| 淡江大學 |
2018-08-02 |
Reliability Evaluation with Heterogeneous Sequential Order Statistics for the Burr Type XII Distribution
|
Chiang, JY;Lio, YL;Tsa, Tzong-Ru |
| 國立成功大學 |
2008-01 |
Reliability evaluations for board-level chip-scale packages under coupled power and thermal cycling test conditions
|
Wang, Tong Hong; Lai, Yi-Shao; Lin, Yu-Cheng |
| 國立交通大學 |
2014-12-08T15:01:47Z |
Reliability formulation for composite laminates subjected to first-ply failure
|
Kam, TY; Chang, ES |
| 國立成功大學 |
2024-12 |
Reliability generalization Meta-Analysis and psychometric review of the Gaming Disorder test (GDT): Evaluating internal consistency
|
Jahrami;Haitham;Husain;Waqar;Lin;Chung-Ying;Bjorling;Gunilla;Potenza;Marc, N.;Pakpour;Amir |
| 國立交通大學 |
2019-04-02T06:00:34Z |
Reliability Hardening Mechanisms in Cyber-Physical Digital-Microfluidic Biochips
|
Lu, Guan-Ruei; Banerjee, Ansuman; Bhattacharya, Bhargab B.; Ho, Tsung-Yi; Chen, Hung-Ming |
| 國立中山大學 |
2002 |
Reliability Importance and Invariant Optimal Allocation
|
Fen-Hui Lin;Way Kuo |
| 國立中山大學 |
1996-07-17 |
Reliability Importance of Consecutive-k-out-of-n Systems
|
Fen-Hui Lin;Kuo Way |
| 國立中山大學 |
1998 |
Reliability Importance of Multicomponent Systems
|
Fen-Hui Lin |
| 東海大學 |
2006 |
Reliability improvement experiments with degradation data
|
Joseph V.R., Yu I.-T. |
| 國立成功大學 |
2008-06-25 |
Reliability improvement for an RFID-based psychiatric patient localization system
|
Huang, Chieh-Ling; Chung, Pau-Choo; Tsai, Ming-Hua; Yang, Yen-Kuang; Hsu, Yu-Chia |
| 國立交通大學 |
2018-08-21T05:54:09Z |
Reliability improvement in GaN HEMT power device using a field plate approach
|
Wu, Wen-Hao; Lin, Yueh-Chin; Chin, Ping-Chieh; Hsu, Chia-Chieh; Lee, Jin-Hwa; Liu, Shih-Chien; Maa, Jer-Shen; Iwai, Hiroshi; Chang, Edward Yi; Hsu, Heng-Tung |
| 國立高雄師範大學 |
2011-11 |
Reliability Improvement of 28nm Gate Last High-k/Metal Gate Device with Oxygen Annealing
|
Y.L. Yang;Y.P. Huang;P.T. Chen;W.Q. Zhang;C.Y. Cheng;L.K. Chin;C.W. Hsu;W.K. Yeh; 楊宜霖 |
| 國立高雄師範大學 |
2012-06 |
Reliability Improvement of 28nm High-k/Metal Gate Device by Using Oxygen Annealing
|
Yi-Lin Yang;Wenqi Zhang;Chi-Yun Cheng;Yi-Ping Huang;Pin-Tseng Chen;Li-Kong Chin;Chia-Wei Hsu;Wen-Kuan Yeh; 楊宜霖 |
| 國立高雄師範大學 |
2012-08 |
Reliability Improvement of 28nm High-k/Metal Gate-Last MOSFET using Appropriate Oxygen Annealing
|
Yi-Lin Yang;Wenqi Zhang;Chi-Yun Cheng;Yi-Ping Huang;Pin-Tseng Chen;Chia-Wei Hsu;Li-Kong Chin;Chien-Ting Lin;Che-Hua Hsu;Chien-Ming Lai ;Wen-Kuan Yeh; 楊宜霖 |
| 國立臺灣科技大學 |
2015 |
Reliability improvement of a dual-PMSM speed control system
|
Tseng, S.-K.;Liu, T.-H.;Hsu, J.-W.;Ramelan, L.R.;Firmansyah, E. |
| 國立臺灣師範大學 |
2014-10-30T09:28:16Z |
Reliability improvement of fluorescent lamp using grey forecasting model
|
C.-H. Chiao; W.-Y. Wang |
| 國立交通大學 |
2014-12-08T15:17:54Z |
Reliability Improvement of HfO(2)/SiON Gate Stacked nMOSFET using Fluorinated Silicate Glass Passivation Layer
|
Hsieh, Chih-Ren; Chen, Yung-Yu; Chung, Jer-Fu; Lou, Jen-Chung |
| 國立交通大學 |
2019-04-02T06:04:29Z |
Reliability Improvement of HfO2/SiON Gate Stacked nMOSFET using Fluorinated Silicate Glass Passivation Layer
|
Hsieh, Chih-Ren; Chen, Yung-Yu; Chung, Jer-Fu; Lou, Jen-Chung |
| 國立交通大學 |
2014-12-08T15:22:43Z |
Reliability improvement of InGaZnO thin film transistors encapsulated under nitrogen ambient
|
Wu, Chun-Yu; Cheng, Huang-Chung; Wang, Chao-Lung; Liao, Ta-Chuan; Chiu, Po-Chun; Tsai, Chih-Hung; Fang, Chun-Hsiang; Lee, Chung-Chun |
| 臺大學術典藏 |
2003 |
Reliability Improvement of Rapid Thermal Oxide Using Gas Switching
|
Lee, Min Hung; Yu, Cheng-Ya; Yuan, Fon; Chen, K.-F.; Lai, Chang-Chi; Liu, Chee Wee; Lee, Min Hung; Yu, Cheng-Ya; Yuan, Fon; Chen, K.-F.; Lai, Chang-Chi; Liu, Chee Wee |
| 國立臺灣大學 |
2003 |
Reliability Improvement of Rapid Thermal Oxide Using Gas Switching
|
Lee, Min Hung; Yu, Cheng-Ya; Yuan, Fon; Chen, K.-F.; Lai, Chang-Chi; Liu, Chee Wee |
| 國立成功大學 |
1990-01 |
Reliability Improvement of Tracking Seeking by Using Dynamic testing
|
林志清 |
| 國立臺灣大學 |
1980-01 |
Reliability in psychiatric status rating among mental health professionals: A pilot study with psychiatric status schedule
|
Yeh, E. K.; Yamamoto, J.; Wu, E. C.; Chen, Y. S.; Wangece, S. C.; Chen, M. L.; Ho, S. F. |
| 淡江大學 |
2018-03 |
Reliability inference based on the three-parameter Burr type XII distribution with type II censoring
|
Xin, H;Zhu, J;Sun, J;Zheng, C;Tsai, T-R |
| 淡江大學 |
2020-10 |
Reliability inference for a multicomponent stress-strength model based on Kumaraswamy distribution
|
Liang Wang; Sanku Dey; Yogesh Mani Tripathi; Shuo-JyeWue |
