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Showing items 722166-722190 of 2349128 (93966 Page(s) Totally)
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| 淡江大學 |
2008-09-01 |
Reliability Sampling Plans Under Progressive Type-I Interval Censoring Using Cost Functions
|
Huang, Syuan-Rong; Wu, Shuo-Jye |
| 淡江大學 |
2008-09-04 |
Reliability sampling plans under progressive type-I interval censoring using cost functions
|
Huang, S.-R.;Wu, S.-J. |
| 淡江大學 |
2012-12 |
Reliability sampling plans under progressively first-failure censored in presence of cost constraint
|
黃炫融; 吳碩傑 |
| 臺大學術典藏 |
2018-09-10T08:14:25Z |
Reliability screening of a-Si TFT circuits: Very-low voltage and I DDQ Testing
|
Shen, S.-T.;Liu, C.;Ma, E.-H.;Cheng, I.-C.;Li, J.C.-M.; Shen, S.-T.; Liu, C.; Ma, E.-H.; Cheng, I.-C.; Li, J.C.-M.; I-CHUN CHENG; CHIEN-MO LI |
| 國立交通大學 |
2014-12-08T15:04:18Z |
RELIABILITY STUDIES OF 0.85 MU-M VERTICAL-CAVITY SURFACE-EMITTING LASERS - 50000-H MTTF AT 25-DEGREES-C
|
WU, CC; TAI, K; HAUNG, KF |
| 國立交通大學 |
2014-12-08T15:04:10Z |
RELIABILITY STUDIES OF GAIN-GUIDED 0.85 MU-M GAAS/ALGAAS QUANTUM-WELL SURFACE-EMITTING LASERS
|
WU, CC; TAI, K; HUANG, TC; HUANG, KF |
| 南台科技大學 |
2005 |
Reliability studies of Hf-doped and NH3-nitrided gate dielectric for advanced CMOS application
|
C. W. Yang; Y. K. Fang; S. F. Chen; C. S. Lin; C. Y. Lin; W. D. Wang; T. H. Chou; P. J. Lin; M. F. Wang; T. H. Hou; L. G. Yao; S. C. Chen; M. S. Liang;陳世芳;陳順智 |
| 國立成功大學 |
2005-10 |
Reliability studies of Hf-doped and NH3-nitrided gate dielectric for advanced CMOS application
|
Yang, Chih-Wei; Liang, M. S.; Fang, Yean-Kuen; Hou, T. H.; Yao, Liang-Gi; Chen, S. C.; Chen, S. F.; Lin, C. S.; Lin, C. Y.; Wang, W. D.; CHou, T. H.; Lin, P. J. |
| 臺大學術典藏 |
2018-09-10T05:56:14Z |
Reliability studies of wafer-bonded InGaAs PIN photodetectors on GaAs substrates
|
Ejeckam, FE;Chua, CL;Zhu, Z-H;Lo, YH;Hong, Mingyi;Mannaerts, JP;Bhat, Ritesh; Ejeckam, FE; Chua, CL; Zhu, Z-H; Lo, YH; Hong, Mingyi; Mannaerts, JP; Bhat, Ritesh; MINGHWEI HONG |
| 亞洲大學 |
2012 |
Reliability Study of AlN Passivation Effects on AlGaN/GaN HEMT Using Fully-Coupled Self-Consistent Electro-Thermo-Mechanical Analysis
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Prabowo, Briliant Adhi |
| 亞洲大學 |
2011 |
Reliability Study of High Resistive N-drift Region LDMOS Device
|
Min-Chin Tsai |
| 亞洲大學 |
2010 |
Reliability Study of High Voltage Devices
|
Aloysius Priartanto |
| 國立交通大學 |
2017-04-21T06:55:41Z |
Reliability study of high-k La2O3/HfO2 and HfO2/La2O3 stacking layers on n-In0.53Ga0.47As metal-oxide-semiconductor capacitor
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Chu, Chung-Ming; Lin, Yueh-Chin; Lee, Wei-I; Dee, Chang Fu; Wong, Yuen-Yee; Majlis, Burhanuddin Yeop; Salleh, Muhamad Mat; Yap, Seong Ling; Chang, Edward Yi |
| 國立交通大學 |
2017-04-21T06:49:39Z |
Reliability study of InGaP/GaAs HBT for 28V operation
|
Chau, Frank Hin-Fai; Lin, Barry Jia-Fu; Chen, Yan; Kretschmar, Mark; Lee, Chien-Ping; Wang, Nan-lei Larry; Sun, Xiaopeng; Ma, Wenlong; Xu, Sarah; Hu, Peter |
| 國立成功大學 |
2011 |
Reliability Study of Ink on Stress in Single Lap Adhesive Joints
|
Yen, Yu-Tang;Fang, Te-Hua;Lin, Yu-Cheng |
| 國立臺灣大學 |
2005 |
Reliability Study of Lymphedema Measurement
|
蔡涵如; 曹昭懿; TSAI, HAN-JU; TSAUO, JAU-YIH |
| 國立交通大學 |
2017-04-21T06:49:32Z |
Reliability Study of MANOS with and without a SiO2 Buffer Layer and BE-MANOS Charge-Trapping NAND Flash Devices
|
Liao, Chien-Wei; Lai, Sheng-Chih; Lue, Hang-Ting; Yang, Ming-Jui; Shen, Chin-Yen; Lue, Yi-Hsien; Huang, Yu-Fong; Hsieh, Jung-Yu; Wang, Szu-Yu; Luo, Guang-Li; Chien, Chao-Hsin; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan |
| 國立臺灣大學 |
2008-01 |
Reliability Study of Measurements for Lymphedema in Breast Cancer Patients
|
Chen, YW; Tsai, HJ; Hung, HC; Tsauo, JY |
| 臺大學術典藏 |
2020-06-26T07:31:54Z |
Reliability study of measurements for lymphedema in breast cancer patients
|
Chen Y.-W.;Tsai H.-J.;Hung H.-C.;Jau-Yih Tsauo; Chen Y.-W.; Tsai H.-J.; Hung H.-C.; JAU-YIH TSAUO |
| 國立暨南國際大學 |
2007 |
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy
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張淙旻?; Chang, TM |
| 國立暨南國際大學 |
2007 |
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy
|
林式庭?; Lin, ST |
| 國立暨南國際大學 |
2007 |
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy
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吳幼麟?; Wu, YL |
| 亞洲大學 |
2012 |
Reliability Study On 5V BCD CMOS Device: New PMOS-NBTI Characterization And HCI Assessment On NMOS Bend Gate Structure
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AMETHYSTNA, SURYA KRIS |
| 國立交通大學 |
2017-04-21T06:49:11Z |
Reliability Study on Tri-Gate Nanowires Poly-Si TFTs under DC and AC Hot-Carrier Stress
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Wu, Yung-Chun; Chen, Hung-Bin; Feng, Li-Wei; Chang, Ting-Chang; Liu, Po-Tsun; Chang, Chun-Yen |
| 亞洲大學 |
2012 |
Reliability test of high voltage SOI device under Hot carrier injection stress
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Magsarsuren, Luvsanperenlei |
Showing items 722166-722190 of 2349128 (93966 Page(s) Totally)
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