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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
臺大學術典藏 2021-04-21T07:27:42Z Comprehensive cohort analysis of mutational spectrum in early onset breast cancer patients Midha M.K.;Huang Y.-F.;Yang H.-H.;Fan T.-C.;Chang N.-C.;Chen T.-H.;Wang Y.-T.;Wen-Hung Kuo;Chang K.-J.;Shen C.-Y.;Yu A.L.;Chiu K.-P.;Chen C.-J.; Midha M.K.; Huang Y.-F.; Yang H.-H.; Fan T.-C.; Chang N.-C.; Chen T.-H.; Wang Y.-T.; WEN-HUNG KUO; Chang K.-J.; Shen C.-Y.; Yu A.L.; Chiu K.-P.; Chen C.-J.
臺大學術典藏 2022-08-12T06:27:20Z Comprehensive cohort analysis of mutational spectrum in early onset breast cancer patients Midha M.K.; Huang Y.-F.; Yang H.-H.; Fan T.-C.; Chang N.-C.; Chen T.-H.; Wang Y.-T.; Kuo W.-H.; KING-JEN CHANG; Shen C.-Y.; Yu A.L.; Chiu K.-P.; Chen C.-J.
國立暨南國際大學 2011 Comprehensive comparison of electrical and reliability characteristics of various copper barrier films 陳炫安?; Chen, SA
國立暨南國際大學 2011 Comprehensive comparison of electrical and reliability characteristics of various copper barrier films 鄭義榮?; Cheng, YL
國立暨南國際大學 2011 Comprehensive comparison of electrical and reliability characteristics of various copper barrier films 邱泰榮?; Chiu, TJ
國立暨南國際大學 2011 Comprehensive comparison of electrical and reliability characteristics of various copper barrier films 王英郎?; Wang, YL
國立暨南國際大學 2011 Comprehensive comparison of electrical and reliability characteristics of various copper barrier films Wu, J; Wu, J
國立暨南國際大學 2013 Comprehensive comparison of structural, electrical, and reliability characteristics of HfO2 gate dielectric with H2O or O-3 oxidant Chang, YL; Chang, YL
國立暨南國際大學 2013 Comprehensive comparison of structural, electrical, and reliability characteristics of HfO2 gate dielectric with H2O or O-3 oxidant 鄭義榮; Cheng, YL
國立暨南國際大學 2013 Comprehensive comparison of structural, electrical, and reliability characteristics of HfO2 gate dielectric with H2O or O-3 oxidant Lin, JR; Lin, JR

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