|
顯示項目 814011-814060 / 2348973 (共46980頁)
<< < 16276 16277 16278 16279 16280 16281 16282 16283 16284 16285 > >>
每頁顯示[10|25|50]項目
| 輔英科技大學 |
2015-01 |
test
|
admin,admin |
| 致理技術學院 |
2023-12-22 |
test
|
測試, 張 |
| 東海大學 |
2010-12-12 |
Test a model of linking applicant resume information and hiring recommendations
|
Chen, C. C., Huang, Y. M. and Wu, M. Y; 黃櫻美 |
| 東海大學 |
2010 |
Test a model of linking applicant resume information and hiring recommendations.
|
Chen, C. C., Huang, Y. M.(黃櫻美) and Wu, M. Y. |
| 國立交通大學 |
2014-12-08T15:31:59Z |
Test and Analysis of the ESD Robustness for the Diode-Connected a-IGZO Thin Film Transistors
|
Tai, Ya-Hsiang; Chiu, Hao-Lin; Chou, Lu-Sheng |
| 亞洲大學 |
2005 |
Test and Remedial Instruction Developments Based on The Structures of Competence Indicators–The“whole number”of Mathematics in Grade 3
|
Tz Yi Huang |
| 國立臺灣師範大學 |
2014-10-27T15:11:00Z |
Test Anxiety and Under-Performance: An Analysis of the Examination Process
|
陳婉真; WAN-CHEN CHEN |
| 國立臺灣大學 |
2003-12-01 |
Test Asynchronous FIR Filter Design
|
Hsieh, Po-Chun |
| 臺大學術典藏 |
2019-09-09T00:45:37Z |
Test beam demonstration of silicon microstrip modules with transverse momentum discrimination for the future CMS tracking detector
|
Piotrzkowski, K.;Dragicevic, M.;Magitteri, A.;Peltola, T.;Bruyn, I. De;Clerbaux, B.;Fasanella, G.;Python, Q.;Wang, Q.;Mechelen, P. Van;Brun, H.;König, A.;Krintiras, G.;Beliy, N.;Spilbeeck, A. Van;Daubie, E.;Caudron, A.;Hrubec, J.;Grebenyuk, A.;Mertens, A.;Skovpen, K.;Yonamine, R.;Remortel, N. Van;Deroover, K.;Hammad, G. H.;Vannerom, D.;Clercq, J. De;Bergauer, T.;D'Hondt, J.;Treberspurg, W.;Hoch, M.;Quertenmont, L.;Waltenberger, W.;Zenoni, F.;Delannoy, H.;Luetic, J.;Komm, M.;Boudoul, G.;Brondolin, E.;Adam, W.;Bruno, G.;Jeneret, J. De Favereau De;Janssen, X.;Bondu, O.;Yang, Y.;Postiau, N.;Visscher, S. De;Jafari, A.;Jamoulle, J. Cabrera;Bakhshiansohi, H.;Maerschalk, T.;Zhang, F.;Frühwirth, R.;Mulders, P. Van;Dupasquier, T.;Francois, B.;Parijs, I. Van;Wertz, S.;Giammanco, A.;Musich, M.;Lemaitre, V.;Alderweireldt, S.;Blekman, F.;Léonard, A.;Szilasi, N.;Marinov, A.;Lowette, S.;Caebergs, T.;Karapostoli, G.;Lauwers, J.;Härkönen, J.;Randle-Conde, A.;Tuominen, E.;Seva, T.;Favart, L.;Moreels, L.;Goldouzian, R.;Beaumont, W.;Tuovinen, E.;Michotte, D.;Gallbit, G.;Baulieu, G.;Combaret, C.;Delcourt, M.;Caponetto, L.;Steininger, H.;Lampén, T.;Delaere, C.;Friedl, M.;Zeid, S. Abu;Luukka, P.;Vanlaer, P.;Beghin, D.;Contardo, D.;Lenzi, T.;Lentdecker, G. De;Eerola, P.;Brochet, S.;Moortgat, S.;Marono, M. Vidal; Marono, M. Vidal; Moortgat, S.; Brochet, S.; Eerola, P.; Lentdecker, G. De; Lenzi, T.; Contardo, D.; Beghin, D.; Vanlaer, P.; Luukka, P.; Zeid, S. Abu; Friedl, M.; Delaere, C.; Lampen, T.; Steininger, H.; Caponetto, L.; Delcourt, M.; Combaret, C.; Baulieu, G.; Gallbit, G.; Michotte, D.; Tuovinen, E.; Beaumont, W.; Goldouzian, R.; Moreels, L.; Favart, L.; Seva, T.; Tuominen, E.; Randle-Conde, A.; Harkonen, J.; Lauwers, J.; Karapostoli, G.; Caebergs, T.; Lowette, S.; Marinov, A.; Szilasi, N.; Leonard, A.; Blekman, F.; Alderweireldt, S.; Lemaitre, V.; Musich, M.; Maerschalk, T.; Bakhshiansohi, H.; Jamoulle, J. Cabrera; Jafari, A.; Visscher, S. De; Postiau, N.; Yang, Y.; Bondu, O.; Janssen, X.; Jeneret, J. De Favereau De; Bruno, G.; Adam, W.; Brondolin, E.; Boudoul, G.; Komm, M.; Luetic, J.; Delannoy, H.; Zenoni, F.; Waltenberger, W.; Quertenmont, L.; Hoch, M.; Treberspurg, W.; D'Hondt, J.; Bergauer, T.; Clercq, J. De; Vannerom, D.; Hammad, G. H.; Deroover, K.; Remortel, N. Van; Yonamine, R.; Skovpen, K.; Mertens, A.; Grebenyuk, A.; Hrubec, J.; Caudron, A.; Daubie, E.; Spilbeeck, A. Van; Beliy, N.; Krintiras, G.; Konig, A.; Brun, H.; Mechelen, P. Van; Wang, Q.; Python, Q.; Fasanella, G.; Clerbaux, B.; Bruyn, I. De; Peltola, T.; Magitteri, A.; Dragicevic, M.; Piotrzkowski, K.; Giammanco, A.; Wertz, S.; Parijs, I. Van; Francois, B.; Dupasquier, T.; Mulders, P. Van; Fruhwirth, R.; Zhang, F. |
| 臺大學術典藏 |
2019-12-26T07:56:22Z |
Test beam demonstration of silicon microstrip modules with transverse momentum discrimination for the future CMS tracking detector
|
Adam, W.; Adam, W.; RONG-SHYANG LU |
| 臺大學術典藏 |
2019-12-26T07:56:24Z |
Test beam performance measurements for the Phase i upgrade of the CMS pixel detector
|
Dragicevic, M.; Dragicevic, M.; RONG-SHYANG LU |
| 國立交通大學 |
2017-04-21T06:49:12Z |
Test bed for remote environmental monitoring in northwestern China
|
Zhou, Qingguo; Cheng, Guanghui; Kao, Tzu-Han; Wu, Wenzhong; Li, Lian |
| 中國醫藥大學 |
2007-01-14 |
Test bolus及bolus tracking在冠狀動脈電腦斷層血管攝影顯影比較:中國醫藥大學附設醫院經驗.
|
陳慧珊(Hui-San Chen); 白秀蘭(Shu-Lan Pai); 洪明澤(Ming-Tse Huang); 陳鴻達(Hung-Da Chen); 陳瑞芬(Jui-Fen Chen); 陳東明(Tung-Ming Chen); 賴欣宜(Hsin-Yi Lai); 沈戊忠(Wu-Chung Sen) |
| 國立臺灣海洋大學 |
2006 |
Test case based risk predictions using artificial neural network
|
S.T. Ung;V. Williams;S. Bonsall;J. Wang |
| 國立臺灣海洋大學 |
2006-02 |
Test case based risk predictions using neural network
|
S.T. Ung;V. Williams;S. Bonsall;J. Wang |
| 中原大學 |
2006-12 |
Test Chip Design and Performance Analysis of LTPS TFTs and Their SOG Application
|
Chung, Wen-Yaw;Chiang, Keng-Ching;Lin, Abatie |
| 國立成功大學 |
2021-04 |
Test Chips With Scan-Based Logic Arrays
|
Chen;Yu-Hsiang;Hsu;Chia-Ming;Lee;Kuen-Jong |
| 臺大學術典藏 |
2018-09-10T09:50:53Z |
Test Clock Domain Optimization to Avoid Scan Shift Failures due to Flip-flop Simultaneous Triggering
|
Y. C. Huang;M. H. Tsai;W. S. Ding;J. C. M. Li;M. T. Chang;M. H. Tsai;C. M. Tseng;H. C. Li; Y. C. Huang; M. H. Tsai; W. S. Ding; J. C. M. Li; M. T. Chang; M. H. Tsai; C. M. Tseng; H. C. Li; CHIEN-MO LI |
| 臺大學術典藏 |
2018-07-05T01:37:43Z |
Test Collection Selection and Gold Standard Generation for a Multiply-Annotated Opinion Corpus
|
Hsin-Hsi Chen; Lun-Wei Ku; Yong-Sheng Lo; Lun-Wei Ku; Yong-Sheng Lo; Hsin-Hsi Chen |
| 國立臺灣大學 |
2007 |
Test Collection Selection and Gold Standard Generation for a Multiply-Annotated Opinion Corpus
|
Lun-Wei Ku; Yong-Sheng Lo; Hsin-Hsi Chen |
| 國立臺灣海洋大學 |
2018 |
Test Command Auto-Wait Mechanisms for Record and Playback-Style Web Application Testing
|
Shin-Jie Lee;Yu-Xian Chen;Shang-Pin Ma;Wen-Tin Lee |
| 國立臺灣海洋大學 |
2018 |
Test Command Auto-Wait Mechanisms for Record and Playback-Style Web Application Testing
|
Shin-Jie Lee;Yu-Xian Chen;Shang-Pin Ma;Wen-Tin Lee |
| 國立體育大學 |
2007-12-09 |
Test Construction and Effect Analysis Psychomotor
|
姚漢禱; Yau, Han-Dau |
| 國立體育大學 |
2008-06-13 |
Test Construction Using Rasch Measurement
|
姚漢禱; Yau, Han-Dau |
| 國立交通大學 |
2014-12-08T15:21:09Z |
Test coverage optimization for large code problems
|
Lin, Ying-Dar; Chou, Chi-Heng; Lai, Yuan-Cheng; Huang, Tse-Yau; Chung, Simon; Hung, Jui-Tsun; Lin, Frank C. |
| 國立臺灣科技大學 |
2012 |
Test coverage optimization for large code problems
|
Lin, Ying-Dar;Chou, Chi-Heng;Lai, Yuan-Cheng;Huang, Tse-Yau;Chung, Simon;Hung, Jui-Tsun;Lin, Frank C. |
| 國立臺灣科技大學 |
2012 |
Test coverage optimization for large code problems
|
Lin, Y.-D.;Chou, C.-H.;Lai, Y.-C.;Huang, T.-Y.;Chung, S.;Hung, J.-T.;Lin, F.C. |
| 國立中山大學 |
2007-08 |
Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture
|
S.J. Wang;P.C. Tsai;H.M. Weng;K.S.M. Li |
| 元智大學 |
2021-08-03 |
Test Data Compression Based on Diamond-Shaped Patterns
|
Fu-Ting Wang; Yu-Chen Hzu; Yung-Chih Chen; Wang-Dauh Tseng |
| 元智大學 |
2021-08-03 |
Test Data Compression Based on Diamond-Shaped Patterns
|
Fu-Ting Wang; Yu-Chen Hzu; Yung-Chih Chen; Wang-Dauh Tseng |
| 元智大學 |
2010-06 |
Test Data Compression Using Multi-dimensional Pattern Run-length Codes
|
曾王道; Lung-Jen Lee |
| 國立成功大學 |
2017-04-05 |
Test decompressor and test method thereof
|
Lee, Kuen-Jong (TW);Chen, Jhen-Zong (TW) |
| 國立臺灣師範大學 |
2015-09-03T01:06:00Z |
Test Designs for Elementary School Students
|
Chen, C.-Y. Doris |
| 國立臺灣大學 |
1993 |
Test Dose Guided Rapid IV Suramine Infusions with Weekly IV Maintenance Doses
|
Arzoomanian, R.; Tombes, M. B.; Alberti, D.; Tusch, K.; Mutch, R.; Rago, R.; 鄭安理; Spriggs, D.; Wilding, G.; Arzoomanian, R.; Tombes, M. B.; Alberti, D.; Tusch, K.; Mutch, R.; Rago, R.; Cheng, Ann-Lii; Spriggs, D.; Wilding, G. |
| 大葉大學 |
2006-09 |
Test Emission Characteristics of Motorcycles in Central Taiwan
|
Lin, Chi-Wen;Lu, San-Ju;Lin, Kuo-Shian |
| 國立臺灣海洋大學 |
2006-09 |
Test emission characteristics of motorcycles in Central Taiwan.
|
Lin, Chi-Wen; San-Ju Lu; Kuo-Shian Lin |
| 臺大學術典藏 |
2019-04-24T02:28:11Z |
Test feasibility of next-generation sequencing assays in clinical mutation detection of small biopsy and fine needle aspiration specimens
|
Zheng, Gang;Tsai, Harrison;Li-Hui Tseng;Illei, Peter;Gocke, Christopher D.;Eshleman, James R.;Netto, George;Lin, Ming Tseh; Zheng, Gang; Tsai, Harrison; LI-HUI TSENG; Illei, Peter; Gocke, Christopher D.; Eshleman, James R.; Netto, George; Lin, Ming Tseh |
| 臺大學術典藏 |
2022-03-10T07:58:38Z |
Test feasibility of next-generation sequencing assays in clinical mutation detection of small biopsy and fine needle aspiration specimens
|
Zheng G.; Tsai H.; LI-HUI TSENG; Illei P.; Gocke C.D.; Eshleman J.R.; Netto G.; Lin M.-T. |
| 淡江大學 |
2008-05 |
Test for Exponential Parameter Based on Type-I Censored Data
|
Liang, Tachen; Huang, Wen-Tao; Yang, Kun-Cheng |
| 國立交通大學 |
2014-12-08T15:24:46Z |
Test generation and site of fault for combinational circuits using logic Petri nets
|
Jui-I Tsai; Ching-Cheng Teng; Ching-Hung Lee |
| 國立成功大學 |
2017 |
Test generation for open and delay faults in CMOS circuits
|
Wu, C.-H.;Lee, K.-J.;Reddy, S.M. |
| 臺大學術典藏 |
2018-09-10T09:50:54Z |
Test Generation of Path Delay Faults Induced by Defects in Power TSV
|
Chi-Jih Shih;Shih-An Hsieh;Yi-Chang Lu;James Chien-Mo Li;Tzong-Lin Wu;K. Chakrabarty; Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-11T06:15:26Z |
Test generation of path delay faults induced by defects in power TSV
|
Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K.; Shih, C.-J.; Hsieh, S.-A.; Lu, Y.-C.; Li, J.C.-M.; Wu, T.-L.; Chakrabarty, K.; TZONG-LIN WU |
| 臺大學術典藏 |
2020-06-16T06:36:17Z |
Test generation of path delay faults induced by defects in power TSV
|
Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K.; Shih, C.-J.; Hsieh, S.-A.; Lu, Y.-C.; Li, J.C.-M.; Wu, T.-L.; Chakrabarty, K.; YI-CHANG LU |
| 臺大學術典藏 |
2020-06-29T01:20:10Z |
Test Generation of Path Delay Faults Induced by Defects in Power TSV.
|
Shih, Chi-Jih;Hsieh, Shih-An;Lu, Yi-Chang;Li, James Chien-Mo;Wu, Tzong-Lin;Chakrabarty, Krishnendu; Shih, Chi-Jih; Hsieh, Shih-An; Lu, Yi-Chang; Li, James Chien-Mo; Wu, Tzong-Lin; Chakrabarty, Krishnendu; CHIEN-MO LI |
| 國立臺灣科技大學 |
2016 |
Test interactivity is promising in promoting gender equity in females' pursuit of STEM careers
|
Jeng, H.-L;Liu, G.-F. |
| 臺大學術典藏 |
2020-06-29T01:20:16Z |
Test Methodology for Dual-rail Asynchronous Circuits
|
Huang, K.-Y.;Shen, T.-Y.;Li, C.-M.; Huang, K.-Y.; Shen, T.-Y.; Li, C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:14Z |
Test methodology for PCHB/PCFB Asynchronous Circuits
|
Shen, T.-Y.;Pai, C.-C.;Chen, T.-C.;Li, J.C.-M.;Pan, S.; Shen, T.-Y.; Pai, C.-C.; Chen, T.-C.; Li, J.C.-M.; Pan, S.; CHIEN-MO LI |
| 元智大學 |
2015 |
TEST NEW SQL SERVER 2008 R2
|
Hoder Lee |
| 國立臺灣大學 |
1988 |
Test of 35 Eucalyptus Species in Taiwan
|
姜家華; Chiang, Chia-Hua |
顯示項目 814011-814060 / 2348973 (共46980頁)
<< < 16276 16277 16278 16279 16280 16281 16282 16283 16284 16285 > >>
每頁顯示[10|25|50]項目
|
