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機構 日期 題名 作者
國立政治大學 2007-08 HOT and the Problem Posed by Anton's Syndrome when accompanied by Hallucinations 藍亭;梁益堉
國立高雄師範大學 2003 Hot carrier cooling study of ZnCdSe epilayers 李孟恩; D. J. Jang;W. C. Chou;C. S. Yang;C. T. Kuo;Meng-En Lee
國立中山大學 2003 Hot Carrier Cooling Study of ZnCdSe Epilayers D.J. Jang;W.C. Chou;C.S. Yang;C.T. Kuo;M.E. Lee
東海大學 2002 Hot carrier degradation in deep sub-micron nitride spacer lightly doped drain N-channel metal-oxide-semiconductor transistors Tsai, J.-L.a, Huang, K.-Y.a, Lai, J.-H.b, Gong, J.a, Yang, F.-J.b, Lin, S.-Y.a
國立交通大學 2014-12-08T15:25:51Z Hot carrier degradation in LDMOS power transistors Cheng, CC; Wu, JW; Lee, CC; Shao, JH; Wang, T
國立交通大學 2014-12-08T15:39:25Z Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistors Chao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY
國立中山大學 2003 Hot carrier dynamics of ZnCdSe epilayers D.J. Jang;C.S. Yang;W.C. Chou;K.T Kuo;M.S. Lee
國立交通大學 2014-12-08T15:30:23Z Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung
國立交通大學 2014-12-08T15:24:06Z Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung
國立交通大學 2014-12-08T15:42:33Z Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stress Chang, KM; Chung, YH; Lin, GM

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