| 元智大學 |
2013-07 |
Process Technology of Flexible and Transparent Display by Stacking OLED and PDLC Embedded with OPV
|
Wei-Fu Chang; Cheng-Che Wu; Tien-Lung Chiu; Jiun-Haw Lee |
| 元智大學 |
2013-05-19 |
Process Technology of Flexible and Transparent Display by Stacking OLED and PDLC Embedded with OPV
|
Wei-Fu Chang; Cheng-Che Wu; Tien-Lung Chiu; Chiu; Jiun-Haw Lee |
| 臺大學術典藏 |
2020-06-11T06:17:51Z |
Process technology of flexible and transparent display by stacking OLED and PDLC embedded with OPV
|
Chang, W.-F.;Wu, C.-C.;Chiu, T.-L.;Lee, J.-H.; Chang, W.-F.; Wu, C.-C.; Chiu, T.-L.; Lee, J.-H.; JIUN-HAW LEE |
| 國立臺灣大學 |
2007 |
Process trend monitoring using key sensitive index
|
Jeng, Jyh-Cheng; Su, An-Jhih; Yu, Cheng-Ching; Huang, Hsiao-Ping |
| 國立臺灣科技大學 |
2003 |
Process Variables on the Interfacial Structure Between Diamond and Brazing Alloy
|
S. F. Huang;H. L. Tsai;S. T. Lin |
| 國立交通大學 |
2017-04-21T06:48:19Z |
Process Variation Effect, Metal-Gate Work-Function Fluctuation and Random Dopant Fluctuation of 10-nm Gate-All-Around Silicon Nanowire MOSFET Devices
|
Li, Yiming; Chang, Han-Tung; Lai, Chun-Ning; Chao, Pei-Jung; Chen, Chieh-Yang |
| 臺大學術典藏 |
2007 |
Process Window of BaTiO3–Ni Ferroelectric–Ferromagnetic Composites
|
Tuan, Wei-Hsing; Chen, Shiu-Sheng; Huang, Yung-Ching; Huang, Yung-Ching; Chen, Shiu-Sheng; Tuan, Wei-Hsing |
| 國立臺灣大學 |
2007 |
Process Window of BaTiO3–Ni Ferroelectric–Ferromagnetic Composites
|
Huang, Yung-Ching; Chen, Shiu-Sheng; Tuan, Wei-Hsing |
| 臺大學術典藏 |
2020-05-12T02:53:52Z |
Process window of BaTiO3-Ni ferroelectric-ferromagnetic composites
|
Huang, Y.-C.; Chen, S.-S.; Tuan, W.-H.; WEI-HSING TUAN |
| 國立臺灣科技大學 |
2014 |
Process yield analysis for autocorrelation between linear profiles
|
Wang, F.-K.;Tamirat, Y. |
| 國立臺灣科技大學 |
2015 |
Process Yield Analysis for Linear Within-Profile Autocorrelation
|
Wang, F.-K.;Tamirat, Y. |
| 國立臺灣科技大學 |
2016 |
Process yield analysis for multivariate linear profiles
|
Wang, F.-K. |
| 國立臺灣科技大學 |
2016 |
Process Yield Analysis for Nonlinear Profiles in the Presence of Gauge Measurement Errors
|
Wang, F.-K. |
| 國立臺灣科技大學 |
2013 |
Process yield for a manufactured product
|
Wang, F.-K.;Chu, D. |
| 國立臺灣科技大學 |
2016 |
Process Yield for Multiple Stream Processes with Individual Observations and Subsamples
|
Wang, F.-K. |
| 國立臺灣科技大學 |
2016 |
Process Yield for Multiple Stream Processes with Individual Observations and Subsamples
|
Wang, F.-K. |
| 國立臺灣科技大學 |
2016 |
Process yield for multivariate linear profiles with one-sided specification limits
|
Wang, F.-K.;Tamirat, Y. |
| 國立臺灣科技大學 |
2016 |
Process yield for multivariate linear profiles with one-sided specification limits
|
Wang, F.-K;Tamirat, Y. |
| 亞洲大學 |
2018-12 |
Process Yield Index and Variable Sampling Plans for Autocorrelation between Nonlinear Profiles
|
耶利納;Negash, Yeneneh Tamirat |
| 國立臺灣科技大學 |
2008 |
Process yield with measurement errors in semiconductor manufacturing
|
Wang, F. K. |
| 臺大學術典藏 |
2001 |
Process zone size effects on naturally curving cracks
|
Pettit, R.G.; Chen, C.-S.; Ingraffea, A.R.; Hui, C.-Y.; CHUIN-SHAN CHEN |
| 國立交通大學 |
2014-12-08T15:24:02Z |
Process- and Random-Dopant-Induced Characteristic Variability of SRAM with nano-CMOS and Bulk FinFET Devices
|
Li, Tien-Yeh; Hwang, Chih-Hong; Li, Yiming |
| 國立臺灣海洋大學 |
2012-12 |
Process-Data-Widget: a REST-Based Software Framework for Building Mashup Applications
|
Shang-Pin Ma;Chun-Ying Huang;Yong-Yi Fanjiang;Jong-Yih Kuo |
| 國立交通大學 |
2017-04-21T06:55:39Z |
Process-Dependence Analysis for Characteristic Improvement of Ring Oscillator Using 16-nm Bulk FinFET Devices
|
Su, Ping-Hsun; Li, Yiming |
| 南華大學 |
2013-06 |
Process-induced decision costs on sequential value judgments
|
吳梅君;Wu, Mei-Chun;Kuo, Feng-Yang |
