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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
淡江大學 1995-05 Impact of spontaneous emission noise of optical amplifiers on the channel capacity of coherent SCM systems Wu, Jyh-horng; Wu, Jingshown; 李揚漢; Lee, Yang-han
國立臺灣大學 1995 Impact of spontaneous emission noise of optical amplifiers on the channel capacity of coherent SCM systems Wu, Jyh-Horng; Wu, Jingshown; Lee, Yang-Han
中山醫學大學 2020 Impact of SRY-Box Transcription Factor 11 Gene Polymorphisms on Oral Cancer Risk and Clinicopathologic Characteristics Yeh, CM; Lin, CW; Lu, HJ; Chuang, CY; Chou, CH; Yang, SF; Chen, MK
臺大學術典藏 2020-08-18T06:57:30Z Impact of SSTA in East Indian Ocean on the frequency of Northwest Pacific tropical cyclones: A regional atmospheric model study Zhan, R.; Y. Wang; C.-C.Wu; CHUN-CHIEH WU
國立臺灣大學 2011 Impact of SSTA in the East Indian Ocean on the Frequency of Northwest Pacific Tropical Cyclones: A Regional Atmospheric Model Study Zhan, Ruifen; Wang, Yuqing; Wu, Chun-Chieh
臺大學術典藏 2018-09-10T08:36:49Z Impact of SSTA in the East Indian Ocean on the frequency of Northwest Pacific tropical cyclones: A regional atmospheric model study Zhan, R.;Wang, Y.;Wu, C.-C.; Zhan, R.; Wang, Y.; Wu, C.-C.; CHUN-CHIEH WU
國立交通大學 2014-12-08T15:12:06Z Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Lo, Wen-Hung; Ho, Szu-Han; Chen, Ching-En; Shih, Jou-Miao; Chen, Hua-Mao; Dai, Bai-Shan; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung
國立交通大學 2014-12-08T15:17:09Z Impact of STI on the reliability of narrow-width pMOSFETs with advanced ALD N/O gate stack Chung, SS; Yeh, CH; Feng, HJ; Lai, CS; Yang, JJ; Chen, CC; Jin, Y; Chen, SC; Liang, MS
國立交通大學 2014-12-08T15:38:10Z Impact of Strain Layer on Gate Leakage and Interface-State for nMOSFETs Fabricated by Stress-Memorization Technique Liao, Chia-Chun; Lin, Min-Chen; Chiang, Tsung-Yu; Chao, Tien-Sheng
國立交通大學 2014-12-08T15:29:12Z Impact of strain on gate-induced floating body effect for partially depleted silicon-on-insulator p-type metal-oxide-semiconductor-field-effect-transistors Lo, Wen-Hung; Chang, Ting-Chang; Dai, Chih-Hao; Chung, Wan-Lin; Chen, Ching-En; Ho, Szu-Han; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Cheng, Osbert; Huang, Cheng-Tung

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