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顯示項目 213036-213045 / 2348570 (共234857頁)
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| 國立交通大學 |
2014-12-08T15:28:17Z |
Atomic-Scale Field-Effect Transistor as a Thermoelectric Power Generator and Self-Powered Device
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Liu, Yu-Shen; Yao, Hsuan-Te; Chen, Yu-Chang |
| 國立臺灣海洋大學 |
2008-04 |
Atomic-scale finite-element model of tension in nanoscale thin film
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Jinn-Tong Chiu;Yeou-Yih Lin;Chi-Liu Shen;Ship-Peng Lo;Wen-Jang Wu |
| 臺大學術典藏 |
2018-09-10T09:48:32Z |
Atomic-scale interfacial band mapping across vertically phased-separated polymer/fullerene hybrid solar cells
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Shih, M.-C.; Huang, B.-C.; Lin, C.-C.; Li, S.-S.; Chen, H.-A.; Chiu, Y.-P.; Chen, C.-W.; Shih, M.-C.; Huang, B.-C.; Lin, C.-C.; Li, S.-S.; Chen, H.-A.; Chiu, Y.-P.; Chen, C.-W.; YA-PING CHIU |
| 國立成功大學 |
2021-09-15 |
Atomic-scale investigation of Lithiation/Delithiation mechanism in High-entropy spinel oxide with superior electrochemical performance
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Huang;Chih-Yang;Huang;Chun-Wei;Wu;Min-Ci;Patra;Jagabandhu;Nguyen;Xuyen, Thi;Chang;Mu-Tung;Clemens;Oliver;Ting;Jyh-Ming;Li;Ju;Chang;Jeng-Kuei;Wu;Wen-Wei |
| 國立交通大學 |
2020-07-09 |
Atomic-Scale Localized Thinning and Reconstruction of Two-Dimensional WS2 Layers through In Situ Transmission Electron Microscopy/Scanning Transmission Electron Microscopy
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Wu, Wen-Wei; Huang, Chih-Yang; Huang, Chun-Wei; Tseng, Yi-Tang; Tai, Kuo-Lun |
| 臺大學術典藏 |
2018-09-10T15:23:37Z |
Atomic-scale mapping of electronic structures across heterointerfaces by cross-sectional scanning tunneling microscopy
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Chiu, Y.-P.; Huang, B.-C.; Shih, M.-C.; Huang, P.-C.; Chen, C.-W.; YA-PING CHIU |
| 臺大學術典藏 |
2019-12-27T06:48:49Z |
Atomic-scale mapping of electronic structures across heterointerfaces by cross-sectional scanning tunneling microscopy
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Chiu, Y.-P.; Chiu, Y.-P.; YA-PING CHIU et al. |
| 國立交通大學 |
2018-08-21T05:53:41Z |
Atomic-scale mechanism of internal structural relaxation screening at polar interfaces
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Li, Mingqiang; Cheng, Xiaoxing; Li, Ning; Liu, Heng-Jui; Huang, Yen-Lin; Liu, Kaihui; Chu, Ying-Hao; Yu, Dapeng; Chen, Long-Qing; Ikuhara, Yuichi; Gao, Peng |
| 國立交通大學 |
2018-08-21T05:54:12Z |
Atomic-Scale Mechanisms of Defect-Induced Retention Failure in Ferroelectrics
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Li, Linze; Zhang, Yi; Xie, Lin; Jokisaar, Jacob R.; Beekman, Christianne; Yang, Jan -Chi; Chu, Ying-Hao; Christen, Hans M.; Pan, Xiaoqing |
| 國立成功大學 |
2017 |
Atomic-Scale Mechanisms of Defect-Induced Retention Failure in Ferroelectrics
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Li, Li L.;Zhang, Y.;Xie, L.;Jokisaari, Jokisaari J.R.;Beekman, C.;Yang, J.-C.;Chu, Y.-H.;Christen, H.M.;Pan, X. |
顯示項目 213036-213045 / 2348570 (共234857頁)
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