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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立臺灣大學 2006 Optical characterization of GaN microcavity fabricated by wet etching Lu, C.-Y.; Wang, S.-L.; Wu, H.-M.; Peng, L.-H.
國立高雄師範大學 2008-02 Optical Characterization of Ge/Si Superlattices with Stacked Nanoripples 李佳任; Jia-Ren Lee;S. C. Lin;C. R. Lu;J. H. Lin;C. T. Chi
國立交通大學 2019-04-02T05:58:39Z Optical Characterization of Gold Nanoblock Dimers: From Capacitive Coupling to Charge Transfer Plasmons and Rod Modes Su, Man-Nung; Sun, Quan; Ueno, Kosei; Chang, Wei-Shun; Misawa, Hiroaki; Link, Stephan
臺大學術典藏 2019-12-27T07:49:07Z Optical characterization of graphene and its derivatives: An experimentalist's perspective Nguyen, D.-T.;Hsieh, Y.-P.;Hofmann, M.; Nguyen, D.-T.; Hsieh, Y.-P.; Hofmann, M.; Mario Hofmann
國立臺灣科技大學 2006 Optical Characterization of II-VI Wide Band Gap Semiconductor Materials 黃鵬仁
國立成功大學 2013-02-01 Optical characterization of InAlAs/InGaAs metamorphic high-electron mobility transistor structures with tensile and compressive strain Chan, Ching-Hsiang; Ho, Ching-Hwa; Chen, Ming-Kai; Lin, Yu-Shyan; Huang, Ying-Sheng; Hsu, Wei-Chou
國立高雄師範大學 2005-11 Optical Characterization of InGaAsN/GaAsN/GaAs Quantum Wells with InGaP Cladding Layers 李佳任; C. R. Lu;H. L. Liu;Jia-Ren Lee;C. H. Wu;H.H Lin
國立臺灣大學 2005 Optical characterization of InGaAsN/GaAsN/GaAs quantum wells with InGaP cladding layers Lu, C.R.; Liu, H.L.; Lee, J.R.; Wu, C.H.; Lin, H.H.; Sung, L.W.
臺大學術典藏 2018-09-10T05:26:30Z Optical characterization of InGaAsN/GaAsN/GaAs quantum wells with InGaP cladding layers C. R. Lu,; H. L. Liu,; J. R. Lee,; C. H. Wu,; H. H. Lin,; L. W. Sung,; HAO-HSIUNG LIN
國立臺灣科技大學 2010 Optical characterization of intersubband transitions in Zn xCd1-xSe/Znx′Cdy′Mg 1-x′-y′Se asymmetric coupled quantum well structures by contactless electroreflectance Wu J.-D.; Huang C.-T.; Huang Y.-S.; Charles W.O.; Shen A.; Zhang Q.; Tamargo M.C.
國立交通大學 2014-12-08T15:46:11Z Optical characterization of isoelectronic ZnSe(1-x)O(x) semiconductors Lin, Y. C.; Chung, H. L.; Ku, J. T.; Chen, C. Y.; Chien, K. F.; Fan, W. C.; Lee, L.; Chyi, J. I.; Chou, W. C.; Chang, W. H.; Chen, W. K.
國立交通大學 2019-04-02T05:58:53Z Optical characterization of isoelectronic ZnSe1-xOx semiconductors Lin, Y. C.; Chung, H. L.; Ku, J. T.; Chen, C. Y.; Chien, K. F.; Fan, W. C.; Lee, L.; Chyi, J. I.; Chou, W. C.; Chang, W. H.; Chen, W. K.
臺大學術典藏 2018-09-10T08:37:16Z Optical characterization of MBE-Grown ZnO epilayers Karaliunas, M.;Serevicius, T.;Kuokstis, E.;Jursenas, S.;Ting, S.Y.;Huang, J.J.;Yang, C.C.; Karaliunas, M.; Serevicius, T.; Kuokstis, E.; Jursenas, S.; Ting, S.Y.; Huang, J.J.; Yang, C.C.; CHIH-CHUNG YANG
國立臺灣科技大學 2007 Optical characterization of niobium-doped rhenium disulphide single crystals Dumcenco, D.O.;Huang, Y.S.;Liang, C.H.;Tiong, K.K.
國立臺灣海洋大學 2007 Optical characterization of niobium-doped rhenium disulphide single crystals D. O. Dumcenco1;Y. S. Huang;C. H. Liang;K. K. Tiong
國立成功大學 2018-03-20 Optical characterization of porcine articular cartilage using a polarimetry technique with differential Mueller matrix formulism Chang;Ching-Min;Lo;Yu-Lung;Tran;Nghia-Khanh;Chang;Yu-Jen
國立臺灣海洋大學 2008-05-22 Optical characterization of quaternary Zn1-x-yBexMgySe mixed crystals D.O. Dumcenco; Y.S. Huang; F. Firszt; S. Legowski; H. Meczynska; K.K. Tiong
國立臺灣科技大學 2015 Optical characterization of strong UV luminescence emitted from the excitonic edge of nickel oxide nanotowers Ho, C.-H.;Kuo, Y.-M.;Chan, Chan C.-H.;Ma, Y.-R.
國立臺灣科技大學 2016 Optical characterization of structural quality in the formation of In2O3 thin-film nanostructures Chan, Chan C.-H;Lin, M.-H;Chao, L.-C;Lee, K.-Y;Tien, L.-C;Ho, C.-H.
臺大學術典藏 2018-09-10T07:09:09Z Optical characterization of subwavelength semiconductor nipple lens array H.-M. Wu,; J.-W. Yu,; C. M. Lai,; H.-C. Chang,; L.-H. Peng,; LUNG-HAN PENG
臺大學術典藏 2019-07-15T04:24:37Z Optical characterization of the Au nanoparticle monolayer on silicon wafer Wang D.-S.;Chuang L.;Lin C.-W.; Wang D.-S.; Chuang L.; Lin C.-W.
國立臺灣科技大學 2009 Optical characterization of thin epitaxial GaAs films on Ge substrates Wu J.D.; Huang Y.S.; Brammertz G.; Tiong K.K.
國立臺灣海洋大學 2009 Optical characterization of thin epitaxial GaAs films on Ge substrates J. D. Wu; Y. S. Huang; G. Brammertz; K. K. Tiong
國立屏東大學 2006 Optical characterization of two-dimensional photonic crystals based on spectroscopic ellipsometry with rigorous coupled-wave analysis 張雯惠;Lin, CH;Chen, HL;Chao, WC;
臺大學術典藏 2006 Optical Characterization of Two-dimensional Photonic Crystals Based on Spectroscopic Ellipsometry with Rigorous Coupled-Wave Analysis Chang, Wen-Huei; Hsieh, Chung-I; Chao, Wen-Chi; Chen, Hsuen-Li; Lin, Chun-Hung; Lin, Chun-Hung; Chen, Hsuen-Li; Chao, Wen-Chi; Hsieh, Chung-I; Chang, Wen-Huei

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