大學 |
1993-02 |
Test time reduction in scan designed circuits
|
Lai, Wen-Joung; Kung, Chen-Pin; Lin, Chen-Shang |
| 國立臺灣大學 |
1993 |
Test Time Reduction in Scan Designed Circuits
|
Lai, W.; Kung, C.; 林呈祥; Lai, W.; Kung, C.; Lin, Chen-Shang |
| 東海大學 |
2003 |
Test Web applications based on Agent
|
Xu, L., Xu, B.-W., Chen, H.-W., Chu, W., Lin, J.-M., Yang, H.-J. |
| 臺大學術典藏 |
2021-05-20T01:39:35Z |
Test, trace, and isolate in the UK
|
Cheng H.-Y.;Cohen T.;Hsien-Ho Lin; Cheng H.-Y.; Cohen T.; HSIEN-HO LIN |
| 臺大學術典藏 |
2022-04-20T08:55:01Z |
Test, trace, and isolate in the UK
|
Cheng H.-Y.; Cohen T.; HSIEN-HO LIN |
| 臺大學術典藏 |
2018-09-10T08:47:24Z |
Test-Clock Domain Optimization for Peak Power-Supply Noise Reduction During Scan
|
R.Y. Wen; Y.C. Huang; M.H. Tsai; K.Y. Liao; J. C.-M. Li; M.-T. Chang; M.-H. Tsai; C.-M. Tseng; H.-C. Li; CHIEN-MO LI |
| 國立臺灣海洋大學 |
2018 |
Test-Oriented RESTful Service Discovery with Semantic Interface Compatibility
|
Shang-Pin Ma;Ying-Jen Chen;Yang Syu;Hsuan-Ju Lin;Yong-Yi FanJiang |
| 國立臺灣大學 |
2009 |
Test-Re-Test Reliability of Two Sustained Attention Tests in Persons with Chronic Stroke
|
陳惠君; 古佳苓; 謝清麟; 薛漪平; CHEN, HUI-CHUN; KOH, CHIA-LIN; HSIEH, CHING-LIN; HUSEH, I-PING |
| 臺大學術典藏 |
2018-09-10T07:26:07Z |
Test-re-test reliability of two sustained attention tests in persons with chronic stroke
|
Chen, H.-C. and Koh, C.-L. and Hsieh, C.-L. and Hsueh, I.-P.; I-PING HSUEH; CHING-LIN HSIEH |
| 臺大學術典藏 |
2020-04-08T07:35:04Z |
Test-re-test reliability of two sustained attention tests in persons with chronic stroke
|
Chen H.-C.; Koh C.-L.; CHING-LIN HSIEH; Hsueh I.-P. |
| 臺大學術典藏 |
2021-01-26T02:55:14Z |
Test-retest and inter-rater reliability for the Comprehensive Developmental Inventory for Infants and Toddlers diagnostic and screening tests
|
Liao H.-F.; YI-LING PAN |
| 國立臺灣大學 |
2005-07 |
Test-retest and Inter-rater Reliability for the Comprehensive Developmental Inventory for Infants and Toddlers Diagnostic and Screening Tests.
|
Liao, HF; Pan, YL |
| 義守大學 |
2017-01 |
Test-retest reliabilities and minimal detectable change of two simplified 3-level balance measures in patients with stroke
|
Yi M. CHEN;Yi J. HUANG;Chien Y. HUANG;Gong H. LIN;Lih J. LIAW;Shih C. LEE;Ching L. HSIEH |
