| 國立交通大學 |
2014-12-08T15:46:11Z |
Optical characterization of isoelectronic ZnSe(1-x)O(x) semiconductors
|
Lin, Y. C.; Chung, H. L.; Ku, J. T.; Chen, C. Y.; Chien, K. F.; Fan, W. C.; Lee, L.; Chyi, J. I.; Chou, W. C.; Chang, W. H.; Chen, W. K. |
| 國立交通大學 |
2019-04-02T05:58:53Z |
Optical characterization of isoelectronic ZnSe1-xOx semiconductors
|
Lin, Y. C.; Chung, H. L.; Ku, J. T.; Chen, C. Y.; Chien, K. F.; Fan, W. C.; Lee, L.; Chyi, J. I.; Chou, W. C.; Chang, W. H.; Chen, W. K. |
| 臺大學術典藏 |
2018-09-10T08:37:16Z |
Optical characterization of MBE-Grown ZnO epilayers
|
Karaliunas, M.;Serevicius, T.;Kuokstis, E.;Jursenas, S.;Ting, S.Y.;Huang, J.J.;Yang, C.C.; Karaliunas, M.; Serevicius, T.; Kuokstis, E.; Jursenas, S.; Ting, S.Y.; Huang, J.J.; Yang, C.C.; CHIH-CHUNG YANG |
| 國立臺灣科技大學 |
2007 |
Optical characterization of niobium-doped rhenium disulphide single crystals
|
Dumcenco, D.O.;Huang, Y.S.;Liang, C.H.;Tiong, K.K. |
| 國立臺灣海洋大學 |
2007 |
Optical characterization of niobium-doped rhenium disulphide single crystals
|
D. O. Dumcenco1;Y. S. Huang;C. H. Liang;K. K. Tiong |
| 國立成功大學 |
2018-03-20 |
Optical characterization of porcine articular cartilage using a polarimetry technique with differential Mueller matrix formulism
|
Chang;Ching-Min;Lo;Yu-Lung;Tran;Nghia-Khanh;Chang;Yu-Jen |
| 國立臺灣海洋大學 |
2008-05-22 |
Optical characterization of quaternary Zn1-x-yBexMgySe mixed crystals
|
D.O. Dumcenco; Y.S. Huang; F. Firszt; S. Legowski; H. Meczynska; K.K. Tiong |
| 國立臺灣科技大學 |
2015 |
Optical characterization of strong UV luminescence emitted from the excitonic edge of nickel oxide nanotowers
|
Ho, C.-H.;Kuo, Y.-M.;Chan, Chan C.-H.;Ma, Y.-R. |
| 國立臺灣科技大學 |
2016 |
Optical characterization of structural quality in the formation of In2O3 thin-film nanostructures
|
Chan, Chan C.-H;Lin, M.-H;Chao, L.-C;Lee, K.-Y;Tien, L.-C;Ho, C.-H. |
| 臺大學術典藏 |
2018-09-10T07:09:09Z |
Optical characterization of subwavelength semiconductor nipple lens array
|
H.-M. Wu,; J.-W. Yu,; C. M. Lai,; H.-C. Chang,; L.-H. Peng,; LUNG-HAN PENG |
| 臺大學術典藏 |
2019-07-15T04:24:37Z |
Optical characterization of the Au nanoparticle monolayer on silicon wafer
|
Wang D.-S.;Chuang L.;Lin C.-W.; Wang D.-S.; Chuang L.; Lin C.-W. |
| 國立臺灣科技大學 |
2009 |
Optical characterization of thin epitaxial GaAs films on Ge substrates
|
Wu J.D.; Huang Y.S.; Brammertz G.; Tiong K.K. |
| 國立臺灣海洋大學 |
2009 |
Optical characterization of thin epitaxial GaAs films on Ge substrates
|
J. D. Wu; Y. S. Huang; G. Brammertz; K. K. Tiong |
| 國立屏東大學 |
2006 |
Optical characterization of two-dimensional photonic crystals based on spectroscopic ellipsometry with rigorous coupled-wave analysis
|
張雯惠;Lin, CH;Chen, HL;Chao, WC; |
| 國立屏東大學 |
2005 |
Optical characterization of two-dimensional photonic crystals based on spectroscopic ellipsometry with rigorous coupled-wave analysis
|
張雯惠;CH, Lin;Chen, HL;Chao, WC;Hsieh, CI;Chang, WH. |
| 臺大學術典藏 |
2006 |
Optical Characterization of Two-dimensional Photonic Crystals Based on Spectroscopic Ellipsometry with Rigorous Coupled-Wave Analysis
|
Chang, Wen-Huei; Hsieh, Chung-I; Chao, Wen-Chi; Chen, Hsuen-Li; Lin, Chun-Hung; Lin, Chun-Hung; Chen, Hsuen-Li; Chao, Wen-Chi; Hsieh, Chung-I; Chang, Wen-Huei |
| 國立成功大學 |
2006 |
Optical characterization of two-dimensional photonic crystals based on spectroscopic ellipsometry with rigorous coupled-wave analysis
|
Lin, Chun-Hung; Chen, Hsuen-Li; Chao, Wen-Chi; Hsieh, Chung-I; Chang, Wen-Huei |
| 國立臺灣大學 |
2006 |
Optical Characterization of Two-dimensional Photonic Crystals Based on Spectroscopic Ellipsometry with Rigorous Coupled-Wave Analysis
|
Lin, Chun-Hung; Chen, Hsuen-Li; Chao, Wen-Chi; Hsieh, Chung-I; Chang, Wen-Huei |
| 國立臺灣科技大學 |
2014 |
Optical characterization of undoped and Au-doped MoS2 single crystals
|
Sigiro M., Huang Y.-S., Ho C.-H. |
| 國立臺灣大學 |
1999 |
Optical characterization of visible multiquantum-well semiconductor lasers by collection/excitation modes of scanning near-field optical microscopy
|
Lu, N. H.; Tsai, D. P.; Chang, C. S.; T. T. Tsong |
| 國立臺灣師範大學 |
2014-12-02T06:41:30Z |
Optical Characterization of Wurtzite Gallium Nitride Nanowires
|
M.-W. Lee; H.-Z. Twu; Chia-Chun Chen; C.-H. Chen |
| 國立臺灣科技大學 |
2012 |
Optical characterization of Zn 0.35Cd 0.44Mg 0.21Se crystalline alloy by polarization-dependent contactless electroreflectance measurements
|
Dumcenco, D.;Levcenco, S.;Huang, Y.-S.;Hsu, H.-P.;Firszt, F.;Tiong, K.-K. |
| 國立臺灣海洋大學 |
2012 |
Optical characterization of Zn0.35Cd0.44Mg0.21Se crystalline alloy by polarization-dependent contactless electroreflectance measurements
|
Dumitru Dumcenco; Sergiu Levcenco; Ying-Sheng Huang; Hung-Pin Hsu; Franciszek Firszt; Kwong-Kau Tiong |
| 國立臺灣科技大學 |
2015 |
Optical characterization of Zn0.48Cd0.52Se/Zn0.24Cd0.18Mg0.58Se asymmetric coupled quantum well structure
|
Wu, S.L.;Hsu, H.P.;Wu, Y.F.;Huang, Y.S.;Charles, W.O.;Shen, A.;Tamargo, M.C. |
| 國立臺灣科技大學 |
2009 |
Optical characterization of Zn0.95-x Bex Mn0.05 Se mixed crystals
|
Dumcenco D.O.; Huang C.T.; Huang Y.S.; Firszt F.; Legowski S.; Meczynska H.; Marasek A.; Tiong K.K. |
