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Institution Date Title Author
元智大學 2013 Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學 2013 Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學 2013 Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole Chien, C.; Hsu, Chia-Yu; Chang, K.
元智大學 2013 Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole Chien, C.; Hsu, Chia-Yu; Chang, K.
國立臺灣科技大學 2002 Overall-terminal reliability of a stochastic capacitated-flow network Lin, Yi-Kuei
臺大學術典藏 2021-12-21T23:17:28Z Overbooking for physical examination considering late cancellation and set-resource relationship Ho, Te Wei; LING-CHIEH KUNG; Huang, Hsin Ya; Lai, Jui Fen; HAN-MO CHIU
臺大學術典藏 2022-04-26T06:18:06Z Overbooking for physical examination considering late cancellation and set-resource relationship Ho T.-W;Kung L.-C;Huang H.-Y;Lai J.-F;Chiu H.-M.; Ho T.-W; Kung L.-C; Huang H.-Y; Lai J.-F; Chiu H.-M.; LING-CHIEH KUNG
臺大學術典藏 2022-09-07T07:41:09Z Overbooking for physical examination considering late cancellation and set-resource relationship Ho T.-W.; Kung L.-C.; Huang H.-Y.; Lai J.-F.; HAN-MO CHIU
國立交通大學 2015-05-01T11:12:50Z Overcoating美好色彩底下的真實 高紫娟
臺大學術典藏 2020-02-27T06:39:34Z Overcome the doxorubicin resistance by moltimodal nanoparticles in mice Lai P.S. ;Hsu C.Y. ;Lu H.L. ;Yu H.P. ;Syu W.J. ;Ming-Jium Shieh; Lai P.S.; Hsu C.Y.; Lu H.L.; Yu H.P.; Syu W.J.; MING-JIUM SHIEH

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