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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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顯示項目 707926-707935 / 2348570 (共234857頁) << < 70788 70789 70790 70791 70792 70793 70794 70795 70796 70797 > >> 每頁顯示[10|25|50]項目
| 臺大學術典藏 |
2005-07-31 |
Random Weighted Bootstrap Method For Recurrent Events With Informative Censoring
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江金倉; 江金倉 |
| 國立臺灣大學 |
2009 |
Random weighting and Edgeworth expansion for the nonparametric time-dependent AUC estimator
|
CT Chiang; SH Wang; H Hung |
| 臺大學術典藏 |
2018-09-10T07:28:05Z |
Random weighting and edgeworth expansion for the nonparametric time-dependent AUC estimator
|
Chiang, C.-T.; Wang, S.-H.; Hung, H.; CHIN-TSANG CHIANG |
| 臺大學術典藏 |
2018-09-10T07:45:33Z |
Random weighting and edgeworth expansion for the nonparametric time-dependent AUC estimator
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Chiang, C.-T.;Wang, S.-H.;Hung, H.; HUNG HUNG |
| 臺大學術典藏 |
2022-04-29T03:54:06Z |
Random weighting and edgeworth expansion for the nonparametric time-dependent AUC estimator
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Chiang C.-T.; Wang S.-H.; Hung Hung |
| 國立交通大學 |
2017-04-21T06:48:21Z |
Random Work Function Induced DC Characteristic Fluctuation in 16-nm High-kappa/Metal Gate Bulk and SOI FinFETs
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Su, Hsin-Wen; Chen, Yu-Yu; Chen, Chieh-Yang; Cheng, Hui-Wen; Chang, Han-Tung; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:20:12Z |
Random Work Function Variation Induced Threshold Voltage Fluctuation in 16-nm Bulk FinFET Devices with High-kappa-Metal-Gate Material
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Cheng, Hui-Wen; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:23:16Z |
Random Work-Function-Induced Threshold Voltage Fluctuation in Metal-Gate MOS Devices by Monte Carlo Simulation
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Li, Yiming; Cheng, Hui-Wen |
| 國立交通大學 |
2014-12-08T15:26:59Z |
Random-coincidence corrections using iterative reconstruction for PET images
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Chen, JC; Liu, RS; Tu, KY; Lu, HHS; Chen, TB; Chou, KL |
| 國立交通大學 |
2014-12-08T15:09:00Z |
Random-Dopant-Induced Variability in Nano-CMOS Devices and Digital Circuits
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Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh |
顯示項目 707926-707935 / 2348570 (共234857頁) << < 70788 70789 70790 70791 70792 70793 70794 70795 70796 70797 > >> 每頁顯示[10|25|50]項目
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