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顯示項目 474726-474735 / 2348971 (共234898頁) << < 47468 47469 47470 47471 47472 47473 47474 47475 47476 47477 > >> 每頁顯示[10|25|50]項目
| 國立臺灣大學 |
2004 |
Hole concentration in the three-CuO2-plane copper-oxide superconductor Cu-1223
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Karppinen, M; Yamauchi, H; Morita, Y; Kitabatake, M; Motohashi, T; Liu, RS; Lee, JM; Chen, JM |
| 臺大學術典藏 |
2006 |
Hole Confinement and 1/ f Noise Characteristics of SiGe Double-Quantum-Well p-Type Metal–Oxide–Semiconductor Field-Effect Transistors
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Lin, Yu Min; Wu, San Lein; Chang, Shoou Jinn; Chen, Pang Shiu; Liu, Chee Wee; Lin, Yu Min; Wu, San Lein; Chang, Shoou Jinn; Chen, Pang Shiu; Liu, Chee Wee |
| 國立臺灣大學 |
2006 |
Hole Confinement and 1/ f Noise Characteristics of SiGe Double-Quantum-Well p-Type Metal–Oxide–Semiconductor Field-Effect Transistors
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Lin, Yu Min; Wu, San Lein; Chang, Shoou Jinn; Chen, Pang Shiu; Liu, Chee Wee |
| 國立成功大學 |
2006-05 |
Hole confinement and 1/f noise characteristics of SiGe double-quantum-well p-type metal-oxide-semiconductor field-effect transistors
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Lin, Yu-Min; Wu, San-Lein; Chang, Shoou-Jinn; Chen, Pang-Shiu; Liu, C. W. |
| 臺大學術典藏 |
2018-09-10T05:58:50Z |
Hole confinement and 1/f noise characteristics of SiGe double-quantum-well p-Type metal-oxide-semiconductor field-effect transistors
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Lin, Y.M.; San Lein, W.U.; Chang, S.J.; Chen, P.S.; Liu, C.W.; CHEE-WEE LIU |
| 國立臺灣大學 |
2006 |
Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices
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Wei, J.-Y.; Maikap, S.; Lee, M.H.; Lee, C.C.; Liu, C.W. |
| 國立臺灣大學 |
2006 |
Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices
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Wei, J.-Y.; Maikap, S.; Lee, M.H.; Lee, C.C.; Liu, C.W. |
| 臺大學術典藏 |
2018-09-10T05:58:49Z |
Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices
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Wei, J.-Y.; Maikap, S.; Lee, M.H.; Lee, C.C.; Liu, C.W.; CHEE-WEE LIU |
| 元智大學 |
2004-06 |
Hole detection from a multi-layer PCB image
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吳家豪; 胡文豐; 陳永盛 |
| 臺大學術典藏 |
2018-09-10T05:51:46Z |
Hole distribution in (Tl0.5Pb0.5)Sr-2(Ca1-xYx)Cu2O7 studied by x-ray absorption spectroscopy
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Chen, J. M.;Liu, R. S.;Liang, W. Y.; Chen, J. M.; Liu, R. S.; Liang, W. Y.; RU-SHI LIU |
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