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總筆數 :2856565
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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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顯示項目 295656-295665 / 2348971 (共234898頁)
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| 國立交通大學 |
2014-12-08T15:12:40Z |
Cross-sectional transmission electron microscopy observations of structural damage in Al(0.16)Ga(0.84)N thin film under contact loading
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Jian, Sheng-Rui; Juang, Jenh-Yih; Lai, Yi-Shao |
| 義守大學 |
2008-02 |
Cross-sectional transmission electron microscopy observations of structural damage in Al0.16Ga0.84N thin film under contact loading
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Jian SR; Juang JY; Lai YS |
| 國立交通大學 |
2014-12-08T15:13:40Z |
Cross-sectional transmission electron microscopy observations on the Berkovich indentation-induced deformation microstructures in GaN thin films
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Chien, Chi-Hui; Jian, Sheng-Rui; Wang, Chung-Ting; Juang, Jenh-Yih; Huang, J. C.; Lai, Yi-Shao |
| 國立中山大學 |
2007 |
Cross-Sectional Transmission Electron Microscopy Observations on the Berkovich Indentation-Induced Deformation Microstructures in GaN Thin Films
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C.H. Chien;S.R. Jian;C.T. Wang;J.Y. Juang;J.C. Huang;Y.S. Lai |
| 國立臺灣大學 |
2006 |
Cross-sectional transmission electron microscopy of ultra-fine wires of AISI 316L stainless steel
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Wang, H.S.; Huang, C.Y.; Yang, J.R. |
| 國立交通大學 |
2014-12-08T15:10:21Z |
Cross-sectional transmission electron microscopy studies for deformation behaviors of AlN thin films under Berkovich nanoindentation
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Jian, Sheng-Rui; Chen, G. -J.; Chen, H. -G.; Jang, Jason S. -C.; Liao, Y. -Y.; Yang, P. -F.; Lai, Y. -S.; Chen, M. -R.; Kao, H. -L.; Juang, J. -Y. |
| 中原大學 |
2010-07 |
Cross-sectional transmission electron microscopy studies for deformation behaviors of AlN thin films under Berkovich nanoindentation
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Sheng-Rui JianG.-J. Chen, H.-G. Chen Jason S.-C. JangY.-Y. Liao P.-F. Yang Y.-S. LaiM.-R. Chen H.-L. Kao ; J.-Y. Juang |
| 義守大學 |
2010-08 |
Cross-sectional transmission electron microscopy studies for deformation behaviors of AlN thin films under Berkovich nanoindentation
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Jian, S.-R.;Chen, G.-J.;Chen, H.-G.;Jang, J.S.-C.;Liao, Y.-Y.;Yang, P.-F.;Lai, Y.-S.;Chen, M.-R.;Kao, H.-L.;Juang, J.-Y. |
| 國立中山大學 |
2009 |
Cross-sectional transmission electron microscopy studies for deformation behaviors of AlN thin films under Berkovich nanoindentation
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S.R. Jian;J.S.C. Jang;G.J. Chen;H.G. Chen;Y.Y. Liao;M.R. Chen;H.L. Kao;P.F. Yang;Y.S. Lai |
| 國立交通大學 |
2014-12-08T15:06:05Z |
CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPE STUDY OF THE GROWTH-KINETICS OF HEXAGONAL MOSI2 ON (001)SI
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CHENG, JY; CHENG, HC; CHEN, LJ |
顯示項目 295656-295665 / 2348971 (共234898頁)
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每頁顯示[10|25|50]項目
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