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Showing items 605991-606000 of 2348487 (234849 Page(s) Totally) << < 60595 60596 60597 60598 60599 60600 60601 60602 60603 60604 > >> View [10|25|50] records per page
| 國立臺灣大學 |
2007-11 |
Nanorod-based perfusion estimation using a high-frame-rate photoacoustic imaging system
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Liao, C.-K.; Huang, S.-W.; Wei, C.-W.; Li, P.-C. |
| 淡江大學 |
2002-11-30 |
Nanosat極微衛星電源系統規劃與分析
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洪祖昌; Hong, Zuu-chang; 陳威智; 謝其浩 |
| 淡江大學 |
2003-10 |
Nanosat極微衛星電源系統設計製作與測試
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洪祖昌; Hong, Zuu-chang; 林宗憲; 王宇輝; 陳威智; 林煥榮; 陳裕愷; 蕭秋德 |
| 國立交通大學 |
2014-12-08T15:22:22Z |
Nanoscale 2-Bit/Cell HfO2 Nanocrystal Flash Memory
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Lin, Yu-Hsien; Chien, Chao-Hsin |
| 國立成功大學 |
2024-05-28 |
Nanoscale Adhesion and Material Transfer at 2D MoS2-MoS2 Interfaces Elucidated by In Situ Transmission Electron Microscopy and Atomistic Simulations
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Toom;Reddy, Sathwik;Sato;Takaaki;Milne;Zachary;Bernal;Rodrigo, A.;Jeng;Yeau-Ren;Muratore;Christopher;Glavin;Nicholas, R.;Carpick;Robert, W.;Schall;David, J. |
| 臺大學術典藏 |
2018-09-10T14:52:12Z |
Nanoscale analysis of a functionalized polythiophene surface by adhesion mapping
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SHYH-CHYANG LUO;Yu, H.-H.;Zhu, B.;Luo, S.-C.;Park, J.W.;Kwak, J.-W.;Lee, J.-E.;SHYH-CHYANG LUO; Lee, J.-E.; Kwak, J.-W.; Park, J.W.; Luo, S.-C.; Zhu, B.; Yu, H.-H.; SHYH-CHYANG LUO |
| 國立成功大學 |
2014 |
Nanoscale analysis of functionalized polythiophene surfaces: the effects of electropolymerization methods and thermal treatment
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Lee, Jae-Eun; Luo, Shyh-Chyang; Zhu, Bo; Park, Joon Won; Yu, Hsiao-hua |
| 臺大學術典藏 |
2018-09-10T14:52:12Z |
Nanoscale analysis of functionalized polythiophene surfaces: The effects of electropolymerization methods and thermal treatment
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SHYH-CHYANG LUO;Yu, H.-H.;Park, J.W.;Zhu, B.;Luo, S.-C.;Lee, J.-E.;SHYH-CHYANG LUO; Lee, J.-E.; Luo, S.-C.; Zhu, B.; Park, J.W.; Yu, H.-H.; SHYH-CHYANG LUO |
| 臺大學術典藏 |
2021-10-25T09:17:44Z |
Nanoscale assembly of complex structures by controlled elastic instability of micro-structured elastomeric membrane
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Y. Zhang; E. A. Matsumoto; A. Peter; P. C. Lin; R. D. Kamien; S. Yang; PEI-CHUN LIN |
| 國立暨南國際大學 |
2007 |
Nanoscale bias-annealing effect in postirradiated thin silicon dioxide films observed by conductive atomic force Microscopy
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林式庭?; Lin, ST |
Showing items 605991-606000 of 2348487 (234849 Page(s) Totally) << < 60595 60596 60597 60598 60599 60600 60601 60602 60603 60604 > >> View [10|25|50] records per page
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