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Showing items 492571-492580 of 2349128 (234913 Page(s) Totally) << < 49253 49254 49255 49256 49257 49258 49259 49260 49261 49262 > >> View [10|25|50] records per page
| 淡江大學 |
1995-05 |
Impact of spontaneous emission noise of optical amplifiers on the channel capacity of coherent SCM systems
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Wu, Jyh-horng; Wu, Jingshown; 李揚漢; Lee, Yang-han |
| 國立臺灣大學 |
1995 |
Impact of spontaneous emission noise of optical amplifiers on the channel capacity of coherent SCM systems
|
Wu, Jyh-Horng; Wu, Jingshown; Lee, Yang-Han |
| 中山醫學大學 |
2020 |
Impact of SRY-Box Transcription Factor 11 Gene Polymorphisms on Oral Cancer Risk and Clinicopathologic Characteristics
|
Yeh, CM; Lin, CW; Lu, HJ; Chuang, CY; Chou, CH; Yang, SF; Chen, MK |
| 臺大學術典藏 |
2020-08-18T06:57:30Z |
Impact of SSTA in East Indian Ocean on the frequency of Northwest Pacific tropical cyclones: A regional atmospheric model study
|
Zhan, R.; Y. Wang; C.-C.Wu; CHUN-CHIEH WU |
| 國立臺灣大學 |
2011 |
Impact of SSTA in the East Indian Ocean on the Frequency of Northwest Pacific Tropical Cyclones: A Regional Atmospheric Model Study
|
Zhan, Ruifen; Wang, Yuqing; Wu, Chun-Chieh |
| 臺大學術典藏 |
2018-09-10T08:36:49Z |
Impact of SSTA in the East Indian Ocean on the frequency of Northwest Pacific tropical cyclones: A regional atmospheric model study
|
Zhan, R.;Wang, Y.;Wu, C.-C.; Zhan, R.; Wang, Y.; Wu, C.-C.; CHUN-CHIEH WU |
| 國立交通大學 |
2014-12-08T15:12:06Z |
Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Lo, Wen-Hung; Ho, Szu-Han; Chen, Ching-En; Shih, Jou-Miao; Chen, Hua-Mao; Dai, Bai-Shan; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:17:09Z |
Impact of STI on the reliability of narrow-width pMOSFETs with advanced ALD N/O gate stack
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Chung, SS; Yeh, CH; Feng, HJ; Lai, CS; Yang, JJ; Chen, CC; Jin, Y; Chen, SC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:38:10Z |
Impact of Strain Layer on Gate Leakage and Interface-State for nMOSFETs Fabricated by Stress-Memorization Technique
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Liao, Chia-Chun; Lin, Min-Chen; Chiang, Tsung-Yu; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:29:12Z |
Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal-oxide-semiconductor-field-effect-transistors
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Lo, Wen-Hung; Chang, Ting-Chang; Dai, Chih-Hao; Chung, Wan-Lin; Chen, Ching-En; Ho, Szu-Han; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Cheng, Osbert; Huang, Cheng-Tung |
Showing items 492571-492580 of 2349128 (234913 Page(s) Totally) << < 49253 49254 49255 49256 49257 49258 49259 49260 49261 49262 > >> View [10|25|50] records per page
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