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顯示項目 389796-389805 / 2348881 (共234889頁)
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| 臺大學術典藏 |
2020-01-13T08:25:14Z |
Enhanced recovery of light-induced degradation on the micromorph solar cells by electric field
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YAO-JOE YANG; Yeh, C.-H.; Bi, C.-C.; Lin, W.-Y.; Liu, C. W.; Chao, T.-M.; Chen, J. Y.; Yang, Y.-J.; Sun, H.-C. |
| 臺大學術典藏 |
2020-06-29T01:20:38Z |
Enhanced Recurrent Neural Network for Combining Static and Dynamic Features for Credit Card Default Prediction.
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Hsu, Te-Cheng;Liou, Shing-Tzuo;Wang, Yun-Ping;Huang, Yung-Shun;Lin, Che; Hsu, Te-Cheng; Liou, Shing-Tzuo; Wang, Yun-Ping; Huang, Yung-Shun; Lin, Che; CHE LIN |
| 國立臺灣科技大學 |
2013 |
Enhanced red-based scheduling (ERBS) scheme in WiMAX network
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Chern, H.-T.;Liu, Y.;Jhou, J.-S. |
| 元智大學 |
2019-06-20 |
Enhanced Reductive Dechlorination of Trichloroethene with Immobilized Clostridium burtyricum on Silica Gel
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C-W. Liu; Chien C.-C.; S-C. Chen |
| 元智大學 |
Jan-20 |
Enhanced reductive dechlorination of trichloroethene with immobilized Clostridium butyricum in silica gel
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Kai-Hung Lo; Che-Wei Lu; Wei-Han Lin; Chien C.-C.; Ssu-Ching Chen; Chih-Ming Kao |
| 中原大學 |
1999-09-14 |
Enhanced reflectivity coating (ERC) for narrow aperture width contact and interconnection lithography
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Arthru Chin;Sen-Huan Huang;鄭湘原 |
| 中原大學 |
2001 |
Enhanced reliability of electroluminescence from metal-oxide-silicon tunneling diodes by deuterium incorporation
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C. W. Liu;C. H. Lin;M. H. Lee;S. T. Chang;Y. H. Liu;Miin-Jang Chen;Ching-Fuh Lin |
| 臺大學術典藏 |
2001 |
Enhanced reliability of electroluminescence from metal–oxide–silicon tunneling diodes by deuterium incorporation
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Liu, C. W.; Lin, C.-H.; Lee, M. H.; Chang, S. T.; Liu, Y.-H.; Chen, Miin-Jang; Lin, Ching-Fuh; Liu, C. W.; Lin, C.-H.; Lee, M. H.; Chang, S. T.; Liu, Y.-H.; Chen, Miin-Jang; Lin, Ching-Fuh; LiuCW; ChenMiinJang; LinChingFuh |
| 國立臺灣大學 |
2001 |
Enhanced reliability of electroluminescence from metal–oxide–silicon tunneling diodes by deuterium incorporation
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Liu, C. W.; Lin, C.-H.; Lee, M. H.; Chang, S. T.; Liu, Y.-H.; Chen, Miin-Jang; Lin, Ching-Fuh |
| 國立交通大學 |
2018-08-21T05:53:47Z |
Enhanced Reliability of In-Ga-ZnO Thin-Film Transistors Through Design of Dual Passivation Layers
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Abliz, Ablat; Wan, Da; Chen, Jui-Yuan; Xu, Lei; He, Jiawei; Yang, Yanbing; Duan, Haiming; Liu, Chuansheng; Jiang, Changzhong; Chen, Huipeng; Guo, Tailiang; Liao, Lei |
顯示項目 389796-389805 / 2348881 (共234889頁)
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