| 國立交通大學 |
2014-12-08T15:18:32Z |
Electrical Behavior of BaO-Nd2O3-SM2O3-TiO2 with glass/oxide additives analyzed by impedance spectroscopy
|
Chang, LC; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:05:36Z |
ELECTRICAL BEHAVIOR OF CERIA-STABILIZED ZIRCONIA WITH RARE-EARTH-OXIDE ADDITIVES
|
CHIOU, BS; DAI, HT; DUH, JG |
| 國立交通大學 |
2014-12-08T15:04:02Z |
ELECTRICAL BEHAVIOR OF LOW-POWER RF MAGNETRON-SPUTTERED INDIUM TIN OXIDE-FILMS ON SILICON SUBSTRATE
|
CHIOU, BS; HSIEH, ST; WU, WF |
| 國立交通大學 |
2014-12-08T15:04:37Z |
ELECTRICAL BEHAVIOR OF THE MNO2-DOPED ZNO-BI2O3 SYSTEM
|
CHIOU, BS; CHUNG, MC |
| 元智大學 |
2014-05-07 |
Electrical benefits of Cu(In,Ga)Se2 nanotip arrays for efficiency enhancement
|
Yu-Kuang Liao; Yi-Chung Wang; Yu-Ting Yen; Dan-Hua Hsieh; Shih-Chen Chen; Chih-Chung Lai; Chih-Huang Lai; Fang-I Lai; Shou-Yi Kuo; Hao-Chung Kuo; Yu-Lun Chueh |
| 元智大學 |
2014-05-07 |
Electrical benefits of Cu(In,Ga)Se2 nanotip arrays for efficiency enhancement
|
Yu-Kuang Liao; Yi-Chung Wang; Yu-Ting Yen; Dan-Hua Hsieh; Shih-Chen Chen; Chih-Chung Lai; Chih-Huang Lai; Fang-I Lai; Shou-Yi Kuo; Hao-Chung Kuo; Yu-Lun Chueh |
| 元智大學 |
2014-05-07 |
Electrical benefits of Cu(In,Ga)Se2 nanotip arrays for efficiency enhancement
|
Yu-Kuang Liao; Yi-Chung Wang; Yu-Ting Yen; Dan-Hua Hsieh; Shih-Chen Chen; Chih-Chung Lai; Chih-Huang Lai; Fang-I Lai; Shou-Yi Kuo; Hao-Chung Kuo; Yu-Lun Chueh |
| 國立成功大學 |
2011-09 |
Electrical biopsy of irradiated intestinal tissue with a simple electrical impedance spectroscopy system for radiation enteropathy in rats-a pilot study
|
Huang, Yu-Jie; Huang, Eng-Yen; Lu, Yi-Yu; Chen, Cheng-Yu; Cheng, Kuo-Sheng |
| 國立交通大學 |
2019-10-05T00:08:37Z |
Electrical bistabilities behaviour of all-solution-processed non-volatile memories based on graphene quantum dots embedded in graphene oxide layers
|
Jaafar, Muhammad Musoddiq; Ooi, Poh Choon; Wee, M. F. Mohd. Razip; Haniff, Muhammad Aniq Shazni Mohammad; Mohamed, Mohd Ambri; Chang, Edward Yi; Majlis, Burhanuddin Yeop; Dee, Chang Fu |
| 國立成功大學 |
2008-10-13 |
Electrical bistability and charge transport behavior in Au nanoparticle/poly(N-vinylcarbazole) hybrid memory devices
|
Lai, Pei Ying; Chen, Jen-Sue |
| 國立聯合大學 |
2010 |
Electrical bistability of polystyrene thin films embedded with low-dimensional nanostructures
|
You-Yuan Lin, Jyh-Liang Wang, and Yi-Sheng Lai*, |
| 國立交通大學 |
2014-12-08T15:10:38Z |
Electrical bistable memory device based on a poly(styrene-b-4-vinylpyridine) nanostructured diblock copolymer thin film
|
Huang, Ching-Mao; Liu, Yung-Sheng; Chen, Chen-Chia; Wei, Kung-Hwa; Sheu, Jeng-Tzong |
| 國立交通大學 |
2014-12-16T06:15:01Z |
ELECTRICAL CALIBRATED RADIOMETER
|
HOU Kuan-Chou; Ou-Yang Mang; Chiou Jin-Chern |
| 臺北醫學大學 |
2015-06-04 |
Electrical Cardiometry in 24-hour ultra-marathon performance
|
Chang, Ming-Long; 張明龍 |
| 臺大學術典藏 |
1990-10 |
Electrical characterisation of the insulating property of Ta2O5 in Al-Ta2O5-SiO2-Si capacitors by a low-frequency
|
Hwu, J.-G.; Lin, S.-T.; Hwu, J.-G.; Lin, S.-T.; HwuJG |
| 國立臺灣大學 |
1990-10 |
Electrical characterisation of the insulating property of Ta2O5 in Al-Ta2O5-SiO2-Si capacitors by a low-frequency
|
Hwu, J.-G.; Lin, S.-T. |
| 國立交通大學 |
2017-04-21T06:49:20Z |
Electrical Characteristic and Power Consumption Fluctuations of Trapezoidal Bulk FinFET Devices and Circuits Induced by Random Line Edge Roughness
|
Chen, Chieh-Yang; Huang, Wen-Tsung; Li, Yiming |
| 國立虎尾科技大學 |
2006 |
Electrical characteristic enhancement of metal-oxide-semiconductor devices by incorporating WON buffer layer at HfTaSiON/Si interface
|
Cheng, Chin-Lung;Chang-Liao, Kuei-Shu;Chang, Hsin-Chun;Wang, Tien-Ko |
| 國立交通大學 |
2015-07-21T11:20:49Z |
Electrical characteristic fluctuation of 16-nm-gate high-kappa/metal gate bulk FinFET devices in the presence of random interface traps
|
Hsu, Sheng-Chia; Li, Yiming |
| 國立交通大學 |
2019-04-03T06:44:24Z |
Electrical characteristic fluctuation of 16-nm-gate trapezoidal bulk FinFET devices with fixed top-fin width induced by random discrete dopants
|
Huang, Wen-Tsung; Li, Yiming |
| 國立交通大學 |
2017-04-21T06:49:39Z |
Electrical characteristic fluctuations in sub-45nm CMOS devices
|
Yang, Fu-Liang; Hwang, Jiunn-Ren; Li, Yiming |
| 國立交通大學 |
2019-05-02T00:25:47Z |
Electrical Characteristic of AlGaN/GaN High-Electron-Mobility Transistors With Recess Gate Structure
|
Shrestha, Niraj Man; Li, Yiming; Suemitsu, Tetsuya; Samukawa, Seiji |
| 國立交通大學 |
2017-04-21T06:48:35Z |
Electrical Characteristic of InGaAs Multiple-Gate MOSFET Devices
|
Huang, Cheng-Hao; Li, Yiming |
| 臺大學術典藏 |
2018-09-10T08:36:17Z |
Electrical characteristics analysis at "oxide flat-band voltage" for Al-SiO 2-Si capacitor
|
Lu, H.-W.;Chen, T.-Y.;Hwu, J.-G.; Lu, H.-W.; Chen, T.-Y.; Hwu, J.-G.; JENN-GWO HWU |
| 國立成功大學 |
2012-10 |
Electrical characteristics analysis of various cancer cells using a microfluidic device based on single-cell impedance measurement
|
Hong, Jhih-Lin; Lan, Kung-Chieh; Jang, Ling-Sheng |
