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Showing items 814426-814475 of 2349067 (46982 Page(s) Totally)
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| 淡江大學 |
1996-06 |
Testing Market Efficiency with Respect to Monetary Policy by MARS Approach：The Case of United Kingdom
|
Ni, Yen-Sen |
| 國立臺灣科技大學 |
2015 |
Testing measurement invariance and latent mean differences across gender groups in college students' Internet-specific epistemic beliefs
|
Chiu, Y.-L.;Tsai, C.-C.;Liang, J.-C. |
| 臺大學術典藏 |
2019-12-26T09:43:53Z |
Testing measurement invariance and latent mean differences across gender groups in college students' Internet-specific epistemic beliefs
|
YEN-LIN CHIU; Tsai C.-C.; Liang J.-C. |
| 臺大學術典藏 |
2021-06-04T05:12:44Z |
Testing measurement invariance and latent mean differences across gender groups in college students' Internet-specific epistemic beliefs
|
YEN-LIN CHIU; Tsai C.-C.; Liang J.-C. |
| 國立高雄大學 |
2010-01 |
Testing Method for the Mechanical Properties of Foam Heat Insulation Construction Material
|
童士恒; Shih, M.H.; Sung, W.P.; Shyu, J.G. |
| 淡江大學 |
1991-10 |
Testing methodologies development and selection
|
莊淇銘; Chung, Chi-ming |
| 國立交通大學 |
2014-12-08T15:04:25Z |
Testing Methodology of Embedded DRAMs
|
Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Chen, Ding-Yuan |
| 國立交通大學 |
2014-12-08T15:23:46Z |
Testing Methodology of Embedded DRAMs
|
Yang, Hao-Yu; Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Lin, Shih-Chin |
| 國立交通大學 |
2014-12-08T15:36:45Z |
Testing Methods for a Write-Assist Disturbance-Free Dual-Port SRAM
|
Yang, Hao-Yu; Lin, Chen-Wei; Huang, Chao-Ying; Lu, Ching-Ho; Lai, Chen-An; Chao, Mango C. -T.; Huang, Rei-Fu |
| 國立交通大學 |
2014-12-08T15:37:43Z |
Testing Methods for Detecting Stuck-open Power Switches in Coarse-Grain MTCMOS Designs
|
Mu, Szu-Pang; Wang, Yi-Ming; Yang, Hao-Yu; Chao, Mango C. -T.; Chen, Shi-Hao; Tseng, Chih-Mou; Tsai, Tsung-Ying |
| 國立交通大學 |
2017-04-21T06:49:16Z |
Testing Methods for Quaternary Content Addressable Memory Using Charge-Sharing Sensing Scheme
|
Yang, Hao-Yu; Huang, Rei-Fu; Su, Chin-Lung; Lin, Kuan-Hong; Shu, Hang-Kaung; Peng, Chi-Wei; Chao, Mango C. -T. |
| 國立成功大學 |
2000-08 |
Testing methods for the one-way fixed effects ANOVA models of log-normal samples
|
Guo, Jiin-Huarng; Luh, Wei-Ming |
| 國立屏東大學 |
2000 |
Testing methods for the one-way fixed effects ANOVA models of log-normal samples.
|
郭錦煌;Guo, J.H.;Luh, W.M. |
| 國立屏東大學 |
1999 |
Testing methods for the one-way fixed effects ANOVA models of log-normal samples.
|
郭錦煌;Guo, J.H. |
| 東海大學 |
2009 |
Testing misspecification of the stochastic frontier model with a random effects panel data model
|
Chen, Wen-Den, C. T. Hsiao , J. S. Lin and Y. C. Hsiao; 陳文典; 蕭志同 |
| 國立臺灣科技大學 |
2007 |
Testing multi-characteristic product capability indices
|
Yu, K.T.;Sheu, S.H.;Chen, K.S. |
| 國立政治大學 |
2014.04 |
Testing Municipal Reinvention on the Price of Municipal Governance
|
傅凱若; Hsieh, Jun-Yi;Fu, Kai-Jo |
| 淡江大學 |
1993-02 |
Testing object-iented design modelled by finite state control
|
莊淇銘; Chung, Chi-ming |
| 國立交通大學 |
2014-12-08T15:33:13Z |
Testing of a Low-V-MIN Data-Aware Dynamic-Supply 8T SRAM
|
Lin, Chen-Wei; Huang, Chin-Yuan; Chao, Mango C. -T. |
| 國立臺北護理健康大學 |
2009 |
Testing of a measurement model for baccalaureate nursing students’self-evaluation of core competencies.
|
許麗齡; Hsu, Li-Ling;Hsieh, Suh-Ing |
| 臺大學術典藏 |
2018-09-10T08:45:42Z |
Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments
|
Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garc\\'ia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K\\ohler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; M; i?, I.; Martinez-Mckinney, F.; Mart\\'i I Garcia, S.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi\\~nano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Takahashi, Y.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Hara, K.; Stathes Paganis et al. |
| 臺大學術典藏 |
2019-12-27T01:16:37Z |
Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments
|
Hara, K.;Affolder, A.A.;Allport, P.P.;Bates, R.;Betancourt, C.;Bohm, J.;Brown, H.;Buttar, C.;Carter, J.R.;Casse, G.;Chen, H.;Chilingarov, A.;Cindro, V.;Clark, A.;Dawson, N.;Dewilde, B.;Doherty, F.;Dolezal, Z.;Eklund, L.;Fadeyev, V.;Ferrere, D.;Fox, H.;French, R.;Garc?a, C.;Gerling, M.;Gonzalez Sevilla, S.;Gorelov, I.;Greenall, A.;Grillo, A.A.;Hamasaki, N.;Hatano, H.;Hoeferkamp, M.;Hommels, L.B.A.;Ikegami, Y.;Jakobs, K.;Kierstead, J.;Kodys, P.;K?hler, M.;Kohriki, T.;Kramberger, G.;Lacasta, C.;Li, Z.;Lindgren, S.;Lynn, D.;Maddock, P.;Mandi?, I.;Martinez-Mckinney, F.;Mart? I Garcia, S.;Maunu, R.;McCarthy, R.;Metcalfe, J.;Mikestikova, M.;Miku?, M.;Mi?ano, M.;Mitsui, S.;O'Shea, V.;Parzefall, U.;Sadrozinski, H.F.-W.;Schamberger, D.;Seiden, A.;Terada, S.;Paganis, S.;Robinson, D.;Puldon, D.;Sattari, S.;Seidel, S.;Takahashi, Y.;Toms, K.;Tsionou, D.;Unno, Y.;Von Wilpert, J.;Wormald, M.;Wright, J.;Yamada, M.; Hara, K.; Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garc?a, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K?hler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; Mandi?, I.; Martinez-Mckinney, F.; Mart? I Garcia, S.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi?ano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Takahashi, Y.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Stathes Paganis |
| 國立交通大學 |
2017-04-21T06:48:42Z |
Testing of Digital Microfluidic Biochips with Arbitrary Layouts
|
Trung Anh Dinh; Yamashita, Shigeru; Ho, Tsung-Yi; Chakrabarty, Krishnendu |
| 國立交通大學 |
2015-07-21T11:20:24Z |
Testing of Flow-Based Microfluidic Biochips: Fault Modeling, Test Generation, and Experimental Demonstration
|
Hu, Kai; Yu, Feiqiao; Ho, Tsung-Yi; Chakrabarty, Krishnendu |
| 中原大學 |
1999-12 |
Testing of Lookback Call Options by Using Three Models---Case Studies of United Microelectronic Corporation and Cathy Life Insurance Company
|
胡為善; Hu, Wei-Shan;Tung, Chun-Fu |
| 國立成功大學 |
2018 |
Testing of non-inferiority and superiority for three-arm clinical studies with multiple experimental treatments
|
Zhong, J.;Wen, M.-J.;Kwong, Kwong K.S.;Cheung, S.H. |
| 臺大學術典藏 |
2018-09-10T08:45:42Z |
Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
|
Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferr\\`erre, D.; Fox, H.; French, R.; Garc\\'ia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K\\ohler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lynn, D.; Maddock, P.; M; i?, I.; Martinez-Mckinney, F.; Garcia, S.M.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi\\~nano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Lindgren, S.; Stathes Paganis et al. |
| 臺大學術典藏 |
2019-12-27T01:16:38Z |
Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
|
Seidel, S.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Stathes Paganis; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferr?rre, D.; Fox, H.; French, R.; Garc?a, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K?hler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lynn, D.; Maddock, P.; Mandi?, I.; Martinez-Mckinney, F.; Garcia, S.M.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi?ano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Betancourt, C.; Lindgren, S.; Affolder, A.A.; Allport, P.P.; Bates, R. |
| 臺大學術典藏 |
2018-09-10T15:00:41Z |
Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits
|
C.Y. Kuo;C. J. Shih;J. C. M. Li;K. Chakrabarty; C.Y. Kuo; C. J. Shih; J. C. M. Li; K. Chakrabarty; YI-CHANG LU; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T09:25:31Z |
Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits,
|
C.Y. Kuo;C. J. Shih;J. C. M. Li;K. Chakrabarty; C.Y. Kuo; C. J. Shih; J. C. M. Li; K. Chakrabarty; CHIEN-MO LI |
| 中國文化大學 |
2012-12 |
Testing Oligopolistic Behaviors: Conduct and Cost in Taiwan's Flour Market
|
Ma, TC (Ma, Tay-Cheng) |
| 國立政治大學 |
2014-06 |
Testing Optimal Seigniorage Theory in Taiwan 1965-2012
|
朱琇妍; Chu, Shiou-Yen; 姚名鴻; Yao, Ming-Hung |
| 臺大學術典藏 |
2018-09-10T03:51:39Z |
Testing parameter constancy in models with infinite variance errors
|
CHUNG-MING KUAN; CHUNG-MING KUAN; CHUNG-MING KUAN |
| 國立政治大學 |
2018-11 |
Testing Partisan Effects on Economic Perceptions: A Panel Design Approach
|
黃紀; Huang, Chi |
| 國立政治大學 |
2018-12 |
Testing Partisan Effects on Economic Perceptions: A Panel Design Approach
|
黃紀; Huang, Chi |
| 國立臺北商業大學 |
2006-05 |
Testing Pecking Order Prediction from the Viewpoint of Managerial Optimism---Some Empirical Evidence from Taiwan
|
林岳祥 |
| 國立臺灣大學 |
2007 |
Testing pecking order prediction from the viewpoint of managerial optimism: Some empirical evidence from Taiwan
|
Lin, Y.; Hu, S.; Chen, M. |
| 臺大學術典藏 |
2018-09-10T06:04:39Z |
Testing Pecking Order Prediction from the Viewpoint of Managerial Optimism: Some Empirical Evidence from Taiwan
|
Yueh-hsiang Lin;Shing-yang Hu;Ming-shen Chen; Yueh-hsiang Lin; Shing-yang Hu; Ming-shen Chen; SHING-YANG HU |
| 國立中山大學 |
1970 |
Testing Principles of Language Learning in a Cyber Face-to-Face Environment
|
N.S. Chen;Y. Wang |
| 國立交通大學 |
2014-12-08T15:17:59Z |
Testing process capability based on C-pm in the presence of random measurement errors
|
Pearn, WL; Shu, MH; Hsu, BM |
| 正修科技大學 |
2007-04-20 |
Testing Process Capability Based on Cpm in the Presence of Random Measurement Errors
|
許碧敏 |
| 國立勤益科技大學 |
2002 |
Testing process capability for one-sided specification limit with application to the voltage level translator
|
Lin, P.-C. ; Pearn, W.L. |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Testing process capability for one-sided specification limit with application to the voltage level translator
|
Lin, PC; Pearn, WL |
| 國立勤益科技大學 |
2001 |
Testing process capability using the index Cpmk with an application
|
Pearn, W.L.; Yang, S.L.; Chen, K.S.; Lin, P.C. |
| 國立勤益科技大學 |
2001 |
Testing process capability using the index Cpmk with an application
|
Pearn, W.L. ; Yang, S.-L. ; Chen, K.-S. ; Lin, P.-C. |
| 國立交通大學 |
2014-12-08T15:37:13Z |
Testing process performance based on capability index C-pk with critical values
|
Pearn, WL; Lin, PC |
| 國立交通大學 |
2019-04-02T06:00:17Z |
Testing process performance based on capability index C-pk with critical values
|
Pearn, WL; Lin, PC |
| 國立勤益科技大學 |
2004 |
Testing process performance based on capability indexCpk with critical values
|
Pearn, W.L. ; Lin, P.-C. |
| 國立勤益科技大學 |
2002 |
Testing process performance based on the yield: an application to the liquid-crystal display module
|
Chen, Jann-Pygn ; Pearn, W.L. |
| 國立交通大學 |
2014-12-08T15:42:07Z |
Testing process performance based on the yield: an application to the liquid-crystal display module
|
Chen, JP; Pearn, WL |
Showing items 814426-814475 of 2349067 (46982 Page(s) Totally)
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