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Showing items 98031-98040 of 2349067 (234907 Page(s) Totally)
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| 元智大學 |
2005-03 |
A Comprehensive Study of Digital Divide Phenomenon on Taiwanese Governmental Agencies
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陳啟光; 曾淑芬; Hsin-I Huang |
| 國立成功大學 |
2020-11 |
A comprehensive study of electromigration in pure Sn: Effects on crystallinity, microstructure, and electrical property
|
Liao;Yi-Han;Chen;Chang-Hsien;Liang;Chien-Lung;Lin;Kwang-Lung;Wu;Albert, T. |
| 國立交通大學 |
2020-10-05T02:01:06Z |
A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices
|
Lin, C. -Y.; Chen, P. -H.; Chang, T. -C.; Huang, W. -C.; Tan, Y. -F.; Lin, Y. -H.; Chen, W. -C.; Lin, C. -C.; Chang, Y. -F.; Chen, Y. -C.; Huang, H. -C.; Ma, X. -H.; Hao, Y.; Sze, S. M. |
| 中華大學 |
2004 |
A Comprehensive Study of Fault-Tolerant VLIW Processors
|
陳永源; Chen, Yung-Yuan |
| 國立臺灣大學 |
2001 |
A Comprehensive Study of Gate Inversion Current of Metal-Oxide-Silicon Tunneling diodes
|
Lin, C.-H.; Hsu, B.-C.; Lee, M.H.; Liu, C.W. |
| 國立交通大學 |
2017-04-21T06:49:40Z |
A Comprehensive Study of Ge1-xSix on Ge for the Ge nMOSFETs with Tensile Stress, Shallow Junctions and Reduced Leakage
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Luo, Guang-Li; Huang, Shih-Chiang; Chung, Cheng-Ting; Heh, Dawei; Chien, Chao-Hsin; Cheng, Chao-Ching; Lee, Yao-Jen; Wu, Wen-Fa; Hsu, Chiung-Chih; Kuo, Mei-Ling; Yao, Jay-Yi; Chang, Mao-Nan; Liu, Chee-Wee; Hu, Chenming; Chang, Chun-Yen; Yang, Fu-Liang |
| 臺大學術典藏 |
2018-09-10T07:37:20Z |
A comprehensive study of Ge1-xSix on Ge for the Ge nMOSFETs with tensile stress, shallow junctions and reduced leakage
|
Huang, S.-C.; Chung, C.-T.; Heh, D.; Chien, C.-H.; Cheng, C.-C.; Lee, Y.-J.; Wu, W.-F.; Hsu, C.-C.; Kuo, M.-L.; Yao, J.-Y.; Chang, M.-N.; Liu, C.-W.; Hu, C.; Chang, C.-Y.; Yang, F.-L.; Luo, G.-L.; CHEE-WEE LIU et al. |
| 國立交通大學 |
2014-12-08T15:46:14Z |
A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFET's
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Wang, TH; Chiang, LP; Zous, NK; Hsu, CF; Huang, LY; Chao, TS |
| 臺北醫學大學 |
2004 |
A Comprehensive Study of Insomnia---Prevalence, Measurements, Mechanisms and Cognitive-Behavioral Trial
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蔡佩珊;王美業;楊承憲;王淑怡 |
| 臺大學術典藏 |
2018-09-10T03:48:06Z |
A comprehensive study of inversion current in MOS tunneling diodes
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Lin, C.-H.; Hsu, B.-C.; Lee, M.H.; Liu, C.W.; CHEE-WEE LIU |
Showing items 98031-98040 of 2349067 (234907 Page(s) Totally)
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