| 國立臺灣大學 |
2001-01 |
Reliability on the measurements of pressure pain threshold on tender points of muscles
|
Wang, SF; Chen, YC; Lai, IM; Liao, WS |
| 國立臺灣科技大學 |
2009 |
Reliability optimization for a computer network under double-components allocations subject to allocation budget
|
Lin, Yi-Kuei; Yeh, Cheng-Ta |
| 國立臺灣科技大學 |
2011 |
RELIABILITY OPTIMIZATION OF COMPONENT ASSIGNMENT PROBLEM FOR A MULTISTATE NETWORK IN TERMS OF MINIMAL CUTS
|
Lin, Y.K.;Yeh, C.T. |
| 國立交通大學 |
2014-12-08T15:03:33Z |
RELIABILITY OPTIMIZATION OF DISTRIBUTED COMPUTING SYSTEMS SUBJECT TO CAPACITY CONSTRAINTS
|
CHEN, RS; CHEN, DJ; YEH, YS |
| 東海大學 |
1994-07-00 |
Reliability Optimization of Series Systems in Two Different Layouts
|
王文清；呂俊德 |
| 國立成功大學 |
2003-09 |
Reliability polynomials and their asymptotic limits for families of graphs
|
Chang, Shu-Chiuan; Shrock, �Robert |
| 義守大學 |
2006 |
Reliability prediction for 95.5Sn3.9Ag0.6Cu solder bump and thermal design for lead free system in package with polymer-based material
|
Hsiang-Chen Hsu;Wei-Mao Hung |
| 國立交通大學 |
2014-12-08T15:27:42Z |
Reliability prediction of degraded structures via a statistical system identification approach
|
KAM, TY; LEE, TY |
| 國立成功大學 |
1998-04 |
Reliability prediction of imperfect switching systems subject to Weibull failures
|
Pan, Jeh-Nan |
| 國立交通大學 |
2014-12-08T15:22:31Z |
Reliability Properties and Current Conduction Mechanisms of HfO2 MIS Capacitor with Dual Plasma Treatment
|
Chang, Kow-Ming; Chang, Ting-Chia; Chen, Shou-Hsien; Deng, I-Chung |
| 淡江大學 |
2023-08 |
Reliability sampling design for the lifetime performance index of Burr XII lifetime distribution under progressive type I interval censoring
|
Wu, Shu-Fei;Cheng, Yi-Wun;Kang, Che-Wei;Chang, Wei-Tsung |
| 淡江大學 |
2023-09-13 |
Reliability sampling design for the lifetime performance index of Burr XII lifetime distribution under progressive type I interval censoring
|
Wu, S. F.;Cheng, Y. W.;Kang, C. W.;Chang, W. T. |
| 淡江大學 |
2021-08-31 |
Reliability sampling design for the lifetime performance index of Gompertz lifetime distribution under progressive type I interval censoring
|
Wu, S. F.;Xie, Y. J.;Liao, M. F.;Chang, W. T. |
| 淡江大學 |
2008-10 |
Reliability sampling plans for Weibull distribution with limited capacity of test facility
|
蔡宗儒; Tsai, Tzong-ru; 呂玉婷; Lu, Yu-ting; 吳碩傑; Wu,S huo-jye |
| 國立成功大學 |
2008-10 |
Reliability sampling plans for Weibull distribution with limited capacity of test facility
|
Tsai, Tzong-Ru; Lu, Yu-Ting; Wu, Shuo-Jye |
| 淡江大學 |
2008-09-01 |
Reliability Sampling Plans Under Progressive Type-I Interval Censoring Using Cost Functions
|
Huang, Syuan-Rong; Wu, Shuo-Jye |
| 淡江大學 |
2008-09-04 |
Reliability sampling plans under progressive type-I interval censoring using cost functions
|
Huang, S.-R.;Wu, S.-J. |
| 淡江大學 |
2012-12 |
Reliability sampling plans under progressively first-failure censored in presence of cost constraint
|
黃炫融; 吳碩傑 |
| 臺大學術典藏 |
2018-09-10T08:14:25Z |
Reliability screening of a-Si TFT circuits: Very-low voltage and I DDQ Testing
|
Shen, S.-T.;Liu, C.;Ma, E.-H.;Cheng, I.-C.;Li, J.C.-M.; Shen, S.-T.; Liu, C.; Ma, E.-H.; Cheng, I.-C.; Li, J.C.-M.; I-CHUN CHENG; CHIEN-MO LI |
| 國立交通大學 |
2014-12-08T15:04:18Z |
RELIABILITY STUDIES OF 0.85 MU-M VERTICAL-CAVITY SURFACE-EMITTING LASERS - 50000-H MTTF AT 25-DEGREES-C
|
WU, CC; TAI, K; HAUNG, KF |
| 國立交通大學 |
2014-12-08T15:04:10Z |
RELIABILITY STUDIES OF GAIN-GUIDED 0.85 MU-M GAAS/ALGAAS QUANTUM-WELL SURFACE-EMITTING LASERS
|
WU, CC; TAI, K; HUANG, TC; HUANG, KF |
| 南台科技大學 |
2005 |
Reliability studies of Hf-doped and NH3-nitrided gate dielectric for advanced CMOS application
|
C. W. Yang; Y. K. Fang; S. F. Chen; C. S. Lin; C. Y. Lin; W. D. Wang; T. H. Chou; P. J. Lin; M. F. Wang; T. H. Hou; L. G. Yao; S. C. Chen; M. S. Liang;陳世芳;陳順智 |
| 國立成功大學 |
2005-10 |
Reliability studies of Hf-doped and NH3-nitrided gate dielectric for advanced CMOS application
|
Yang, Chih-Wei; Liang, M. S.; Fang, Yean-Kuen; Hou, T. H.; Yao, Liang-Gi; Chen, S. C.; Chen, S. F.; Lin, C. S.; Lin, C. Y.; Wang, W. D.; CHou, T. H.; Lin, P. J. |
| 臺大學術典藏 |
2018-09-10T05:56:14Z |
Reliability studies of wafer-bonded InGaAs PIN photodetectors on GaAs substrates
|
Ejeckam, FE;Chua, CL;Zhu, Z-H;Lo, YH;Hong, Mingyi;Mannaerts, JP;Bhat, Ritesh; Ejeckam, FE; Chua, CL; Zhu, Z-H; Lo, YH; Hong, Mingyi; Mannaerts, JP; Bhat, Ritesh; MINGHWEI HONG |
| 亞洲大學 |
2012 |
Reliability Study of AlN Passivation Effects on AlGaN/GaN HEMT Using Fully-Coupled Self-Consistent Electro-Thermo-Mechanical Analysis
|
Prabowo, Briliant Adhi |
