| 國立勤益科技大學 |
2002 |
Testing process capability for one-sided specification limit with application to the voltage level translator
|
Lin, P.-C. ; Pearn, W.L. |
| 國立勤益科技大學 |
2001 |
Testing process capability using the index Cpmk with an application
|
Pearn, W.L.; Yang, S.L.; Chen, K.S.; Lin, P.C. |
| 國立勤益科技大學 |
2001 |
Testing process capability using the index Cpmk with an application
|
Pearn, W.L. ; Yang, S.-L. ; Chen, K.-S. ; Lin, P.-C. |
| 國立交通大學 |
2014-12-08T15:37:13Z |
Testing process performance based on capability index C-pk with critical values
|
Pearn, WL; Lin, PC |
| 國立交通大學 |
2019-04-02T06:00:17Z |
Testing process performance based on capability index C-pk with critical values
|
Pearn, WL; Lin, PC |
| 國立勤益科技大學 |
2004 |
Testing process performance based on capability indexCpk with critical values
|
Pearn, W.L. ; Lin, P.-C. |
| 國立勤益科技大學 |
2002 |
Testing process performance based on the yield: an application to the liquid-crystal display module
|
Chen, Jann-Pygn ; Pearn, W.L. |
| 國立交通大學 |
2014-12-08T15:42:07Z |
Testing process performance based on the yield: an application to the liquid-crystal display module
|
Chen, JP; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:13:01Z |
Testing process precision for truncated normal distributions
|
Pearn, W. L.; Hung, H. N.; Peng, N. F.; Huang, C. Y. |
| 亞洲大學 |
2019-09 |
Testing process quality of wire bonding with multiple gold wires from viewpoint of producers
|
Tsang-Chuan; Chang, Tsang-Chuan; 陳坤盛 |
| 淡江大學 |
2006-03 |
Testing Quality Assurance Using Process Capability Indices Cpu and Cpl Based on Several Group of Samples with Unequal Sizes
|
Shu, M.H.; Lu, K.H.; Hsu, B.M.; Lou, K. R. |
| 東海大學 |
2011 |
Testing quasi-independence for doubly truncated data
|
Shen, P.-S. |
| 國立交通大學 |
2014-12-08T15:07:55Z |
Testing quasi-independence for truncation data
|
Emura, Takeshi; Wang, Weijing |
| 淡江大學 |
201606 |
Testing radiative neutrino mass generation at the LHC
|
Chen, Chian-Shu; Geng, Chao-Qiang; Ng, John N.; Wu, Jackson M.S. |
| 國立政治大學 |
2000-03 |
Testing Rational Expectations Hypothesis with Agent-Based Model of Stock Markets
|
陳樹衡;C.-H. Yeh;C.-C. Liao |
| 國立政治大學 |
1999 |
Testing Rational Expectations Hypothesis with Agent-Based Models of Stock Markets
|
陳樹衡;C.-H. Yeh;C.-C. Liao |
| 大葉大學 |
2009-03 |
Testing Regime Non-stationarity of the G7 inflation Rates: Evidence from the Markov Switching Unit Root Test
|
Chen, Shyh-Wei;Shen, Chung-Hua |
| 中原大學 |
2009-03 |
Testing Regime Non-stationarity of the G7 inflation Rates: Evidence from the Markov Switching Unit Root Test
|
Chen, S.-W. ;C.-H. Shen |
| 大葉大學 |
2008-11 |
Testing Regime Non-stationarity of the G7 Stock Prices: Evidence from the Markov Switching Unit Root Test
|
Chen, Shyh-Wei |
| 國立高雄大學 |
2006 |
Testing Reliability Assurance Using Capability Indices CPU and CPL Based on Multiple Samples with Variable Sample Size
|
Shu, M.H.; Lu, K.H.; Lou, K.R. |
| 國立交通大學 |
2014-12-08T15:33:13Z |
Testing Retention Flip-flops in Power-gated Designs
|
Hsu, Hao-Wen; Kuo, Shih-Hua; Chang, Wen-Hsiang; Chen, Shi-Hao; Chang, Ming-Tung; Chao, Mango C. -T. |
| 國立臺灣海洋大學 |
2010-08 |
Testing rival measurement models of the Personal Report of Communication Apprehension in two Taiwanese samples
|
Tsung-Yuan Hsia |
| 國立臺灣師範大學 |
2015-09-03T01:06:08Z |
Testing Second Language Acquisition Theories with Data from L2 Learners of Chinese and English
|
陳純音 |
| 國立臺灣大學 |
2002 |
Testing Second-Order Delta-Sigma Modulators using Pseudo-Random Patterns
|
Ong, C. K.; Huang, J. L.; Cheng, K. T. |
| 臺大學術典藏 |
2018-09-10T04:15:41Z |
Testing Second-Order Delta-Sigma Modulators using Pseudo-Random Patterns
|
C. K. Ong; J. L. Huang; K. T. Cheng; JIUN-LANG HUANG |
