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Showing items 722176-722185 of 2349128 (234913 Page(s) Totally)
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| 亞洲大學 |
2011 |
Reliability Study of High Resistive N-drift Region LDMOS Device
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Min-Chin Tsai |
| 亞洲大學 |
2010 |
Reliability Study of High Voltage Devices
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Aloysius Priartanto |
| 國立交通大學 |
2017-04-21T06:55:41Z |
Reliability study of high-k La2O3/HfO2 and HfO2/La2O3 stacking layers on n-In0.53Ga0.47As metal-oxide-semiconductor capacitor
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Chu, Chung-Ming; Lin, Yueh-Chin; Lee, Wei-I; Dee, Chang Fu; Wong, Yuen-Yee; Majlis, Burhanuddin Yeop; Salleh, Muhamad Mat; Yap, Seong Ling; Chang, Edward Yi |
| 國立交通大學 |
2017-04-21T06:49:39Z |
Reliability study of InGaP/GaAs HBT for 28V operation
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Chau, Frank Hin-Fai; Lin, Barry Jia-Fu; Chen, Yan; Kretschmar, Mark; Lee, Chien-Ping; Wang, Nan-lei Larry; Sun, Xiaopeng; Ma, Wenlong; Xu, Sarah; Hu, Peter |
| 國立成功大學 |
2011 |
Reliability Study of Ink on Stress in Single Lap Adhesive Joints
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Yen, Yu-Tang;Fang, Te-Hua;Lin, Yu-Cheng |
| 國立臺灣大學 |
2005 |
Reliability Study of Lymphedema Measurement
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蔡涵如; 曹昭懿; TSAI, HAN-JU; TSAUO, JAU-YIH |
| 國立交通大學 |
2017-04-21T06:49:32Z |
Reliability Study of MANOS with and without a SiO2 Buffer Layer and BE-MANOS Charge-Trapping NAND Flash Devices
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Liao, Chien-Wei; Lai, Sheng-Chih; Lue, Hang-Ting; Yang, Ming-Jui; Shen, Chin-Yen; Lue, Yi-Hsien; Huang, Yu-Fong; Hsieh, Jung-Yu; Wang, Szu-Yu; Luo, Guang-Li; Chien, Chao-Hsin; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan |
| 國立臺灣大學 |
2008-01 |
Reliability Study of Measurements for Lymphedema in Breast Cancer Patients
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Chen, YW; Tsai, HJ; Hung, HC; Tsauo, JY |
| 臺大學術典藏 |
2020-06-26T07:31:54Z |
Reliability study of measurements for lymphedema in breast cancer patients
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Chen Y.-W.;Tsai H.-J.;Hung H.-C.;Jau-Yih Tsauo; Chen Y.-W.; Tsai H.-J.; Hung H.-C.; JAU-YIH TSAUO |
| 國立暨南國際大學 |
2007 |
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy
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林式庭?; Lin, ST |
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