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Showing items 457901-457910 of 2348487 (234849 Page(s) Totally) << < 45786 45787 45788 45789 45790 45791 45792 45793 45794 45795 > >> View [10|25|50] records per page
| 國立臺灣海洋大學 |
2009-01-01 |
Growth and characterization of well-aligned rutile TiO2 nanocrystals on sapphire substrates via metal organic vapour deposition
|
C. A. Chen;A. Korotcov;Y. S. Huang;W. H. Chung;D. S. Tsai K. K. Tiong |
| 國立臺灣海洋大學 |
2007 |
Growth and characterization of well-aligned rutile TiO2 nanocrystals on sapphire substrates via metal organic vapour deposition
|
C. A. Chen;A. Korotcov;Y. S. Huang;W. H. Chung;D. S. Tsai;K. K. Tiong |
| 國立交通大學 |
2014-12-08T15:38:36Z |
Growth and characterization of Zn-ZnO core-shell polygon prismatic nanocrystals on Si
|
Lin, CC; Liu, KH; Chen, SY |
| 國立臺灣科技大學 |
2010 |
Growth and characterization of Zn1-x-yBexMg ySe solid solutions with luminescence and photoacoustic methods
|
Firszt F.; Zakrzewski J.; Strzalkowski K.; Malinski M.; Legowski S.; Meczynska H.; Marasek A.; Huang Y.-S.; Dumcenco D. |
| 大葉大學 |
2016-10-30 |
Growth and Characterization of ZnGa2O4 Thin Films with Various Thicknesses by MOCVD
|
Huang, Chiung-Yi;Ou, Sin-Liang;Horng, Ray-Hua |
| 國立臺灣海洋大學 |
2009-12 |
Growth and Characterization of ZnO films on (11-20) sapphire substrates by atomic layer deposition using DEZn and N2O
|
Kuo-Yi Yen;Kuang-Pi Liu;Jyh-Rong Gong;Kuen-Yau Tsai;Dong-Yuan Lyu;Tai-Yuan Lin;Guo-Yu Ni;Far-Wen Jih |
| 臺大學術典藏 |
2018-09-10T09:16:12Z |
Growth and characterization of ZnO/ZnTe core/shell nanowire arrays on transparent conducting oxide glass substrates
|
Lin, Y.W.;Chen, W.-J.;Lu, J.Y.;Chang, Y.H.;Liang, C.-T.;Chen, Y.F.;Lu, J.-Y.; Lin, Y.W.; Chen, W.-J.; Lu, J.Y.; Chang, Y.H.; Liang, C.-T.; Chen, Y.F.; Lu, J.-Y.; CHI-TE LIANG; YUAN-HUEI CHANG; YANG-FANG CHEN |
| 國立中山大學 |
1986 |
Growth and Characterization of ZnSe Epilayers by Low Pressure MOCVD
|
M.K. Lee |
| 國立成功大學 |
2000-04 |
Growth and characterization of ZnSe on Si by atomic layer epitaxy
|
Yokoyama, Meiso; Chen, Nyen-Ts; Ueng, Herng-Yih |
| 國立中山大學 |
2000 |
Growth and Characterization of ZnSe on Si by Atomic Layer Epitaxy
|
M. Yokoyama; N.T. Chen; H.Y. Ueng |
Showing items 457901-457910 of 2348487 (234849 Page(s) Totally) << < 45786 45787 45788 45789 45790 45791 45792 45793 45794 45795 > >> View [10|25|50] records per page
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