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Showing items 379056-379065 of 2349123 (234913 Page(s) Totally)
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| 國立臺灣大學 |
1995 |
Electrical Crosstalk and Optical Coupling for Packaging a High-Speed Intergrated DFB Laser Array
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王倫; Hwang, J. Y.; Lin, M. S.; Su, C. D.; Wang, L. A.; Hwang, J. Y.; Lin, M. S.; Su, C. D. |
| 國立成功大學 |
2012 |
Electrical Crystallization Mechanism and Interface Characteristics of Nanowire ZnO/Al Structures Fabricated by the Solution Method
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Tseng, Yi-Wei; Hung, Fei-Yi; Lui, Truan-Sheng; Chen, Yen-Ting; Xiao, Ren-Syuan; Chen, Kuan-Jen |
| 國立臺灣大學 |
2009 |
Electrical Current Aging of Mixed-Host Organic Light-Emitting Devices with Thin Doped Layer
|
Lee, Jiun-Haw; Hsiao, Chih-Hung; Tseng, Chin-An |
| 臺大學術典藏 |
2018-09-10T07:36:05Z |
Electrical Current Aging of Mixed-Host Organic Light-Emitting Devices with Thin Doped Layer
|
Lee, Jiun-Haw;Hsiao, Chih-Hung;Tseng, Chin-An; Lee, Jiun-Haw; Hsiao, Chih-Hung; Tseng, Chin-An; Lee, Jiun-Haw |
| 國立成功大學 |
2011-11 |
Electrical current induced mechanism in microstructure and nano-indention of Al-Zn-Mg-Cu (AZMC) Al alloy thin film
|
Hung, Fei-Yi; Liao, Jiunn-Der; Lui, Truan-Sheng; Chen, Li-Hui |
| 國立成功大學 |
2005-08 |
Electrical current phase transformation of Sn-9Zn-1Ag alloy
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Hung, Fei-Yi; Wang, Chih-Jung; Lui, Truan-Sheng; Chen, Li-Hui |
| 國立交通大學 |
2014-12-08T15:36:06Z |
Electrical degradation of N-channel poly-Si TFT under AC stress
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Chen, CW; Chang, TC; Liu, PT; Lu, HY; Tsai, TM; Weng, CF; Hu, CW; Tseng, TY |
| 國立中山大學 |
2005 |
Electrical degradation of n-channel poly-si TFT under AC stress
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C.W. Chen;T.C. Chang;P.T. Liu;H.Y. Lu;C.F. Weng;C.W. Hu;T.Y. Tseng |
| 國立交通大學 |
2014-12-08T15:11:22Z |
Electrical degradation of N-channel poly-Si TFT under AC stress by C-V measurement
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Lu, Hau-Yan; Liu, Po-Tsun; Chang, Ting-Chang; Chi, Sein |
| 國立成功大學 |
1998-10-01 |
Electrical Derivative Characteristics of Ion-implanted AlGaInP/GaInP Multi-quantum Well Lasers
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�Sheu, �Jinn-Kong; Su, Yan-Kuin; Chang,� Shoou-Jinn; Chi, G. C.; Lin, K. B.; Liu, C. C.; Chiu, C. C. |
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