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Showing items 814436-814460 of 2349123 (93965 Page(s) Totally)
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View [10|25|50] records per page
| 淡江大學 |
1997-01-01 |
Testing market effciency hypothesis with respect to government policies by frequency decomposition approach
|
倪衍森; Ni, Yen-sen |
| 淡江大學 |
1997-07 |
Testing Market Efficiency Hypothesis with Respect to Government Policies by Frequency Decomposition Approach
|
Ni, Yen-Sen |
| 淡江大學 |
1996 |
Testing market efficiency with respect to monetary policy by MARS approach-the case of united kingdom
|
倪衍森; Ni, Yen-sen |
| 淡江大學 |
1996-06 |
Testing Market Efficiency with Respect to Monetary Policy by MARS Approach：The Case of United Kingdom
|
Ni, Yen-Sen |
| 國立臺灣科技大學 |
2015 |
Testing measurement invariance and latent mean differences across gender groups in college students' Internet-specific epistemic beliefs
|
Chiu, Y.-L.;Tsai, C.-C.;Liang, J.-C. |
| 臺大學術典藏 |
2019-12-26T09:43:53Z |
Testing measurement invariance and latent mean differences across gender groups in college students' Internet-specific epistemic beliefs
|
YEN-LIN CHIU; Tsai C.-C.; Liang J.-C. |
| 臺大學術典藏 |
2021-06-04T05:12:44Z |
Testing measurement invariance and latent mean differences across gender groups in college students' Internet-specific epistemic beliefs
|
YEN-LIN CHIU; Tsai C.-C.; Liang J.-C. |
| 國立高雄大學 |
2010-01 |
Testing Method for the Mechanical Properties of Foam Heat Insulation Construction Material
|
童士恒; Shih, M.H.; Sung, W.P.; Shyu, J.G. |
| 淡江大學 |
1991-10 |
Testing methodologies development and selection
|
莊淇銘; Chung, Chi-ming |
| 國立交通大學 |
2014-12-08T15:04:25Z |
Testing Methodology of Embedded DRAMs
|
Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Chen, Ding-Yuan |
| 國立交通大學 |
2014-12-08T15:23:46Z |
Testing Methodology of Embedded DRAMs
|
Yang, Hao-Yu; Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Lin, Shih-Chin |
| 國立交通大學 |
2014-12-08T15:36:45Z |
Testing Methods for a Write-Assist Disturbance-Free Dual-Port SRAM
|
Yang, Hao-Yu; Lin, Chen-Wei; Huang, Chao-Ying; Lu, Ching-Ho; Lai, Chen-An; Chao, Mango C. -T.; Huang, Rei-Fu |
| 國立交通大學 |
2014-12-08T15:37:43Z |
Testing Methods for Detecting Stuck-open Power Switches in Coarse-Grain MTCMOS Designs
|
Mu, Szu-Pang; Wang, Yi-Ming; Yang, Hao-Yu; Chao, Mango C. -T.; Chen, Shi-Hao; Tseng, Chih-Mou; Tsai, Tsung-Ying |
| 國立交通大學 |
2017-04-21T06:49:16Z |
Testing Methods for Quaternary Content Addressable Memory Using Charge-Sharing Sensing Scheme
|
Yang, Hao-Yu; Huang, Rei-Fu; Su, Chin-Lung; Lin, Kuan-Hong; Shu, Hang-Kaung; Peng, Chi-Wei; Chao, Mango C. -T. |
| 國立成功大學 |
2000-08 |
Testing methods for the one-way fixed effects ANOVA models of log-normal samples
|
Guo, Jiin-Huarng; Luh, Wei-Ming |
| 國立屏東大學 |
2000 |
Testing methods for the one-way fixed effects ANOVA models of log-normal samples.
|
郭錦煌;Guo, J.H.;Luh, W.M. |
| 國立屏東大學 |
1999 |
Testing methods for the one-way fixed effects ANOVA models of log-normal samples.
|
郭錦煌;Guo, J.H. |
| 東海大學 |
2009 |
Testing misspecification of the stochastic frontier model with a random effects panel data model
|
Chen, Wen-Den, C. T. Hsiao , J. S. Lin and Y. C. Hsiao; 陳文典; 蕭志同 |
| 國立臺灣科技大學 |
2007 |
Testing multi-characteristic product capability indices
|
Yu, K.T.;Sheu, S.H.;Chen, K.S. |
| 國立政治大學 |
2014.04 |
Testing Municipal Reinvention on the Price of Municipal Governance
|
傅凱若; Hsieh, Jun-Yi;Fu, Kai-Jo |
| 淡江大學 |
1993-02 |
Testing object-iented design modelled by finite state control
|
莊淇銘; Chung, Chi-ming |
| 國立交通大學 |
2014-12-08T15:33:13Z |
Testing of a Low-V-MIN Data-Aware Dynamic-Supply 8T SRAM
|
Lin, Chen-Wei; Huang, Chin-Yuan; Chao, Mango C. -T. |
| 國立臺北護理健康大學 |
2009 |
Testing of a measurement model for baccalaureate nursing students’self-evaluation of core competencies.
|
許麗齡; Hsu, Li-Ling;Hsieh, Suh-Ing |
| 臺大學術典藏 |
2018-09-10T08:45:42Z |
Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments
|
Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garc\\'ia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K\\ohler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; M; i?, I.; Martinez-Mckinney, F.; Mart\\'i I Garcia, S.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi\\~nano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Takahashi, Y.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Hara, K.; Stathes Paganis et al. |
| 臺大學術典藏 |
2019-12-27T01:16:37Z |
Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments
|
Hara, K.;Affolder, A.A.;Allport, P.P.;Bates, R.;Betancourt, C.;Bohm, J.;Brown, H.;Buttar, C.;Carter, J.R.;Casse, G.;Chen, H.;Chilingarov, A.;Cindro, V.;Clark, A.;Dawson, N.;Dewilde, B.;Doherty, F.;Dolezal, Z.;Eklund, L.;Fadeyev, V.;Ferrere, D.;Fox, H.;French, R.;Garc?a, C.;Gerling, M.;Gonzalez Sevilla, S.;Gorelov, I.;Greenall, A.;Grillo, A.A.;Hamasaki, N.;Hatano, H.;Hoeferkamp, M.;Hommels, L.B.A.;Ikegami, Y.;Jakobs, K.;Kierstead, J.;Kodys, P.;K?hler, M.;Kohriki, T.;Kramberger, G.;Lacasta, C.;Li, Z.;Lindgren, S.;Lynn, D.;Maddock, P.;Mandi?, I.;Martinez-Mckinney, F.;Mart? I Garcia, S.;Maunu, R.;McCarthy, R.;Metcalfe, J.;Mikestikova, M.;Miku?, M.;Mi?ano, M.;Mitsui, S.;O'Shea, V.;Parzefall, U.;Sadrozinski, H.F.-W.;Schamberger, D.;Seiden, A.;Terada, S.;Paganis, S.;Robinson, D.;Puldon, D.;Sattari, S.;Seidel, S.;Takahashi, Y.;Toms, K.;Tsionou, D.;Unno, Y.;Von Wilpert, J.;Wormald, M.;Wright, J.;Yamada, M.; Hara, K.; Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garc?a, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K?hler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; Mandi?, I.; Martinez-Mckinney, F.; Mart? I Garcia, S.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi?ano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Takahashi, Y.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Stathes Paganis |
Showing items 814436-814460 of 2349123 (93965 Page(s) Totally)
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