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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2014-12-08T15:45:55Z Electrical characteristics of polyoxide prepared by N-2 preannealing Chang, KM; Lee, TC; Wang, JY
國立中山大學 2006 Electrical characteristics of postmetallization-annealed MOCVD-TiO2 films on ammonium sulfide-treated GaAs Ming-Kwei Lee; Chih-Feng Yen; Jung-Jie Huang; Shi-Hao Lin
國立中山大學 2007 Electrical Characteristics of Strontium Titanate Films Prepared by Liquid Phase Deposition Ming-Kwei Lee; Hung-Chang Lee; Zhen-Hui Lee
國立交通大學 2014-12-08T15:04:37Z ELECTRICAL CHARACTERISTICS OF TEXTURED POLYSILICON OXIDE PREPARED BY A LOW-TEMPERATURE WAFER LOADING AND N-2 PREANNEALING PROCESS WU, SL; LIN, TY; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:12:55Z Electrical characteristics of the HfAlON gate dielectric with interfacial UV-ozone oxide Chen, Yung-Yu; Fu, Wen-Yu; Yeh, Ching-Fa
國立交通大學 2014-12-08T15:43:27Z Electrical characteristics of thin cerium oxide film on silicon substrate by reactive DC sputtering Pan, TM; Chien, CH; Lei, TF; Chao, TS; Huang, TY
國立交通大學 2014-12-08T15:36:22Z Electrical characteristics of thin HfO(2) gate dielectrics prepared using different pre-deposition surface treatments Chen, CW; Chien, CH; Perng, TH; Yang, MJ; Liang, JS; Lehnen, P; Tsui, BY; Chang, CY
國立交通大學 2019-04-02T06:00:17Z Electrical characteristics of thin HfO2 gate dielectrics prepared using different pre-deposition surface treatments Chen, CW; Chien, CH; Perng, TH; Yang, MJ; Liang, JS; Lehnen, P; Tsui, BY; Chang, CY
國立交通大學 2014-12-08T15:03:33Z ELECTRICAL CHARACTERISTICS OF THIN-FILM TRANSISTORS WITH DOUBLE-ACTIVE-LAYER STRUCTURE TSAI, MJ; WANG, PW; SU, HP; CHENG, HC
國立臺灣大學 2004 Electrical characteristics of ultra-thin gate oxides (<3 nm) prepared by direct current superimposed with alternating-current anodization Chen, Zhi-Hao; Huang, Szu-Wei; Hwu, Jenn-Gwo

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