|
显示项目 475906-475915 / 2348973 (共234898页)
<< < 47586 47587 47588 47589 47590 47591 47592 47593 47594 47595 > >>
每页显示[10|25|50]项目
| 國立政治大學 |
2007-08 |
HOT and the Problem Posed by Anton's Syndrome when accompanied by Hallucinations
|
藍亭;梁益堉 |
| 國立高雄師範大學 |
2003 |
Hot carrier cooling study of ZnCdSe epilayers
|
李孟恩; D. J. Jang;W. C. Chou;C. S. Yang;C. T. Kuo;Meng-En Lee |
| 國立中山大學 |
2003 |
Hot Carrier Cooling Study of ZnCdSe Epilayers
|
D.J. Jang;W.C. Chou;C.S. Yang;C.T. Kuo;M.E. Lee |
| 東海大學 |
2002 |
Hot carrier degradation in deep sub-micron nitride spacer lightly doped drain N-channel metal-oxide-semiconductor transistors
|
Tsai, J.-L.a, Huang, K.-Y.a, Lai, J.-H.b, Gong, J.a, Yang, F.-J.b, Lin, S.-Y.a |
| 國立交通大學 |
2014-12-08T15:25:51Z |
Hot carrier degradation in LDMOS power transistors
|
Cheng, CC; Wu, JW; Lee, CC; Shao, JH; Wang, T |
| 國立交通大學 |
2014-12-08T15:39:25Z |
Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistors
|
Chao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY |
| 國立中山大學 |
2003 |
Hot carrier dynamics of ZnCdSe epilayers
|
D.J. Jang;C.S. Yang;W.C. Chou;K.T Kuo;M.S. Lee |
| 國立交通大學 |
2014-12-08T15:30:23Z |
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
|
Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:24:06Z |
Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks
|
Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:42:33Z |
Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stress
|
Chang, KM; Chung, YH; Lin, GM |
显示项目 475906-475915 / 2348973 (共234898页)
<< < 47586 47587 47588 47589 47590 47591 47592 47593 47594 47595 > >>
每页显示[10|25|50]项目
|
