| 國立暨南國際大學 |
2011 |
Electrical characterization of single cells using polysilicon wire ion sensor in an isolation window
|
許博硯; Hsu, PY |
| 國立暨南國際大學 |
2011 |
Electrical characterization of single cells using polysilicon wire ion sensor in an isolation window
|
林錦正; Lin, JJ |
| 國立成功大學 |
2023-05 |
Electrical characterization of sol-gel La2Ti2O7 films for resistive random access memory applications
|
Li;Ming-Jen;Hsu;Tsung-Hsien;Huang;Cheng-Liang |
| 國立臺灣大學 |
1990 |
Electrical Characterization of the Insulating Property of Ta205 in Al-Ta205-Si02-Si Capacitors by a Low-Frequency C/V Technique
|
胡振國; Lin, S. T.; Hwu, Jenn-Gwo; Lin, S. T. |
| 臺大學術典藏 |
2020-01-06T03:11:12Z |
Electrical Characterization of the Insulating Property of Ta2o5 in Al-Ta2o5-Sio2-Si Capacitors by a Low-Frequency C/V Technique
|
Hwu, Jg; Lin, St; SHIANG-TAI LIN |
| 國立中山大學 |
2006 |
Electrical characterization of thermal-annealed very thin barium-doped titanium silicon oxide prepared by liquid-phase deposition
|
Ming-Kwei Lee; Kuan-Wen Tung; Chia-Ming Yu; Hung-Chang Lee |
| 元智大學 |
2013-06-30 |
Electrical Characterization of Transparent Conducting Al-doped ZnO Contact on P-type GaN Films
|
Wen-Cheng Ke; Tsung-Wu Wang; Chih-Yuan Chen |
| 中原大學 |
2007-08 |
Electrical Characterization on Polyaniline Films Made by Various Pressing Pressures
|
Tang, Shiow-Jing;Lin, Shi-Min;Chiu, Kuan-Cheng;Wu, Yu-Yao;Yeh, Jui-Ming |
| 國立成功大學 |
2018-10 |
Electrical characterization studies and doping effects of rubidium carbonate in organic layer by admittance spectroscopy
|
Li;Ming-Chi;Tsai;Chi-Ting;Liu;Ya-Han;Kao;Po-Ching;Chu;Sheng-Yuan |
| 國立交通大學 |
2014-12-08T15:17:34Z |
Electrical characterizations of a controllable field emission triode based on low temperature synthesized ZnO nanowires
|
Lee, CY; Tseng, TY; Li, SY; Lin, P |
| 國立臺灣科技大學 |
2015 |
Electrical characterizations of diodes fabricated on GaN and InGaN films by RF magnetron sputtering
|
THI TRAN ANH TUAN |
| 國立臺灣大學 |
1994 |
Electrical Chemical Potential and π- - π+ Asymmetry in Heavy Ion Collisions
|
Gorenstein, M. I.; Miller, H. G.; Quick, R. M.; 楊信男; Gorenstein, M. I.; Miller, H. G.; Quick, R. M.; Yang, Shin-Nan |
| 國立臺灣大學 |
2004 |
Electrical conductance of carbon nanotori in contact with single-wall carbon nanotubes
|
Chou, Y. Y.; Guo, G.-Y.; Liu, Lei; Jayanthi, C. S.; Wu, S. Y. |
| 臺大學術典藏 |
2019-12-20T01:18:14Z |
Electrical conductance of carbon nanotori in contact with single-wall carbon nanotubes
|
Chou, Y.Y.;Guo, G.-Y.;Liu, L.;Jayanthi, C.S.;Wu, S.Y.; Chou, Y.Y.; Guo, G.-Y.; Liu, L.; Jayanthi, C.S.; Wu, S.Y.; GUANG-YU GUO |
| 臺大學術典藏 |
2019-12-20T01:18:22Z |
Electrical conductance of carbon nanotori in contact with single-wall carbon nanotubes
|
Chou, Y. Y.;Guo, G. Y.;Liu, L.;Jayanthi, C. S.;Wu, S. Y.; Chou, Y. Y.; Guo, G. Y.; Liu, L.; Jayanthi, C. S.; Wu, S. Y.; GUANG-YU GUO |
| 國立臺灣科技大學 |
2014 |
Electrical conduction and mobility enhancement in p-type In-doped Cu 2ZnSnSe4 bulks
|
Kuo, D.-H.;Tsega, M. |
| 國立交通大學 |
2014-12-08T15:31:55Z |
Electrical conduction mechanism of Zn:SiOx resistance random access memory with supercritical CO2 fluid process
|
Chang, Kuan-Chang; Tsai, Tsung-Ming; Zhang, Rui; Chang, Ting-Chang; Chen, Kai-Huang; Chen, Jung-Hui; Young, Tai-Fa; Lou, J. C.; Chu, Tian-Jian; Shih, Chih-Cheng; Pan, Jhih-Hong; Su, Yu-Ting; Syu, Yong-En; Tung, Cheng-Wei; Chen, Min-Chen; Wu, Jia-Jie; Hu, Ying; Sze, Simon M. |
| 國立高雄師範大學 |
2013-08 |
Electrical conduction mechanism of Zn:SiOx resistance random access memory with supercritical CO2 fluid process
|
陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Tsung-Ming Tsai;Rui Zhang;Ting-Chang Chang;Kai-Huang Chen;Jung-Hui Chen;Tai-Fa Young; J. C. Lou;Tian-Jian Chu;Chih-Cheng Shih;Jhih-Hong Pan;Yu-Ting Su;Yong-En Syu; Cheng-Wei Tung;Min-Chen Chen;Jia-Jie Wu;Ying Hu;Simon M. Sze |
| 國立成功大學 |
2013-08-19 |
Electrical conduction mechanism of Zn:SiOx resistance random access memory with supercritical CO2 fluid process
|
Chang, Kuan-Chang; Tsai, Tsung-Ming; Zhang, Rui; Chang, Ting-Chang; Chen, Kai-Huang; Chen, Jung-Hui; Young, Tai-Fa; Lou, J. C.; Chu, Tian-Jian; Shih, Chih-Cheng; Pan, Jhih-Hong; Su, Yu-Ting; Syu, Yong-En; Tung, Cheng-Wei; Chen, Min-Chen; Wu, Jia-Jie; Hu, Ying; Sze, Simon M. |
| 國立交通大學 |
2014-12-08T15:10:09Z |
Electrical conduction mechanisms in natively doped ZnO nanowires
|
Chiu, Shao-Pin; Lin, Yong-Han; Lin, Juhn John |
| 國立交通大學 |
2014-12-08T15:07:03Z |
Electrical conduction mechanisms in natively doped ZnO nanowires (II)
|
Tsai, Lin-Tzung; Chiu, Shao-Pin; Lu, Jia Grace; Lin, Juhn-Jong |
| 國立彰化師範大學 |
1994 |
Electrical Conduction of 326 Cuprates in the Nonmetallic Regime
|
Liu, Chia-Jyi; Koriyama, S. ; Yamauchi, H. |
| 國立交通大學 |
2014-12-08T15:20:48Z |
Electrical conduction processes in ZnO in a wide temperature range 20-500 K
|
Lien, Chien-Chi; Wu, Chih-Yuan; Li, Zhi-Qing; Lin, Juhn-Jong |
| 國立東華大學 |
2009 |
Electrical conductivity and magnetic properties of Li0.5Fe2.5-xCrxO4 ferrite
|
Fu,Yen-Pei |
| 國立臺灣大學 |
2003 |
Electrical conductivity and microstructures of La0.65Sr0.3MnO3–8 mol% yttria-stabilized zirconia
|
Yang, Chih-Chung T.; Wei, Wen-Cheng J.; Roosen, Andreas |
