| 國立成功大學 |
2003-03 |
Test pattern generation and clock disabling for simultaneous test time and power reduction
|
Chen, Jih-Jeen; Yang, Chia-Kai; Lee, Kuen-Jong |
| 臺大學術典藏 |
2018-09-10T09:50:54Z |
Test Pattern Modification for Average IR-drop Reduction
|
WS Ding;HY Hsieh;JCM Li; WS Ding; HY Hsieh; JCM Li; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:14Z |
Test Pattern Modification for Average IR-Drop Reduction
|
Ding, W.-S.;Hsieh, H.-Y.;Han, C.-Y.;Li, J.C.-M.;Wen, X.; Ding, W.-S.; Hsieh, H.-Y.; Han, C.-Y.; Li, J.C.-M.; Wen, X.; CHIEN-MO LI |
| 東海大學 |
2003-06-23 |
Test Plan Design for Software Configuration Testing
|
Xu, B., Nie, C., Shi, L., Chu, W.C., Yang, H., Chen, H. |
| 臺大學術典藏 |
2020-06-04T07:48:51Z |
Test Plan Generation for Concurrent Real-Time Systems Based on Zone Coverage Analysis.
|
Wang, Farn;Huang, Geng-Dian; Wang, Farn; Huang, Geng-Dian; FARN WANG |
| 元智大學 |
2020/8/4 |
Test Power Reduction by Partially Specified Dual-LFSR Reseeding
|
陳勇志; Yi-An Chen; Wang-Dauh Tseng |
| 中國文化大學 |
1989-07 |
Test Praticle in a 2D Magnetized Plasma--Theory and Simulation
|
黃信健 |
| 臺大學術典藏 |
2022-03-22T15:04:55Z |
Test Problem in Which Bits Used for Fitness Calculation Depend on Bit Pattern
|
Ohnishi, Kei; Koga, Daiki; TIAN-LI YU |
| 國立臺灣大學 |
1984 |
Test Procedure Validation for the TLC Assay of a Degredation Product in a Pharmaceutical Formulation
|
孫紹文; Maillols, H.; Sun, Shao-Wen; Maillols, H. |
| 元智大學 |
2006 |
test proceeding
|
Hoder Lee |
| 國立高雄應用科技大學 |
1996-12 |
Test Process with Recommended Minimum Value of Cpm
|
Lu, Kuen-Horng |
| 國立臺灣大學 |
1992-11 |
Test Reduction in Scan-Designed Circuits
|
Lai, W.; Kung, C.; 林呈祥; Lai, W.; Kung, C.; Lin, Chen-Shang |
| 臺大學術典藏 |
2009-01 |
Test Response Compaction in the Presence of Many Unknowns
|
Laung-Terng Wang; CHIEN-MO LI; Amy Rao; Yi-Chih Sung; James C.-M. Lim; Wei-Che Wang; Wei-Che Wang;James C.-M. Lim;Yi-Chih Sung;Amy Rao;Laung-Terng Wang |
| 國立成功大學 |
2011-10 |
Test Response Compaction via Output Bit Selection
|
Lee, Kuen-Jong; Lien, Wei-Cheng; Hsieh, Tong-Yu |
| 國立臺灣科技大學 |
2004 |
Test results of three excitation systems for generators suffering continuous voltage flicker disturbance
|
Cheng-Ping Huang;Chi-Jui Wu;Yung-Sung Chuang |
| 國立臺灣大學 |
2004-11 |
Test results of three excitation systems for generators suffering continuous voltage flicker disturbance
|
Huang, Cheng-Ping; Wu, Chi-Jui; Chuang, Yung-Sung |
| 臺大學術典藏 |
2019-07-09T03:52:45Z |
Test sensitivity of mammography and mean sojourn time over 40 years of breast cancer screening in Nijmegen (The Netherlands)
|
Aarts A.M.W.M.; Duffy S.W.; Geurts S.M.E.; Vulkan D.P.; Otten J.D.M.; Hsu C.-Y.; HSIU-HSI CHEN; Verbeek A.L.M.; Broeders M.J.M.; Aarts A.M.W.M.;Duffy S.W.;Geurts S.M.E.;Vulkan D.P.;Otten J.D.M.;Hsu C.-Y.;Hsiu-Hsi Chen;Verbeek A.L.M.;Broeders M.J.M. |
| 臺大學術典藏 |
2022-04-21T06:50:25Z |
Test sensitivity of mammography and mean sojourn time over 40 years of breast cancer screening in Nijmegen (The Netherlands)
|
Aarts A.M.W.M.; Duffy S.W.; Geurts S.M.E.; Vulkan D.P.; Otten J.D.M.; Hsu C.-Y.; Chen, Tony Hsiu Hsi; Verbeek A.L.M.; Broeders M.J.M. |
| 淡江大學 |
1986-08 |
Test sequence generator
|
Ou, Hsien-chang ; Fang, Wu-shiung ; 廖賀田; Liaw, Heh-tyan |
| 國立臺灣大學 |
1986-08 |
Test Sequence Generator
|
Ou, H. C.; 馮武雄; Liaw, H. T.; Ou, H. C.; Feng, Wu-Shiung; Liaw, H. T. |
| 淡江大學 |
1995-11-01 |
Test set compaction for combinational circuits
|
張昭憲; Chang, Jau-shien; Lin, Chen-shang |
| 淡江大學 |
1992-11-26 |
Test set compaction for combinational circuits
|
張昭憲; Chang, Jau-shien; 林呈祥; Lin, Chen-shang |
| 國立臺灣大學 |
1992-11 |
Test set compaction for combinational circuits
|
Chang, Jau-Shien; Lin, Chen-Shang |
| 國立臺灣大學 |
1992-11 |
Test Set Compaction for Combinational Circuits
|
Chang, J.; 林呈祥; Chang, J.; Lin, Chen-Shang |
| 淡江大學 |
2008-11-19 |
Test Slice Difference Technique for Low Power Testing
|
饒建奇 |
