| 臺大學術典藏 |
2019-07-22T01:45:09Z |
Defect engineering of metal-oxide interface for proximity of photooxidation and photoreduction
|
Yu G.;Wang X.;Basset J.-M.;Wu J.C.S.;Zhang Y.;Su W.;Tong Y.;Chen L.;Long J.;Ling L.;Qiu M.;Fang Z.;Zhang Z.;Zhou Y.; Zhou Y.; Zhang Z.; Fang Z.; Qiu M.; Ling L.; Long J.; Chen L.; Tong Y.; Su W.; Zhang Y.; Wu J.C.S.; Basset J.-M.; Wang X.; Yu G. |
| 國立高雄大學 |
2011 |
Defect engineering of room-temperature ferromagnetism of carbon-doped ZnO
|
孫士傑; Hsu, H.S.; Tung, Y.; Chen, Y.J.; Chen, M.G.; Lee, J.S. |
| 淡江大學 |
2024-04-10 |
Defect engineering simultaneously regulating exciton dissociation in carbon nitride and local electron density in Pt single atoms toward highly efficient photocatalytic hydrogen production
|
Liu, Dongjie;Zhang, Chunyang;Shi, Jinwen;Shi, Yuchuan;Nga, Ta Thi Thuy;Liu, Maochang;Shen, Shaohua;Dong, Chun-Li |
| 國立臺灣科技大學 |
2012 |
Defect evolution in multiwalled carbon nanotube films irradiated by ar ions
|
Honda, S.-I.;Nanba, S.;Hasegawa, Y.;Nosho, Y.;Tsukagoshi, A.;Niibe, M.;Terasawa, M.;Hirase, R.;Izumi, H.;Yoshioka, H.;Lee, K.-Y.;Niwase, K.;Taguchi, E.;Oura, M. |
| 國立成功大學 |
2013-12-07 |
Defect formation by pristine indenter at the initial stage of nanoindentation
|
Chen, I-Hsien; Hsiao, Chun-I; Behera, Rakesh K.; Hsu, Wen-Dung |
| 國立成功大學 |
2015 |
Defect formation mechanism and quality improvement of InAlN epilayers grown by metal-organic chemical vapor deposition
|
Wang, Tzu Yu; Liang, Jia Hao; Wuu, Dong Sing |
| 國立中山大學 |
1996 |
Defect Formation Mechanisms in Laser Welding Technique for Semiconductor Laser Packaging
|
W.H. Cheng; W.H. Wang; J.C. Chen |
| 義守大學 |
2006-04 |
Defect generation of rutile-type SnO2 nanocondensates: Imperfect oriented attachment and phase transformation
|
Wan-Ju Tseng;Pouyan Shen;Shuei-Yuan Chen |
| 國立中山大學 |
1998 |
Defect in Optoelectronic Materials Due to Phosphorus-Containing Underlayer
|
W.H. Cheng; S.C. Wang;Y.K. Tu; C.H. Chen; K.C. Hsieh |
| 國立中山大學 |
1998 |
Defect in Optoelectronic Materials Due to Phosphous-containing Underlayer
|
W.H. Cheng;S.C. Wang;Y.K. Tu;C.H. Chen;K.C. Hsieh |
| 國立交通大學 |
2014-12-08T15:06:52Z |
Defect indices of powers of a contraction
|
Gau, Hwa-Long; Wu, Pei Yuan |
| 國立成功大學 |
2024-07 |
Defect induced crystal lattice disorder and its effect on the electron-phonon coupling in Fe doped ZnO thin films
|
Brahma;Sanjaya;Lo;Chiung-Yuan;Chen;Ssu-Chi;Chu;Heng-Chi;Hsu;Han, Cheng;Huang;Jow-Lay |
| 國立成功大學 |
2019 |
Defect induced ferromagnetic ordering in epitaxial Zn0.95Mn0.05O films on sapphire (0 0 0 1)
|
Liu, W.-R.;Pao, C.-W.;Yu, D.W.;Chin, Y.-Y.;Wu, Wu W.-B.;Lin, H.-J.;Haw, S.-C.;Chu, Chu C.-H.;Chao, T.-Y.;Hsu, Hsu H.-C.;Chen, J.-M.;Hsu, C.-H.;Hsieh, W.-F.;Chen, Chen C.-T. |
| 國立交通大學 |
2019-10-05T00:08:49Z |
Defect induced ferromagnetic ordering in epitaxial Zn0.95Mn0.05O films on sapphire (0001)
|
Liu, Wei-Rein; Pao, Chih-Wen; Yu, Doris Weijyun; Chin, Yi-Ying; Wu, Wen-Bin; Lin, Hong-Ji; Haw, Shu-Chih; Chu, Chia-Hung; Chao, Tzu-Yang; Hsu, Hsu-Cheng; Chen, Jin-Ming; Hsu, Chia-Hung; Hsieh, Wen-Feng; Chen, Chien-Te |
| 淡江大學 |
2017 |
Defect induced magnetism in nano-materials studied by X-ray-based spectroscopic and microscopic techniques
|
王玉富;Wang, Yu-Fu |
| 國立臺灣大學 |
2000-03 |
Defect Inspection and Analysis of Color Filter Panel
|
Wu, M. H.; Chen, C. S.; Fuh, H. Y. |
| 元智大學 |
2009-12 |
Defect inspection in low-contrast LCD images using Hough transform-based non-stationary line detection
|
李韋辰; 蔡篤銘 |
| 元智大學 |
2011-02 |
Defect inspection in low-contrast LCD images using Hough transform-based nonstationary line detection
|
Wei-Chen Li; Du-Ming Tsai |
| 元智大學 |
2018-05-20 |
Defect inspection of liquid-crystal-display (LCD) panels in repetitive pattern images using 2D Fourier image reconstruction
|
Du-Ming Tsai; Morris Fan; Yan Hsin Tseng |
| 元智大學 |
2018-05-20 |
Defect Inspection of Liquid-Crystal-Display (LCD) Panels in Repetitive Pattern Images Using 2D Fourier Image Reconstruction
|
Du-Ming Tsai; Yan-Hsin Tseng; S. K. Morris Fan |
| 元智大學 |
2004-12 |
Defect Inspection of Patterned TFT-LCD Panels Usinga Fast Sub-image Based SVD
|
C.-J. Lu (呂奇傑); 蔡篤銘 |
| 元智大學 |
2004-10 |
Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
|
C.-J. Lu(呂奇傑); 蔡篤銘 |
| 亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
|
劉曉薇;Hsiao-Wei,Liu;陳思翰;Ssu-Han,Chen*;彭德保;Der-Baau,Perng; |
| 亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
|
劉曉薇;Liu, Hsiao-Wei;陳思翰;Chen, Ssu-Han;*;彭德保;Perng, Der-Baau |
| 亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
|
Perng；, 劉曉薇；Hsiao-Wei Liu；陳思翰；Ssu-Han Chen；*；彭德保；Der-Baau |
