| 南台科技大學 |
2006 |
Electrical and Optical Properties of ZnO Films Fabrication by Sol-gel Process
|
林克默; K. Lin; P. Tsai |
| 國立聯合大學 |
2010 |
Electrical and Optical Properties of ZnO-doped Zr0.8Sn0.2TiO4 Thin Films on ITO/Glass Substrates by RF Magnetron Sputtering
|
Cheng-Hsing Hsu*,Hsi-Wen Yang, and Jenn-Sen Lin |
| 國立彰化師範大學 |
2009-04 |
Electrical and Optical Properties of ZnO:Al Film prepared on Polyethersulfone Substrate by RF Magnetron Sputtering
|
Lin, Yi- Cheng; Chen, M. Z. ; Kuo, C. C. ; Yen, W. T. |
| 國立彰化師範大學 |
2005-12 |
Electrical and Optical Properties of ZnO:Al Film prepared on Polyethersulfone Substrate by RF Magnetron Sputtering
|
Chen, M. Z. ; Lin, Yi- Cheng; Kuo, C. C. |
| 國立交通大學 |
2014-12-08T15:09:54Z |
Electrical and optical properties of ZnO:Al thin films grown by magnetron sputtering
|
Bai, Shr-Nan; Tseng, Tseung-Yuen |
| 國立臺灣大學 |
2004-07 |
Electrical and optical reliability improvement of HfO2 gate dielectric by deuterium and hydrogen incorporation
|
Yu, C.-Y.; Chen, T.C.; Lee, M.H.; Huang, S.-H.; Lee, L.S.; Liu, C.W. |
| 臺大學術典藏 |
2018-09-10T04:55:29Z |
Electrical and optical reliability improvement of HfO2 gate dielectric by deuterium and hydrogen incorporation
|
Yu, C.-Y.; Chen, T.C.; Lee, M.H.; Huang, S.-H.; Lee, L.S.; Liu, C.W.; CHEE-WEE LIU |
| 國立臺灣科技大學 |
2007 |
Electrical and optical simulation of organic light-emitting devices with fluorescent dopant in the emitting layer
|
Lee, C.-C.;Chang, M.-Y.;Huang, P.-T.;Chen, Y.C.;Chang, Y.;Liu, S.-W. |
| 義守大學 |
2005 |
Electrical and optical studies of emissive hole transport materials in white organic light emitting diodes
|
Yokoyama, Meiso; Chen, Guan-Ting; Su, Shui-Hsiang; Kwo, Jon-Lian |
| 南亞技術學院 |
2013-01 |
Electrical and optical studies of Ga-doped ZnO thin films
|
Hsu, Hsiu-Ling;Yang, Ching-Been;Huang, Chia-Ho |
| 國立臺灣大學 |
2009 |
Electrical and Optoelectronic Characterization of a ZnO Nanowire Contacted by Focused-Ion-Beam-Deposited Pt
|
He, J.H.; Chang, P.H.; Chen, C.Y.; Tsai, K.T. |
| 國立臺灣大學 |
2007 |
Electrical and Photoelectrical Performances of Nano-Photodiode Based on ZnO Nanowires
|
He, Jr Hau; Ho, Shu Te; Wu, Tai Bor; Chen, Lih Juann; Wang, Zhong Lin |
| 國立交通大學 |
2014-12-08T15:11:49Z |
Electrical and Photosensitive Characteristics of a-IGZO TFTs Related to Oxygen Vacancy
|
Yao, Jianke; Xu, Ningsheng; Deng, Shaozhi; Chen, Jun; She, Juncong; Shieh, Han-Ping David; Liu, Po-Tsun; Huang, Yi-Pai |
| 國立成功大學 |
2011-11 |
Electrical and Photosensivity Characteristics of Hybrid/Composite ZnO Nanorod Transistors
|
Peng, Shi-Ming; Su, Yan-Kuin; Ji, Liang-Wen |
| 東方設計學院 |
2011-07-15 |
Electrical and Physical Characteristics of Lix(KyNa1-y)1-x(Nb0.9Ta0.06Sb0.04)O3 Lead-free Piezoelectric Ceramics
|
Kai-Huang Chen; Chien-Min Cheng; Ming-Chang Kuan; Jen-Hwan Tsai; (東方設計學院電子與資訊系) |
| 東方設計學院 |
2011-05 |
Electrical and Physical Properties of Sodium Potassium Niobates Thin Films Prepared by rf Magnetron Sputtering Technology
|
Cheng, Chien-Min; Chen, Shin-Fang; Tsai, Jen-Hwan; Chen, Kai-Huang; Su, Hsiu-Hsien; (東方設計學院電子與資訊系) |
| 國立交通大學 |
2014-12-08T15:26:17Z |
Electrical and reliability characteristics of 1nm ultrathin oxynitride gate dielectric prepared by RTP
|
Yang, WC; Chen, CF; Chang, KM |
| 國立臺灣科技大學 |
2009 |
Electrical and Reliability Characteristics of Barrierless Cu-Based Contact for High Dielectric Constant Oxide Thin-Film Device Integration
|
Wu, C.H.;Chu, J.P.;Lin, C.H.;Wang, S.F. |
| 國立成功大學 |
2004-03-25 |
Electrical and reliability characteristics of oxynitride gate dielectric grown by diluted steam rapid thermal oxidation and annealed in nitric oxide
|
Liu, C. H.; Chang, Shoou-Jinn; Chen, Jone-Fang; Lee, J. S.; Chen, S. C.; Liaw, U. H. |
| 國立交通大學 |
2014-12-08T15:22:42Z |
Electrical and reliability characteristics of polycrystalline silicon thin-film transistors with high-kappa Eu2O3 gate dielectrics
|
Yen, Li-Chen; Hu, Chia-Wei; Chiang, Tsung-Yu; Chao, Tien-Sheng; Pan, Tung-Ming |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Electrical and reliability improvement in polyoxide by fluorine implantation
|
Kao, Chyuan Haur; Lai, Chao Sung; Lee, Chung Len |
| 國立交通大學 |
2014-12-08T15:28:43Z |
Electrical and Reliability Investigation of Cu TSVs With Low-Temperature Cu/Sn and BCB Hybrid Bond Scheme
|
Chang, Yao-Jen; Ko, Cheng-Ta; Chen, Kuan-Neng |
| 國立暨南國際大學 |
2010 |
Electrical and reliability performances of nitrogen-incorporated silicon carbide dielectric by chemical vapor deposition
|
陳炫安?; Chen, SA |
| 國立暨南國際大學 |
2010 |
Electrical and reliability performances of nitrogen-incorporated silicon carbide dielectric by chemical vapor deposition
|
鄭義榮?; Cheng, YL |
| 國立暨南國際大學 |
2010 |
Electrical and reliability performances of nitrogen-incorporated silicon carbide dielectric by chemical vapor deposition
|
邱泰榮?; Chiu, TJ |
