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顯示項目 306596-306605 / 2348971 (共234898頁)
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| 國立高雄師範大學 |
1989 |
Defect density and the corresponding Activation Energy in Amorphous Dielectric thin films
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林財庫; Tsair-Kuh Lin |
| 中華大學 |
2009 |
Defect Density Extraction of high-κ Dielectric Gate Stack by Combining Charge Pumping and Low Frequency Measurement
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吳建宏; rossiwu |
| 臺大學術典藏 |
2018-09-10T08:40:12Z |
Defect density reduction of the Al 2 O 3/GaAs (001) interface by using H 2 S molecular beam passivation
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Merckling, C;Chang, YC;Lu, CY;Penaud, J;Brammertz, G;Scarrozza, M;Pourtois, G;Kwo, J;Hong, M;Dekoster, J;others; Merckling, C; Chang, YC; Lu, CY; Penaud, J; Brammertz, G; Scarrozza, M; Pourtois, G; Kwo, J; Hong, M; Dekoster, J; others; MINGHWEI HONG |
| 國立交通大學 |
2014-12-08T15:26:43Z |
Defect density reduction of the Al(2)O(3)/GaAs(001) interface by using H(2)S molecular beam passivation
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Merckling, C.; Chang, Y. C.; Lu, C. Y.; Penaud, J.; Brammertz, G.; Scarrozza, M.; Pourtois, G.; Kwo, J.; Hong, M.; Dekoster, J.; Meuris, M.; Heyns, M.; Caymax, M. |
| 國立交通大學 |
2019-04-02T05:58:57Z |
Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation
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Merckling, C.; Chang, Y. C.; Lu, C. Y.; Penaud, J.; Brammertz, G.; Scarrozza, M.; Pourtois, G.; Kwo, J.; Hong, M.; Dekoster, J.; Meuris, M.; Heyns, M.; Caymax, M. |
| 臺大學術典藏 |
2019-12-27T07:49:25Z |
Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation
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Merckling, C.;Chang, Y.C.;Lu, C.Y.;Penaud, J.;Brammertz, G.;Scarrozza, M.;Pourtois, G.;Kwo, J.;Hong, M.;Dekoster, J.;Meuris, M.;Heyns, M.;Caymax, M.; Merckling, C.; Chang, Y.C.; Lu, C.Y.; Penaud, J.; Brammertz, G.; Scarrozza, M.; Pourtois, G.; Kwo, J.; Hong, M.; Dekoster, J.; Meuris, M.; Heyns, M.; Caymax, M.; MINGHWEI HONG |
| 元智大學 |
2005-04 |
Defect detection in colored texture surfaces using Gabor filters
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蔡篤銘; C.-P. Lin (林志賓); K.-T. Huang (黃國唐) |
| 元智大學 |
Jan-19 |
Defect detection in electronic surfaces using template-based Fourier image reconstruction
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Du-Ming Tsai |
| 元智大學 |
2007-12 |
Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction
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蔡篤銘; C. C. Kuo |
| 元智大學 |
2006-08 |
Defect detection in low-contrast glass substrates using anisotropic diffusion
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蔡篤銘; Shin-Min Chao; Yan-Hsin Tseng; Yuan-Ruei Jhang |
顯示項目 306596-306605 / 2348971 (共234898頁)
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