臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
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Institution	Date	Title	Author
淡江大學	1993-02	Testing object-iented design modelled by finite state control	莊淇銘; Chung, Chi-ming
國立交通大學	2014-12-08T15:33:13Z	Testing of a Low-V-MIN Data-Aware Dynamic-Supply 8T SRAM	Lin, Chen-Wei; Huang, Chin-Yuan; Chao, Mango C. -T.
國立臺北護理健康大學	2009	Testing of a measurement model for baccalaureate nursing students’self-evaluation of core competencies.	許麗齡; Hsu, Li-Ling;Hsieh, Suh-Ing
臺大學術典藏	2018-09-10T08:45:42Z	Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments	Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garc\\'ia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K\\ohler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; M; i?, I.; Martinez-Mckinney, F.; Mart\\'i I Garcia, S.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi\\~nano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Takahashi, Y.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Hara, K.; Stathes Paganis et al.
臺大學術典藏	2019-12-27T01:16:37Z	Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments	Hara, K.;Affolder, A.A.;Allport, P.P.;Bates, R.;Betancourt, C.;Bohm, J.;Brown, H.;Buttar, C.;Carter, J.R.;Casse, G.;Chen, H.;Chilingarov, A.;Cindro, V.;Clark, A.;Dawson, N.;Dewilde, B.;Doherty, F.;Dolezal, Z.;Eklund, L.;Fadeyev, V.;Ferrere, D.;Fox, H.;French, R.;Garc?a, C.;Gerling, M.;Gonzalez Sevilla, S.;Gorelov, I.;Greenall, A.;Grillo, A.A.;Hamasaki, N.;Hatano, H.;Hoeferkamp, M.;Hommels, L.B.A.;Ikegami, Y.;Jakobs, K.;Kierstead, J.;Kodys, P.;K?hler, M.;Kohriki, T.;Kramberger, G.;Lacasta, C.;Li, Z.;Lindgren, S.;Lynn, D.;Maddock, P.;Mandi?, I.;Martinez-Mckinney, F.;Mart? I Garcia, S.;Maunu, R.;McCarthy, R.;Metcalfe, J.;Mikestikova, M.;Miku?, M.;Mi?ano, M.;Mitsui, S.;O'Shea, V.;Parzefall, U.;Sadrozinski, H.F.-W.;Schamberger, D.;Seiden, A.;Terada, S.;Paganis, S.;Robinson, D.;Puldon, D.;Sattari, S.;Seidel, S.;Takahashi, Y.;Toms, K.;Tsionou, D.;Unno, Y.;Von Wilpert, J.;Wormald, M.;Wright, J.;Yamada, M.; Hara, K.; Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferrere, D.; Fox, H.; French, R.; Garc?a, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K?hler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lindgren, S.; Lynn, D.; Maddock, P.; Mandi?, I.; Martinez-Mckinney, F.; Mart? I Garcia, S.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi?ano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Takahashi, Y.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Stathes Paganis
國立交通大學	2017-04-21T06:48:42Z	Testing of Digital Microfluidic Biochips with Arbitrary Layouts	Trung Anh Dinh; Yamashita, Shigeru; Ho, Tsung-Yi; Chakrabarty, Krishnendu
國立交通大學	2015-07-21T11:20:24Z	Testing of Flow-Based Microfluidic Biochips: Fault Modeling, Test Generation, and Experimental Demonstration	Hu, Kai; Yu, Feiqiao; Ho, Tsung-Yi; Chakrabarty, Krishnendu
中原大學	1999-12	Testing of Lookback Call Options by Using Three Models---Case Studies of United Microelectronic Corporation and Cathy Life Insurance Company	胡為善; Hu, Wei-Shan;Tung, Chun-Fu
國立成功大學	2018	Testing of non-inferiority and superiority for three-arm clinical studies with multiple experimental treatments	Zhong, J.;Wen, M.-J.;Kwong, Kwong K.S.;Cheung, S.H.
臺大學術典藏	2018-09-10T08:45:42Z	Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment	Affolder, A.A.; Allport, P.P.; Bates, R.; Betancourt, C.; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferr\\`erre, D.; Fox, H.; French, R.; Garc\\'ia, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K\\ohler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lynn, D.; Maddock, P.; M; i?, I.; Martinez-Mckinney, F.; Garcia, S.M.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi\\~nano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Seidel, S.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Lindgren, S.; Stathes Paganis et al.
臺大學術典藏	2019-12-27T01:16:38Z	Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment	Seidel, S.; Toms, K.; Tsionou, D.; Unno, Y.; Von Wilpert, J.; Wormald, M.; Wright, J.; Yamada, M.; Stathes Paganis; Bohm, J.; Brown, H.; Buttar, C.; Carter, J.R.; Casse, G.; Chen, H.; Chilingarov, A.; Cindro, V.; Clark, A.; Dawson, N.; Dewilde, B.; Doherty, F.; Dolezal, Z.; Eklund, L.; Fadeyev, V.; Ferr?rre, D.; Fox, H.; French, R.; Garc?a, C.; Gerling, M.; Gonzalez Sevilla, S.; Gorelov, I.; Greenall, A.; Grillo, A.A.; Hamasaki, N.; Hara, K.; Hatano, H.; Hoeferkamp, M.; Hommels, L.B.A.; Ikegami, Y.; Jakobs, K.; Kierstead, J.; Kodys, P.; K?hler, M.; Kohriki, T.; Kramberger, G.; Lacasta, C.; Li, Z.; Lynn, D.; Maddock, P.; Mandi?, I.; Martinez-Mckinney, F.; Garcia, S.M.; Maunu, R.; McCarthy, R.; Metcalfe, J.; Mikestikova, M.; Miku?, M.; Mi?ano, M.; Mitsui, S.; O'Shea, V.; Parzefall, U.; Sadrozinski, H.F.-W.; Schamberger, D.; Seiden, A.; Terada, S.; Paganis, S.; Robinson, D.; Puldon, D.; Sattari, S.; Betancourt, C.; Lindgren, S.; Affolder, A.A.; Allport, P.P.; Bates, R.
臺大學術典藏	2018-09-10T15:00:41Z	Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits	C.Y. Kuo;C. J. Shih;J. C. M. Li;K. Chakrabarty; C.Y. Kuo; C. J. Shih; J. C. M. Li; K. Chakrabarty; YI-CHANG LU; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:31Z	Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits,	C.Y. Kuo;C. J. Shih;J. C. M. Li;K. Chakrabarty; C.Y. Kuo; C. J. Shih; J. C. M. Li; K. Chakrabarty; CHIEN-MO LI
中國文化大學	2012-12	Testing Oligopolistic Behaviors: Conduct and Cost in Taiwan's Flour Market	Ma, TC (Ma, Tay-Cheng)
國立政治大學	2014-06	Testing Optimal Seigniorage Theory in Taiwan 1965-2012	朱琇妍; Chu, Shiou-Yen; 姚名鴻; Yao, Ming-Hung
臺大學術典藏	2018-09-10T03:51:39Z	Testing parameter constancy in models with infinite variance errors	CHUNG-MING KUAN; CHUNG-MING KUAN; CHUNG-MING KUAN
國立政治大學	2018-11	Testing Partisan Effects on Economic Perceptions: A Panel Design Approach	黃紀; Huang, Chi
國立政治大學	2018-12	Testing Partisan Effects on Economic Perceptions: A Panel Design Approach	黃紀; Huang, Chi
國立臺北商業大學	2006-05	Testing Pecking Order Prediction from the Viewpoint of Managerial Optimism---Some Empirical Evidence from Taiwan	林岳祥
國立臺灣大學	2007	Testing pecking order prediction from the viewpoint of managerial optimism: Some empirical evidence from Taiwan	Lin, Y.; Hu, S.; Chen, M.
臺大學術典藏	2018-09-10T06:04:39Z	Testing Pecking Order Prediction from the Viewpoint of Managerial Optimism: Some Empirical Evidence from Taiwan	Yueh-hsiang Lin;Shing-yang Hu;Ming-shen Chen; Yueh-hsiang Lin; Shing-yang Hu; Ming-shen Chen; SHING-YANG HU
國立中山大學	1970	Testing Principles of Language Learning in a Cyber Face-to-Face Environment	N.S. Chen;Y. Wang
國立交通大學	2014-12-08T15:17:59Z	Testing process capability based on C-pm in the presence of random measurement errors	Pearn, WL; Shu, MH; Hsu, BM
正修科技大學	2007-04-20	Testing Process Capability Based on Cpm in the Presence of Random Measurement Errors	許碧敏
國立交通大學	2014-12-08T15:41:39Z	Testing process capability for one-sided specification limit with application to the voltage level translator	Lin, PC; Pearn, WL

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