| 育達商業科技大學 |
2008 |
Test of Simulated Pseudolite Measurements Applied to GPS and Multi-pseudolite Integrated Positioning
|
樓,壁卿;張,嘉強 |
| 實踐大學 |
2006 |
Test of the contrarian investment strategy-evidence from the Taiwan stock markets
|
Yang, H.L.;Yang, G.G.L.;Su, S.H. |
| 國立臺灣海洋大學 |
2007 |
Test of the performance of age-structured model for striped marlin in the North Pacific
|
Wang S. P.;C. L. Sun;S. Z. Yeh;G. DiNardo;W. C. Chiang;S. K. Chang |
| 國立交通大學 |
2019-04-03T06:37:13Z |
Test of the Practicality and Feasibility of EDoF-Empowered Image Sensors for Long-Range Biometrics
|
Hsieh, Sheng-Hsun; Li, Yung-Hui; Tien, Chung-Hao |
| 國立成功大學 |
1993 |
Test of tokamak low-mode-high-mode transition theory in stellarators
|
Shaing, Ker-Chung |
| 臺大學術典藏 |
2009-01-21T09:51:58Z |
Test of Watershed Acidification Model Responses to Rainfall Intensity
|
Chang, Fi-John; Chang, Fi-John; 張斐章 |
| 國立臺灣大學 |
1996 |
Test of Watershed Acidification Model Responses to Rainfall Intensity
|
張斐章; Chang, Fi-John |
| 國立臺灣大學 |
1982-04 |
Test on Non-shrinking Grout for Bedding Seam Treatment
|
高健章; Kao, C. C. |
| 國立臺灣大學 |
1986-12 |
Test Particle Modeling of Wave-Induced Energetic Electron Precipitation
|
張宏鈞; Inan, U. S.; Chang, Hung-Chun; Inan, U. S. |
| 臺大學術典藏 |
2020-06-29T01:20:11Z |
Test Pattern Compression for Probabilistic Circuits.
|
Chang, Chih-Ming;Yang, Kai-Jie;Li, James Chien-Mo;Chen, Hung; Chang, Chih-Ming; Yang, Kai-Jie; Li, James Chien-Mo; Chen, Hung; CHIEN-MO LI |
| 國立成功大學 |
2003-03 |
Test pattern generation and clock disabling for simultaneous test time and power reduction
|
Chen, Jih-Jeen; Yang, Chia-Kai; Lee, Kuen-Jong |
| 臺大學術典藏 |
2018-09-10T09:50:54Z |
Test Pattern Modification for Average IR-drop Reduction
|
WS Ding;HY Hsieh;JCM Li; WS Ding; HY Hsieh; JCM Li; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:14Z |
Test Pattern Modification for Average IR-Drop Reduction
|
Ding, W.-S.;Hsieh, H.-Y.;Han, C.-Y.;Li, J.C.-M.;Wen, X.; Ding, W.-S.; Hsieh, H.-Y.; Han, C.-Y.; Li, J.C.-M.; Wen, X.; CHIEN-MO LI |
| 東海大學 |
2003-06-23 |
Test Plan Design for Software Configuration Testing
|
Xu, B., Nie, C., Shi, L., Chu, W.C., Yang, H., Chen, H. |
| 臺大學術典藏 |
2020-06-04T07:48:51Z |
Test Plan Generation for Concurrent Real-Time Systems Based on Zone Coverage Analysis.
|
Wang, Farn;Huang, Geng-Dian; Wang, Farn; Huang, Geng-Dian; FARN WANG |
| 元智大學 |
2020/8/4 |
Test Power Reduction by Partially Specified Dual-LFSR Reseeding
|
陳勇志; Yi-An Chen; Wang-Dauh Tseng |
| 中國文化大學 |
1989-07 |
Test Praticle in a 2D Magnetized Plasma--Theory and Simulation
|
黃信健 |
| 臺大學術典藏 |
2022-03-22T15:04:55Z |
Test Problem in Which Bits Used for Fitness Calculation Depend on Bit Pattern
|
Ohnishi, Kei; Koga, Daiki; TIAN-LI YU |
| 國立臺灣大學 |
1984 |
Test Procedure Validation for the TLC Assay of a Degredation Product in a Pharmaceutical Formulation
|
孫紹文; Maillols, H.; Sun, Shao-Wen; Maillols, H. |
| 元智大學 |
2006 |
test proceeding
|
Hoder Lee |
| 國立高雄應用科技大學 |
1996-12 |
Test Process with Recommended Minimum Value of Cpm
|
Lu, Kuen-Horng |
| 國立臺灣大學 |
1992-11 |
Test Reduction in Scan-Designed Circuits
|
Lai, W.; Kung, C.; 林呈祥; Lai, W.; Kung, C.; Lin, Chen-Shang |
| 臺大學術典藏 |
2009-01 |
Test Response Compaction in the Presence of Many Unknowns
|
Laung-Terng Wang; CHIEN-MO LI; Amy Rao; Yi-Chih Sung; James C.-M. Lim; Wei-Che Wang; Wei-Che Wang;James C.-M. Lim;Yi-Chih Sung;Amy Rao;Laung-Terng Wang |
| 國立成功大學 |
2011-10 |
Test Response Compaction via Output Bit Selection
|
Lee, Kuen-Jong; Lien, Wei-Cheng; Hsieh, Tong-Yu |
| 國立臺灣科技大學 |
2004 |
Test results of three excitation systems for generators suffering continuous voltage flicker disturbance
|
Cheng-Ping Huang;Chi-Jui Wu;Yung-Sung Chuang |
