| 淡江大學 |
2008-05 |
Test for Exponential Parameter Based on Type-I Censored Data
|
Liang, Tachen; Huang, Wen-Tao; Yang, Kun-Cheng |
| 國立交通大學 |
2014-12-08T15:24:46Z |
Test generation and site of fault for combinational circuits using logic Petri nets
|
Jui-I Tsai; Ching-Cheng Teng; Ching-Hung Lee |
| 國立成功大學 |
2017 |
Test generation for open and delay faults in CMOS circuits
|
Wu, C.-H.;Lee, K.-J.;Reddy, S.M. |
| 臺大學術典藏 |
2018-09-10T09:50:54Z |
Test Generation of Path Delay Faults Induced by Defects in Power TSV
|
Chi-Jih Shih;Shih-An Hsieh;Yi-Chang Lu;James Chien-Mo Li;Tzong-Lin Wu;K. Chakrabarty; Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-11T06:15:26Z |
Test generation of path delay faults induced by defects in power TSV
|
Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K.; Shih, C.-J.; Hsieh, S.-A.; Lu, Y.-C.; Li, J.C.-M.; Wu, T.-L.; Chakrabarty, K.; TZONG-LIN WU |
| 臺大學術典藏 |
2020-06-16T06:36:17Z |
Test generation of path delay faults induced by defects in power TSV
|
Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K.; Shih, C.-J.; Hsieh, S.-A.; Lu, Y.-C.; Li, J.C.-M.; Wu, T.-L.; Chakrabarty, K.; YI-CHANG LU |
| 臺大學術典藏 |
2020-06-29T01:20:10Z |
Test Generation of Path Delay Faults Induced by Defects in Power TSV.
|
Shih, Chi-Jih;Hsieh, Shih-An;Lu, Yi-Chang;Li, James Chien-Mo;Wu, Tzong-Lin;Chakrabarty, Krishnendu; Shih, Chi-Jih; Hsieh, Shih-An; Lu, Yi-Chang; Li, James Chien-Mo; Wu, Tzong-Lin; Chakrabarty, Krishnendu; CHIEN-MO LI |
| 國立臺灣科技大學 |
2016 |
Test interactivity is promising in promoting gender equity in females' pursuit of STEM careers
|
Jeng, H.-L;Liu, G.-F. |
| 臺大學術典藏 |
2020-06-29T01:20:16Z |
Test Methodology for Dual-rail Asynchronous Circuits
|
Huang, K.-Y.;Shen, T.-Y.;Li, C.-M.; Huang, K.-Y.; Shen, T.-Y.; Li, C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:14Z |
Test methodology for PCHB/PCFB Asynchronous Circuits
|
Shen, T.-Y.;Pai, C.-C.;Chen, T.-C.;Li, J.C.-M.;Pan, S.; Shen, T.-Y.; Pai, C.-C.; Chen, T.-C.; Li, J.C.-M.; Pan, S.; CHIEN-MO LI |
| 元智大學 |
2015 |
TEST NEW SQL SERVER 2008 R2
|
Hoder Lee |
| 國立臺灣大學 |
1988 |
Test of 35 Eucalyptus Species in Taiwan
|
姜家華; Chiang, Chia-Hua |
| 國立政治大學 |
2007 |
Test of a model linking employee positive moods and task performance
|
蔡維奇; Chen, Chien-Cheng; Liu, Hui-Lu; Tsai, Wei-Chi; Chen, Chien-Cheng; Liu, Hui-Lu |
| 國立成功大學 |
2017 |
Test of a model of future-oriented self-regulated learning and an examination of the moderating effect of classroom goal structures in the model
|
Peng, S.-L. |
| 臺北醫學大學 |
2005 |
Test of a model to predict adaptive functioning and depression in school-aged children
|
張秀如; Chang HJ; Zauszniewski JA |
| 臺北醫學大學 |
2004 |
Test of a model to predict adaptive functioning and depression in school-aged children
|
張秀如; Chang HJ; Zauszniewski JA; Singh J; Heinzer MMV; Musil CM; |
| 臺北醫學大學 |
2004 |
Test of A Model to Predict Adaptive Functioning and Depression in School-Aged Children
|
張秀如; Chang HJ |
| 臺北醫學大學 |
2004 |
Test of a model to predict adaptive functioning and depression in school-aged children (poster)
|
張秀如; Chang HJ; Lin CC |
| 臺北醫學大學 |
2003 |
Test of a model to predict adaptive functioning and depression in school-aged children (poster)
|
張秀如; Chang HJ; Zauszniewski JA; Singh J; Heinzer M; Musil C; |
| 東海大學 |
2013 |
Test of a multidimensional model linking applicant work experience and recruiters' inferences about applicant competencies
|
Huang, Y.-M.; Chen, C.-C.; Lai, S.-Y. |
| 佛光大學 |
1998-05-01 |
Test of Chinese as a second language: Test construction and vocabulary
|
鄭昭明 |
| 國立臺灣大學 |
1997-11 |
Test of Chinese as a second language: Test construction and vocabulary.
|
Chang, C. M. |
| 南台科技大學 |
2003-12 |
Test of Cosmic Spatial Isotropy for Polarized Electrons Using a Rotatable Torsion Balance
|
李友竹; L. S. Hou; W. T. Ni; Y. C. M. Li |
| 臺大學術典藏 |
2020-03-02T06:39:55Z |
Test of covariance changes without a large sample and its application to fault detection and classification
|
Hung, H.; Chen, A.; ARGON CHEN |
| 臺大學術典藏 |
2022-04-29T03:54:05Z |
Test of covariance changes without a large sample and its application to fault detection and classification
|
Hung Hung; Chen A. |
