| 國立臺灣大學 |
1992-11 |
Test set compaction for combinational circuits
|
Chang, Jau-Shien; Lin, Chen-Shang |
| 國立臺灣大學 |
1992-11 |
Test Set Compaction for Combinational Circuits
|
Chang, J.; 林呈祥; Chang, J.; Lin, Chen-Shang |
| 淡江大學 |
2008-11-19 |
Test Slice Difference Technique for Low Power Testing
|
饒建奇 |
| 淡江大學 |
2012-06 |
Test Slice Difference Technique for Low-Transition Test Data Compression
|
饒建奇; 吳柏翰; 李威霖 |
| 淡江大學 |
2012-06 |
Test Slice Difference Technique for Low-Transition Test Data Compression
|
Rau, Jiann-Chyi; Wu, Po-Han; Li, Wei-Lin |
| 國立成功大學 |
2017-01 |
Test Stimulus Compression Based on Broadcast Scan With One Single Input
|
Chen;Jhen-Zong;Lee;Kuen-Jong |
| 國立交通大學 |
2014-12-08T15:26:13Z |
Test structure and verification on the MOSFET under bond pad for area-efficient I/O layout in high-pin-count SOCIC's
|
Ker, MD; Peng, JJ; Jiang, HC |
| 國立交通大學 |
2014-12-08T15:09:20Z |
Test structure on SCR device in waffle layout for RE ESD protection
|
Ker, Ming-Dou; Lin, Chun-Yu |
| 國立交通大學 |
2014-12-08T15:25:49Z |
Test structures to verify ESD robustness of on-glass devices in UPS technology
|
Ker, MD; Deng, CK; Yang, SC; Tasi, YM |
| 國立臺灣科技大學 |
1997 |
Test Taiwan's High Home Ownership Rates in the 1980's
|
Wu, Couchen;Hsiu-Li Chen |
| 臺大學術典藏 |
2019-12-10T03:24:45Z |
test test test
|
CHIEN-JU CHIANG |
| 臺北醫學大學 |
2007 |
Test the different surrounding situation of post by resonance frequency.
|
黃豪銘; Chang KZ; Lin CT; Chang WJ; Huang HM |
| 淡江大學 |
1995-01-01 |
Test time reduction for scan-designed circuits by sliding compatibility
|
張昭憲; Chang, Jau-shien; Lin, Chen-shang |
| 淡江大學 |
1994-11-16 |
Test time reduction for scan-designed circuits by sliding compatibility
|
張昭憲; Chang, Jau-shien; 林呈祥; Lin, Chen-shang |
| 國立臺灣大學 |
1994-11 |
Test time reduction for scan-designed circuits by sliding compatibility
|
Chang, Jau-Shien; Lin, Chen-Shang |
| 國立臺灣大學 |
1995-01 |
Test time reduction for scan-designed circuits by sliding compatibility
|
Chang, J.-S.; Lin, C.-S. |
| 國立臺灣大學 |
1994 |
Test Time Reduction for Scan-Designed Circuits by Sliding Compatibility
|
Chang, J. S.; 林呈祥; Chang, J. S.; Lin, Chen-Shang |
| 國立臺灣大學 |
1993-02 |
Test time reduction in scan designed circuits
|
Lai, Wen-Joung; Kung, Chen-Pin; Lin, Chen-Shang |
| 國立臺灣大學 |
1993 |
Test Time Reduction in Scan Designed Circuits
|
Lai, W.; Kung, C.; 林呈祥; Lai, W.; Kung, C.; Lin, Chen-Shang |
| 東海大學 |
2003 |
Test Web applications based on Agent
|
Xu, L., Xu, B.-W., Chen, H.-W., Chu, W., Lin, J.-M., Yang, H.-J. |
| 臺大學術典藏 |
2021-05-20T01:39:35Z |
Test, trace, and isolate in the UK
|
Cheng H.-Y.;Cohen T.;Hsien-Ho Lin; Cheng H.-Y.; Cohen T.; HSIEN-HO LIN |
| 臺大學術典藏 |
2022-04-20T08:55:01Z |
Test, trace, and isolate in the UK
|
Cheng H.-Y.; Cohen T.; HSIEN-HO LIN |
| 臺大學術典藏 |
2018-09-10T08:47:24Z |
Test-Clock Domain Optimization for Peak Power-Supply Noise Reduction During Scan
|
R.Y. Wen; Y.C. Huang; M.H. Tsai; K.Y. Liao; J. C.-M. Li; M.-T. Chang; M.-H. Tsai; C.-M. Tseng; H.-C. Li; CHIEN-MO LI |
| 國立臺灣海洋大學 |
2018 |
Test-Oriented RESTful Service Discovery with Semantic Interface Compatibility
|
Shang-Pin Ma;Ying-Jen Chen;Yang Syu;Hsuan-Ju Lin;Yong-Yi FanJiang |
| 臺大學術典藏 |
2020-04-08T07:35:04Z |
Test-re-test reliability of two sustained attention tests in persons with chronic stroke
|
Chen H.-C.; Koh C.-L.; CHING-LIN HSIEH; Hsueh I.-P. |
