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Showing items 814026-814035 of 2348955 (234896 Page(s) Totally) << < 81398 81399 81400 81401 81402 81403 81404 81405 81406 81407 > >> View [10|25|50] records per page
| 國立體育大學 |
2008-06-13 |
Test Construction Using Rasch Measurement
|
姚漢禱; Yau, Han-Dau |
| 國立交通大學 |
2014-12-08T15:21:09Z |
Test coverage optimization for large code problems
|
Lin, Ying-Dar; Chou, Chi-Heng; Lai, Yuan-Cheng; Huang, Tse-Yau; Chung, Simon; Hung, Jui-Tsun; Lin, Frank C. |
| 國立臺灣科技大學 |
2012 |
Test coverage optimization for large code problems
|
Lin, Ying-Dar;Chou, Chi-Heng;Lai, Yuan-Cheng;Huang, Tse-Yau;Chung, Simon;Hung, Jui-Tsun;Lin, Frank C. |
| 國立臺灣科技大學 |
2012 |
Test coverage optimization for large code problems
|
Lin, Y.-D.;Chou, C.-H.;Lai, Y.-C.;Huang, T.-Y.;Chung, S.;Hung, J.-T.;Lin, F.C. |
| 國立中山大學 |
2007-08 |
Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture
|
S.J. Wang;P.C. Tsai;H.M. Weng;K.S.M. Li |
| 元智大學 |
2021-08-03 |
Test Data Compression Based on Diamond-Shaped Patterns
|
Fu-Ting Wang; Yu-Chen Hzu; Yung-Chih Chen; Wang-Dauh Tseng |
| 元智大學 |
2021-08-03 |
Test Data Compression Based on Diamond-Shaped Patterns
|
Fu-Ting Wang; Yu-Chen Hzu; Yung-Chih Chen; Wang-Dauh Tseng |
| 元智大學 |
2010-06 |
Test Data Compression Using Multi-dimensional Pattern Run-length Codes
|
曾王道; Lung-Jen Lee |
| 國立成功大學 |
2017-04-05 |
Test decompressor and test method thereof
|
Lee, Kuen-Jong (TW);Chen, Jhen-Zong (TW) |
| 國立臺灣師範大學 |
2015-09-03T01:06:00Z |
Test Designs for Elementary School Students
|
Chen, C.-Y. Doris |
Showing items 814026-814035 of 2348955 (234896 Page(s) Totally) << < 81398 81399 81400 81401 81402 81403 81404 81405 81406 81407 > >> View [10|25|50] records per page
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