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Institution	Date	Title	Author
元智大學	Aug-15	Defect detection in multi-crystal solar cells using clustering with uniformity measures	Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu
元智大學	Aug-15	Defect detection in multi-crystal solar cells using clustering with uniformity measures	Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu
元智大學	2008-09	Defect detection in periodically patterned surfaces using independent component analysis	蔡篤銘; 賴夏枝
元智大學	Sep-20	Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks	Venkat Anil Adibhatla; Huan-Chuang Chih; Chi-Chang Hsu; Joseph Cheng; Maysam F. Abbod; J.S. Shieh
元智大學	2013-02	Defect Detection in Solar Modules Using ICA Basis Images	Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu
元智大學	2013	Defect Detection in Solar Modules Using ICA Basis Images	Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu
元智大學	2005-12	Defect detection of backlight panel surfaces using independent component analysis filering scheme	蔡篤銘; Chi-Jie Lu (呂奇傑); Ping-Chieh Lin (林品杰); Yan-Hsin Tseng (曾彥馨)
元智大學	2002-08	Defect detection of gold-plated surfaces on PCBs using entropy measures	蔡篤銘; B. T. Lin
臺大學術典藏	2022-03-22T08:28:48Z	Defect detection of grinded and polished workpieces using faster R-CNN	Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN
臺大學術典藏	2022-03-22T08:28:48Z	Defect detection of grinded and polished workpieces using faster R-CNN	Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN

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