|
English
|
正體中文
|
简体中文
|
总笔数 :0
|
|
造访人次 :
52275514
在线人数 :
1092
教育部委托研究计画 计画执行:国立台湾大学图书馆
|
|
|
显示项目 645946-645955 / 2348487 (共234849页)
<< < 64590 64591 64592 64593 64594 64595 64596 64597 64598 64599 > >>
每页显示[10|25|50]项目
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 元智大學 |
2013 |
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole
|
Chien, C.; Hsu, Chia-Yu; Chang, K. |
| 國立臺灣科技大學 |
2002 |
Overall-terminal reliability of a stochastic capacitated-flow network
|
Lin, Yi-Kuei |
| 臺大學術典藏 |
2021-12-21T23:17:28Z |
Overbooking for physical examination considering late cancellation and set-resource relationship
|
Ho, Te Wei; LING-CHIEH KUNG; Huang, Hsin Ya; Lai, Jui Fen; HAN-MO CHIU |
| 臺大學術典藏 |
2022-04-26T06:18:06Z |
Overbooking for physical examination considering late cancellation and set-resource relationship
|
Ho T.-W;Kung L.-C;Huang H.-Y;Lai J.-F;Chiu H.-M.; Ho T.-W; Kung L.-C; Huang H.-Y; Lai J.-F; Chiu H.-M.; LING-CHIEH KUNG |
| 臺大學術典藏 |
2022-09-07T07:41:09Z |
Overbooking for physical examination considering late cancellation and set-resource relationship
|
Ho T.-W.; Kung L.-C.; Huang H.-Y.; Lai J.-F.; HAN-MO CHIU |
| 國立交通大學 |
2015-05-01T11:12:50Z |
Overcoating美好色彩底下的真實
|
高紫娟 |
| 臺大學術典藏 |
2020-02-27T06:39:34Z |
Overcome the doxorubicin resistance by moltimodal nanoparticles in mice
|
Lai P.S. ;Hsu C.Y. ;Lu H.L. ;Yu H.P. ;Syu W.J. ;Ming-Jium Shieh; Lai P.S.; Hsu C.Y.; Lu H.L.; Yu H.P.; Syu W.J.; MING-JIUM SHIEH |
显示项目 645946-645955 / 2348487 (共234849页)
<< < 64590 64591 64592 64593 64594 64595 64596 64597 64598 64599 > >>
每页显示[10|25|50]项目
|
