| 國立交通大學 |
2014-12-08T15:02:29Z |
Atomic force microscopy study on the surface structure of oxidized porous silicon
|
Young, TF; Huang, IW; Yang, YL; Kuo, WC; Jiang, IM; Chang, TC; Chang, CY |
| 國立中山大學 |
1995 |
Atomic Force Microscopy Study on the Surface Structure of Oxidized Porous Silicon
|
T.F. Young;I.W. Huang;Y.L. Yang;W.C. Kuo;I.M. Jiang;T.C. Chang;C.Y. Chang |
| 國立成功大學 |
2004-11-15 |
Atomic force microscopy tip noise induced by adhesion, nanoindentation and fracture
|
Chen, Cha'o-Kuang; Chen, Bin-Hao; Yang, Yue-Tzu |
| 國立成功大學 |
2004-12 |
Atomic force microscopy tip noise induced by adhesion, nanoindentation and fracture
|
Chen, Cha'o-Kuang; Chen, Bin-Hao; Yang, Yue-Tzu |
| 國立臺灣大學 |
2007-07 |
Atomic force microscopy: Determination of unbinding force, off rate and binding energy for protein-ligand interaction.
|
Lee, Chih-Kung; Wang, Yu-Ming; Huang, Long-Sun; Lin, Shiming |
| 臺大學術典藏 |
2019-10-29T07:18:25Z |
Atomic force microscopy: Determination of unbinding force, off rate and energy barrier for protein-ligand interaction
|
SHI-MING LIN;Huang L.-S.;Wang Y.-M.;Lee C.-K.; Lee C.-K.; Wang Y.-M.; Huang L.-S.; SHI-MING LIN |
| 臺大學術典藏 |
2020-03-03T02:27:31Z |
Atomic force microscopy: Determination of unbinding force, off rate and energy barrier for protein-ligand interaction
|
Lee C.-K.;Wang Y.-M.;Huang L.-S.;Shi-Ming Lin; Lee C.-K.; Wang Y.-M.; Huang L.-S.; SHI-MING LIN |
| 臺大學術典藏 |
2020-04-28T07:12:23Z |
Atomic force microscopy: Determination of unbinding force, off rate and energy barrier for protein-ligand interaction
|
Lee, C.-K.; Wang, Y.-M.; Huang, L.-S.; Lin, S.; CHIH-KUNG LEE |
| 臺大學術典藏 |
2007 |
Atomic force microscopy: Determination of unbinding force, off rate and energy barrier for protein–ligand interaction
|
Lin, Shiming; Huang, Long-Sun; Wang, Yu-Ming; Lee, Chih-Kung; Lee, Chih-Kung; Wang, Yu-Ming; Huang, Long-Sun; Lin, Shiming |
| 國立臺灣大學 |
2007 |
Atomic force microscopy: Determination of unbinding force, off rate and energy barrier for protein–ligand interaction
|
Lee, Chih-Kung; Wang, Yu-Ming; Huang, Long-Sun; Lin, Shiming |
| 國立東華大學 |
2002-11 |
Atomic Geometry, Electronic Structure, and Magnetism of 13-atom .Metal Clusters
|
Chang, C. M. |
| 國立東華大學 |
2003-03 |
Atomic Geometry, Electronic Structure, and Magnetism of 13-atom Metal Clusters
|
Chang, C. M. |
| 國立交通大學 |
2018-08-21T05:53:33Z |
Atomic Heterointerfaces and Electrical Transportation Properties in Self-Assembled LaNiO3-NiO Heteroepitaxy
|
Zhu, Yuan Min; Thi Hien Do; Vu Thanh Tra; Yu, Rong; Chu, Ying-Hao; Zhan, Qian |
| 國立成功大學 |
2022 |
Atomic Imaging of Interface Defects in an Insulating Film on Diamond
|
Fujii, M.N.;Tanaka, M.;Tsuno, Tsuno T.;Hashimoto, Y.;Tomita, H.;Takeuchi, S.;Koga, S.;Sun, Z.;Enriquez, J.I.;Morikawa, Y.;Mizuno, J.;Uenuma, M.;Uraoka, Y.;Matsushita, T. |
| 國立成功大學 |
2023 |
Atomic Imaging of Interface Defects in an Insulating Film on Diamond
|
Fujii, M.N.;Tanaka, M.;Tsuno, Tsuno T.;Hashimoto, Y.;Tomita, H.;Takeuchi, S.;Koga, S.;Sun, Z.;Enriquez, J.I.;Morikawa, Y.;Mizuno, J.;Uenuma, M.;Uraoka, Y.;Matsushita, T. |
| 國立交通大學 |
2020-07-01T05:21:19Z |
Atomic Imaging of Molybdenum Oxide Nanowires with Unique and Complex Periodicity by Advanced Electron Microscopy
|
Ting, Yi-Hsin; Huang, Chun-Wei; Yasuhara, Akira; Chen, Sheng-Yuan; Chen, Jui-Yuan; Chang, Li; Lu, Kuo-Chang; Wu, Wen-Wei |
| 國立成功大學 |
2020-03-11 |
Atomic Imaging of Molybdenum Oxide Nanowires with Unique and Complex Periodicity by Advanced Electron Microscopy
|
Ting;Yi-Hsin;Huang;Chun-Wei;Yasuhara;Akira;Chen;Sheng-Yuan;Chen;Jui-Yuan;Chang;Li;Lu;Kuo-Chang;Wu;Wen-Wei |
| 淡江大學 |
2025-07-31T04:05:17Z |
Atomic Insights into the Competitive Edge of Nanosheets Splitting Water
|
Falling, Lorenz J.;Jang, Woosun;Laha, Sourav;Götsch, Thomas;Terban, Maxwell W.;Bette, Sebastian;Mom, Rik;Juan-Jesús, Velasco-Vélez;Girgsdies, Frank;Teschner, Detre;Tarasov, Andrey;Chuang, Cheng-Hao;Lunkenbein, Thomas;Axel, Knop-Gericke;Weber, Daniel;Dinnebier, Robert;Lotsch, Bettina V.;Schlögl, Robert;Jones, Travis E. |
| 臺大學術典藏 |
2018-09-10T09:46:19Z |
Atomic ionization of germanium by neutrinos from an ab initio approach
|
JIUNN-WEI CHEN; JIUNN-WEI CHEN |
| 臺大學術典藏 |
2022-03-22T08:27:46Z |
Atomic layer annealing for modulation of the work function of TiN metal gate for n-type MOS devices
|
Wang C.-Y;Chou C.-Y;Shiue H.-F;Chen H.-Y;Ling C.-H;Shyue J.-J;Chen M.-J.; Wang C.-Y; Chou C.-Y; Shiue H.-F; Chen H.-Y; Ling C.-H; Shyue J.-J; Chen M.-J.; MIIN-JANG CHEN |
| 臺大學術典藏 |
2022-03-22T08:30:48Z |
Atomic layer annealing for modulation of the work function of TiN metal gate for n-type MOS devices
|
Wang C.-Y;Chou C.-Y;Shiue H.-F;Chen H.-Y;Ling C.-H;Shyue J.-J;Chen M.-J.; Wang C.-Y; Chou C.-Y; Shiue H.-F; Chen H.-Y; Ling C.-H; Shyue J.-J; Chen M.-J.; MIIN-JANG CHEN |
| 臺大學術典藏 |
2022-02-21T23:30:43Z |
Atomic layer annealing for modulation of the work function of TiN metal gate for n-type MOS devices
|
Wang, Chun Yuan; Chou, Chun Yi; Shiue, Han Fang; Chen, Hsing Yang; Ling, Chen Hsiang; Shyue, Jing Jong; MIIN-JANG CHEN |
| 臺大學術典藏 |
2022-03-22T08:30:46Z |
Atomic layer annealing for modulation of the work function of TiN metal gate for n-type MOS devices
|
Wang C.-Y;Chou C.-Y;Shiue H.-F;Chen H.-Y;Ling C.-H;Shyue J.-J;Chen M.-J.; Wang C.-Y; Chou C.-Y; Shiue H.-F; Chen H.-Y; Ling C.-H; Shyue J.-J; Chen M.-J.; MIIN-JANG CHEN |
| 國立交通大學 |
2019-10-05T00:08:38Z |
Atomic layer defect-free etching for germanium using HBr neutral beam
|
Fujii, Takuya; Ohori, Daisuke; Noda, Shuichi; Tanimoto, Yosuke; Sato, Daisuke; Kurihara, Hideyuki; Mizubayashi, Wataru; Endo, Kazuhiko; Li, Yiming; Lee, Yao-Jen; Ozaki, Takuya; Samukawa, Seiji |
| 臺大學術典藏 |
2021-08-05T02:41:02Z |
Atomic Layer Densification of AlN Passivation Layer on Epitaxial Ge for Enhancement of Reliability and Electrical Performance of High-K Gate Stacks
|
Wang C.-I;Chang T.-J;Yin Y.-T;Jiang Y.-S;Shyue J.-J;Chen M.-J.; Wang C.-I; Chang T.-J; Yin Y.-T; Jiang Y.-S; Shyue J.-J; Chen M.-J.; MIIN-JANG CHEN |
