臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
國立交通大學	2014-12-08T15:11:02Z	Electrical characterization of organic light-emitting diodes using dipotassium phthalate as n-type dopant	Ho, Meng-Huan; Hsieh, Ming-Ta; Chen, Teng-Ming; Chen, Jenn-Fang; Hwang, Shiao-Wen; Chen, Chin H.
國立臺灣科技大學	2019	Electrical characterization of RF reactive sputtered p-Mg-InxGa1-xN/n-Si Hetero-Junction Diodes without using Buffer Layer	Tuan, Tuan T.T.A.;Kuo, D.-H.;Cao, P.T.;Nguyen, V.S.;Pham, Q.-P.;Nghi, V.K.;Tran, N.P.L.
國立成功大學	2011-04	Electrical characterization of single cell in microfluidic device	Jao, Jen-Yu; Liu, Chia-Feng; Chen, Ming-Kun; Chuang, Ya-Chun; Jang, Ling-Sheng
國立暨南國際大學	2011	Electrical characterization of single cells using polysilicon wire ion sensor in an isolation window	許博硯; Hsu, PY
國立暨南國際大學	2011	Electrical characterization of single cells using polysilicon wire ion sensor in an isolation window	林錦正; Lin, JJ
國立暨南國際大學	2011	Electrical characterization of single cells using polysilicon wire ion sensor in an isolation window	Wang, CC; Wang, CC
國立暨南國際大學	2011	Electrical characterization of single cells using polysilicon wire ion sensor in an isolation window	吳幼麟; Wu, YL
國立成功大學	2023-05	Electrical characterization of sol-gel La2Ti2O7 films for resistive random access memory applications	Li;Ming-Jen;Hsu;Tsung-Hsien;Huang;Cheng-Liang
國立臺灣大學	1990	Electrical Characterization of the Insulating Property of Ta205 in Al-Ta205-Si02-Si Capacitors by a Low-Frequency C/V Technique	胡振國; Lin, S. T.; Hwu, Jenn-Gwo; Lin, S. T.
臺大學術典藏	2020-01-06T03:11:12Z	Electrical Characterization of the Insulating Property of Ta2o5 in Al-Ta2o5-Sio2-Si Capacitors by a Low-Frequency C/V Technique	Hwu, Jg; Lin, St; SHIANG-TAI LIN

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