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Institution	Date	Title	Author
元智大學	2005-12	Defect detection of backlight panel surfaces using independent component analysis filering scheme	蔡篤銘; Chi-Jie Lu (呂奇傑); Ping-Chieh Lin (林品杰); Yan-Hsin Tseng (曾彥馨)
元智大學	2002-08	Defect detection of gold-plated surfaces on PCBs using entropy measures	蔡篤銘; B. T. Lin
臺大學術典藏	2022-03-22T08:26:00Z	Defect detection of grinded and polished workpieces using faster R-CNN	Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN
臺大學術典藏	2022-03-22T08:28:48Z	Defect detection of grinded and polished workpieces using faster R-CNN	Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN
臺大學術典藏	2022-03-22T08:28:48Z	Defect detection of grinded and polished workpieces using faster R-CNN	Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN
臺大學術典藏	2021-10-21T23:27:23Z	Defect detection of grinded and polished workpieces using faster R-CNN	Liu, Ming Wei; Lin, Yu Heng; Lo, Yuan Chieh; Shih, Chih Hsuan; PEI-CHUN LIN
元智大學	2004-12	Defect Detection of Patterned TFT-LCD Surfaces Using Independent Component Analysis	C.-J. Lu (呂奇傑); 蔡篤銘
元智大學	2012-04	Defect detection of solar cells in electroluminescence images using Fourier image reconstruction	Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li
元智大學	2012-08	Defect detection of solar cells in electroluminescence images using Fourier image reconstruction	Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li
元智大學	2010-03	Defect detection of uneven brightness in low-contrast images using basis image representation	曾彥馨; 蔡篤銘

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