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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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顯示項目 645951-645960 / 2348511 (共234852頁)
<< < 64591 64592 64593 64594 64595 64596 64597 64598 64599 64600 > >>
每頁顯示[10|25|50]項目
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 國立臺灣科技大學 |
2002 |
Overall-terminal reliability of a stochastic capacitated-flow network
|
Lin, Yi-Kuei |
| 臺大學術典藏 |
2021-12-21T23:17:28Z |
Overbooking for physical examination considering late cancellation and set-resource relationship
|
Ho, Te Wei; LING-CHIEH KUNG; Huang, Hsin Ya; Lai, Jui Fen; HAN-MO CHIU |
| 臺大學術典藏 |
2022-04-26T06:18:06Z |
Overbooking for physical examination considering late cancellation and set-resource relationship
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Ho T.-W;Kung L.-C;Huang H.-Y;Lai J.-F;Chiu H.-M.; Ho T.-W; Kung L.-C; Huang H.-Y; Lai J.-F; Chiu H.-M.; LING-CHIEH KUNG |
| 臺大學術典藏 |
2022-09-07T07:41:09Z |
Overbooking for physical examination considering late cancellation and set-resource relationship
|
Ho T.-W.; Kung L.-C.; Huang H.-Y.; Lai J.-F.; HAN-MO CHIU |
顯示項目 645951-645960 / 2348511 (共234852頁)
<< < 64591 64592 64593 64594 64595 64596 64597 64598 64599 64600 > >>
每頁顯示[10|25|50]項目
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