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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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顯示項目 722101-722110 / 2349128 (共234913頁)
<< < 72206 72207 72208 72209 72210 72211 72212 72213 72214 72215 > >>
每頁顯示[10|25|50]項目
| 臺大學術典藏 |
2021-07-06T08:15:26Z |
Reliability of Sonoelastography Measurement of Tongue Muscles and Its Application on Obstructive Sleep Apnea
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Chu C.-A.; ALEX YUNN-JY CHEN; Chang K.-V.; Wu W.-T.; ?z?akar L. |
| 臺大學術典藏 |
2022-01-27T07:33:54Z |
Reliability of Sonoelastography Measurement of Tongue Muscles and Its Application on Obstructive Sleep Apnea
|
Chu C.-A.; Chen Y.-J.; Chang K.-V.; WEI-TING WU; Özçakar L. |
| 臺大學術典藏 |
2021-05-21T11:40:49Z |
Reliability of Sonoelastography Measurement of Tongue Muscles and Its Application on Obstructive Sleep Apnea
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Chu, Cheng An; ALEX YUNN-JY CHEN; KE-VIN CHANG; Wu, Wei Ting; Özçakar, Levent |
| 臺大學術典藏 |
2022-01-14T06:41:15Z |
Reliability of Sonoelastography Measurement of Tongue Muscles and Its Application on Obstructive Sleep Apnea
|
Chu C.-A.; Chen Y.-J.; KE-VIN CHANG; Wu W.-T.; Özçakar L. |
| 國立交通大學 |
2019-10-05T00:08:41Z |
Reliability of stable fiber Bragg grating sensor system for monitoring temperature and strain individually
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Chang, Yao-Jen; Yeh, Chien-Hung; Chow, Chi-Wai |
| 臺大學術典藏 |
2021-09-13T08:50:27Z |
Reliability of Stiffened-Plated Panels in Offshore Structures
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K. Ma; I. Orisamolu; Kai-Tung MA |
| 國立高雄第一科技大學 |
2008.08 |
Reliability of stiffness measured in glenohumeral joint and its application to assess the effect of end-range mobilization in subjects with adhesive capsulitis
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Lin, Hui-Ting;Hsu, Ar-Tyan;An, Kai-Nan;Chien, Jia-rea Chang;Kuan, Ta-Shen;Chang, Guan-Liang |
| 國立成功大學 |
2008-08 |
Reliability of stiffness measured in glenohumeral joint and its application to assess the effect of end-range mobilization in subjects with adhesive capsulitis
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Lin, Hui-Ting; Hsu, Ar-Tyan; An, Kai-Nan; Chien, Jia-rea Chang; Kuan, Ta-Shen; Chang, Guan-Liang |
| 國立交通大學 |
2014-12-08T15:18:57Z |
Reliability of strained SiGe channel p-channel metal-oxide-semiconductor field-effect transistors with ultra-thin (EOT=3.1nm) N(2)O-annealed SiN gate dielectric
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Chen, CW; Chien, CH; Chen, YC; Hsu, SL; Chang, CY |
| 國立交通大學 |
2019-04-02T06:00:17Z |
Reliability of strained SiGe channel p-channel metal-oxide-semiconductor field-effect transistors with ultra-thin (EOT=3.1nm) N2O-annealed SiN gate dielectric
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Chen, CW; Chien, CH; Chen, YC; Hsu, SL; Chang, CY |
顯示項目 722101-722110 / 2349128 (共234913頁)
<< < 72206 72207 72208 72209 72210 72211 72212 72213 72214 72215 > >>
每頁顯示[10|25|50]項目
|
