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Showing items 814451-814475 of 2349067 (93963 Page(s) Totally)
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| 國立成功大學 |
2018 |
Testing of non-inferiority and superiority for three-arm clinical studies with multiple experimental treatments
|
Zhong, J.;Wen, M.-J.;Kwong, Kwong K.S.;Cheung, S.H. |
| 臺大學術典藏 |
2018-09-10T08:45:42Z |
Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
|
Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferr\\`erre, D.; Fox, H.; French, R.; Garc\\'ia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K\\ohler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lynn, D.; Maddock, P.; M; i?, I.; Martinez-Mckinney, F.; Garcia, S.M.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi\\~nano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Lindgren, S.; Stathes Paganis et al. |
| 臺大學術典藏 |
2019-12-27T01:16:38Z |
Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
|
Seidel, S.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Stathes Paganis; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferr?rre, D.; Fox, H.; French, R.; Garc?a, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K?hler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lynn, D.; Maddock, P.; Mandi?, I.; Martinez-Mckinney, F.; Garcia, S.M.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi?ano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Betancourt, C.; Lindgren, S.; Affolder, A.A.; Allport, P.P.; Bates, R. |
| 臺大學術典藏 |
2018-09-10T15:00:41Z |
Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits
|
C.Y. Kuo;C. J. Shih;J. C. M. Li;K. Chakrabarty; C.Y. Kuo; C. J. Shih; J. C. M. Li; K. Chakrabarty; YI-CHANG LU; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T09:25:31Z |
Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits,
|
C.Y. Kuo;C. J. Shih;J. C. M. Li;K. Chakrabarty; C.Y. Kuo; C. J. Shih; J. C. M. Li; K. Chakrabarty; CHIEN-MO LI |
| 中國文化大學 |
2012-12 |
Testing Oligopolistic Behaviors: Conduct and Cost in Taiwan's Flour Market
|
Ma, TC (Ma, Tay-Cheng) |
| 國立政治大學 |
2014-06 |
Testing Optimal Seigniorage Theory in Taiwan 1965-2012
|
朱琇妍; Chu, Shiou-Yen; 姚名鴻; Yao, Ming-Hung |
| 臺大學術典藏 |
2018-09-10T03:51:39Z |
Testing parameter constancy in models with infinite variance errors
|
CHUNG-MING KUAN; CHUNG-MING KUAN; CHUNG-MING KUAN |
| 國立政治大學 |
2018-11 |
Testing Partisan Effects on Economic Perceptions: A Panel Design Approach
|
黃紀; Huang, Chi |
| 國立政治大學 |
2018-12 |
Testing Partisan Effects on Economic Perceptions: A Panel Design Approach
|
黃紀; Huang, Chi |
| 國立臺北商業大學 |
2006-05 |
Testing Pecking Order Prediction from the Viewpoint of Managerial Optimism---Some Empirical Evidence from Taiwan
|
林岳祥 |
| 國立臺灣大學 |
2007 |
Testing pecking order prediction from the viewpoint of managerial optimism: Some empirical evidence from Taiwan
|
Lin, Y.; Hu, S.; Chen, M. |
| 臺大學術典藏 |
2018-09-10T06:04:39Z |
Testing Pecking Order Prediction from the Viewpoint of Managerial Optimism: Some Empirical Evidence from Taiwan
|
Yueh-hsiang Lin;Shing-yang Hu;Ming-shen Chen; Yueh-hsiang Lin; Shing-yang Hu; Ming-shen Chen; SHING-YANG HU |
| 國立中山大學 |
1970 |
Testing Principles of Language Learning in a Cyber Face-to-Face Environment
|
N.S. Chen;Y. Wang |
| 國立交通大學 |
2014-12-08T15:17:59Z |
Testing process capability based on C-pm in the presence of random measurement errors
|
Pearn, WL; Shu, MH; Hsu, BM |
| 正修科技大學 |
2007-04-20 |
Testing Process Capability Based on Cpm in the Presence of Random Measurement Errors
|
許碧敏 |
| 國立勤益科技大學 |
2002 |
Testing process capability for one-sided specification limit with application to the voltage level translator
|
Lin, P.-C. ; Pearn, W.L. |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Testing process capability for one-sided specification limit with application to the voltage level translator
|
Lin, PC; Pearn, WL |
| 國立勤益科技大學 |
2001 |
Testing process capability using the index Cpmk with an application
|
Pearn, W.L.; Yang, S.L.; Chen, K.S.; Lin, P.C. |
| 國立勤益科技大學 |
2001 |
Testing process capability using the index Cpmk with an application
|
Pearn, W.L. ; Yang, S.-L. ; Chen, K.-S. ; Lin, P.-C. |
| 國立交通大學 |
2014-12-08T15:37:13Z |
Testing process performance based on capability index C-pk with critical values
|
Pearn, WL; Lin, PC |
| 國立交通大學 |
2019-04-02T06:00:17Z |
Testing process performance based on capability index C-pk with critical values
|
Pearn, WL; Lin, PC |
| 國立勤益科技大學 |
2004 |
Testing process performance based on capability indexCpk with critical values
|
Pearn, W.L. ; Lin, P.-C. |
| 國立勤益科技大學 |
2002 |
Testing process performance based on the yield: an application to the liquid-crystal display module
|
Chen, Jann-Pygn ; Pearn, W.L. |
| 國立交通大學 |
2014-12-08T15:42:07Z |
Testing process performance based on the yield: an application to the liquid-crystal display module
|
Chen, JP; Pearn, WL |
Showing items 814451-814475 of 2349067 (93963 Page(s) Totally)
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